{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,7,6]],"date-time":"2024-07-06T00:02:47Z","timestamp":1720224167261},"reference-count":11,"publisher":"Elsevier BV","issue":"10","license":[{"start":{"date-parts":[[2003,10,1]],"date-time":"2003-10-01T00:00:00Z","timestamp":1064966400000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"},{"start":{"date-parts":[[2003,10,1]],"date-time":"2003-10-01T00:00:00Z","timestamp":1064966400000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/legal\/tdmrep-license"},{"start":{"date-parts":[[2003,10,1]],"date-time":"2003-10-01T00:00:00Z","timestamp":1064966400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-017"},{"start":{"date-parts":[[2003,10,1]],"date-time":"2003-10-01T00:00:00Z","timestamp":1064966400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"},{"start":{"date-parts":[[2003,10,1]],"date-time":"2003-10-01T00:00:00Z","timestamp":1064966400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-012"},{"start":{"date-parts":[[2003,10,1]],"date-time":"2003-10-01T00:00:00Z","timestamp":1064966400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2003,10,1]],"date-time":"2003-10-01T00:00:00Z","timestamp":1064966400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-004"}],"content-domain":{"domain":["elsevier.com","sciencedirect.com"],"crossmark-restriction":true},"short-container-title":["Microelectronics Journal"],"published-print":{"date-parts":[[2003,10]]},"DOI":"10.1016\/s0026-2692(03)00161-7","type":"journal-article","created":{"date-parts":[[2003,8,1]],"date-time":"2003-08-01T01:57:13Z","timestamp":1059703033000},"page":"945-953","update-policy":"http:\/\/dx.doi.org\/10.1016\/elsevier_cm_policy","source":"Crossref","is-referenced-by-count":0,"title":["A-to-D converters static error detection from dynamic parameter measurement"],"prefix":"10.1016","volume":"34","author":[{"given":"F.","family":"Aza\u0131\u0308s","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Bernard","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Y.","family":"Bertrand","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Comte","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Renovell","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"78","reference":[{"issue":"6","key":"10.1016\/S0026-2692(03)00161-7_BIB1","doi-asserted-by":"crossref","first-page":"820","DOI":"10.1109\/JSSC.1984.1052232","article-title":"Full-speed testing of A\/D converters","volume":"19","author":"Doernberg","year":"1984","journal-title":"IEEE Journal of Solid State Circuits"},{"key":"10.1016\/S0026-2692(03)00161-7_BIB2","article-title":"DSP-based testing of analog and mixed-signal circuits","author":"Mahoney","year":"1987","journal-title":"IEEE Computer Society Press"},{"key":"10.1016\/S0026-2692(03)00161-7_BIB3","series-title":"Proceedings of the International Test Conference","author":"Kuyel","year":"1999"},{"key":"10.1016\/S0026-2692(03)00161-7_BIB4","doi-asserted-by":"crossref","first-page":"525","DOI":"10.1109\/19.9805","article-title":"Measuring harmonic distortion and noise floor of an A\/D converter using spectral averaging","volume":"37","author":"Yenq","year":"1988","journal-title":"IEEE Transactions on Instrumentation and Measurement"},{"key":"10.1016\/S0026-2692(03)00161-7_BIB5","series-title":"Proceedings of the Design of Circuits and Integrated Systems Conference","author":"Mendon\u00e7a","year":"2000"},{"key":"10.1016\/S0026-2692(03)00161-7_BIB6","unstructured":"A.J.E.M. Janssen, Fourier analysis and synthesis for a mildly non-linear quantizer, Philips: Net. Lab. Report UR 801\/99, 1999."},{"key":"10.1016\/S0026-2692(03)00161-7_BIB7","series-title":"Proceedings of the International Workshop on ADC Modelling and Testing","author":"Attivissimo","year":"2002"},{"key":"10.1016\/S0026-2692(03)00161-7_BIB8","first-page":"45","article-title":"Approach for the nonlinearity test of ADCs\/DACs and its application for BIST","author":"Xu","year":"1999","journal-title":"IEEE European Test Workshop"},{"issue":"2","key":"10.1016\/S0026-2692(03)00161-7_BIB9","doi-asserted-by":"crossref","first-page":"65","DOI":"10.1016\/S0263-2241(99)00045-7","article-title":"Model for the spectral effect of ADC nonlinearity","volume":"28","author":"Bellan","year":"2000","journal-title":"Measurement"},{"key":"10.1016\/S0026-2692(03)00161-7_BIB10","series-title":"Proceedings of the International Workshop on ADC Modelling and Testing","author":"Aripaia","year":"1999"},{"key":"10.1016\/S0026-2692(03)00161-7_BIB11","series-title":"Proceedings of the IEEE Latin American Test Workshop","author":"Aza\u0131\u0308s","year":"2002"}],"container-title":["Microelectronics Journal"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0026269203001617?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0026269203001617?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2024,7,5]],"date-time":"2024-07-05T08:01:26Z","timestamp":1720166486000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/S0026269203001617"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2003,10]]},"references-count":11,"journal-issue":{"issue":"10","published-print":{"date-parts":[[2003,10]]}},"alternative-id":["S0026269203001617"],"URL":"https:\/\/doi.org\/10.1016\/s0026-2692(03)00161-7","relation":{},"ISSN":["1879-2391"],"issn-type":[{"value":"1879-2391","type":"print"}],"subject":[],"published":{"date-parts":[[2003,10]]},"assertion":[{"value":"Elsevier","name":"publisher","label":"This article is maintained by"},{"value":"A-to-D converters static error detection from dynamic parameter measurement","name":"articletitle","label":"Article Title"},{"value":"Microelectronics Journal","name":"journaltitle","label":"Journal Title"},{"value":"https:\/\/doi.org\/10.1016\/S0026-2692(03)00161-7","name":"articlelink","label":"CrossRef DOI link to publisher maintained version"},{"value":"converted-article","name":"content_type","label":"Content Type"},{"value":"Copyright \u00a9 2003 Elsevier Science Ltd. All rights are reserved, including those for text and data mining, AI training, and similar technologies.","name":"copyright","label":"Copyright"}]}}