{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,4,6]],"date-time":"2022-04-06T01:22:46Z","timestamp":1649208166108},"reference-count":4,"publisher":"Elsevier BV","issue":"1","license":[{"start":{"date-parts":[[2002,1,1]],"date-time":"2002-01-01T00:00:00Z","timestamp":1009843200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Microelectronics Reliability"],"published-print":{"date-parts":[[2002,1]]},"DOI":"10.1016\/s0026-2714(01)00127-5","type":"journal-article","created":{"date-parts":[[2002,10,14]],"date-time":"2002-10-14T22:58:33Z","timestamp":1034636313000},"page":"149-152","source":"Crossref","is-referenced-by-count":1,"title":["Precise spice macromodel applied to high-voltage power MOSFET"],"prefix":"10.1016","volume":"42","author":[{"given":"F.S","family":"Lomeli","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A","family":"Cerdeira","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"78","reference":[{"key":"10.1016\/S0026-2714(01)00127-5_BIB1","unstructured":"Kielkowsky RM. spice practical device modeling. New York: McGraw Hill; 1995 [Chapter 6]"},{"key":"10.1016\/S0026-2714(01)00127-5_BIB2","unstructured":"Model developed by Analogy, Inc. is available in www.onsemi.com"},{"key":"10.1016\/S0026-2714(01)00127-5_BIB3","doi-asserted-by":"crossref","unstructured":"Baliga BJ. Power semiconductor devices. PWS Publishing Company; 1996","DOI":"10.1109\/16.536818"},{"key":"10.1016\/S0026-2714(01)00127-5_BIB4","unstructured":"Lomel\u00ed FS. El transistor MOS de potencia: caracter\u00edsticas, modelo y simulaci\u00f3n. MS Degree Thesis, CINVESTAV, M\u00e9xico, 1999"}],"container-title":["Microelectronics Reliability"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0026271401001275?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0026271401001275?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2020,1,8]],"date-time":"2020-01-08T01:53:54Z","timestamp":1578448434000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/S0026271401001275"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2002,1]]},"references-count":4,"journal-issue":{"issue":"1","published-print":{"date-parts":[[2002,1]]}},"alternative-id":["S0026271401001275"],"URL":"https:\/\/doi.org\/10.1016\/s0026-2714(01)00127-5","relation":{},"ISSN":["0026-2714"],"issn-type":[{"value":"0026-2714","type":"print"}],"subject":[],"published":{"date-parts":[[2002,1]]}}}