{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,5,17]],"date-time":"2024-05-17T05:48:31Z","timestamp":1715924911588},"reference-count":0,"publisher":"Elsevier BV","issue":"9-10","license":[{"start":{"date-parts":[[2001,9,1]],"date-time":"2001-09-01T00:00:00Z","timestamp":999302400000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Microelectronics Reliability"],"published-print":{"date-parts":[[2001,9]]},"DOI":"10.1016\/s0026-2714(01)00206-2","type":"journal-article","created":{"date-parts":[[2002,7,25]],"date-time":"2002-07-25T10:16:36Z","timestamp":1027592196000},"page":"1313-1318","source":"Crossref","is-referenced-by-count":11,"title":["Injection Mechanisms and Lifetime Prediction with the Substrate Voltage in 0.15\u03bcm Channel-Length N-MOSFETs"],"prefix":"10.1016","volume":"41","author":[{"given":"A.","family":"Bravaix","sequence":"first","affiliation":[]},{"given":"D.","family":"Goguenheim","sequence":"additional","affiliation":[]},{"given":"N.","family":"Revil","sequence":"additional","affiliation":[]},{"given":"E.","family":"Vincent","sequence":"additional","affiliation":[]}],"member":"78","container-title":["Microelectronics Reliability"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0026271401002062?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0026271401002062?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2019,5,3]],"date-time":"2019-05-03T04:28:14Z","timestamp":1556857694000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/S0026271401002062"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2001,9]]},"references-count":0,"journal-issue":{"issue":"9-10","published-print":{"date-parts":[[2001,9]]}},"alternative-id":["S0026271401002062"],"URL":"https:\/\/doi.org\/10.1016\/s0026-2714(01)00206-2","relation":{},"ISSN":["0026-2714"],"issn-type":[{"value":"0026-2714","type":"print"}],"subject":[],"published":{"date-parts":[[2001,9]]}}}