{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,3,31]],"date-time":"2022-03-31T14:35:32Z","timestamp":1648737332387},"reference-count":0,"publisher":"Elsevier BV","issue":"9-11","license":[{"start":{"date-parts":[[2002,9,1]],"date-time":"2002-09-01T00:00:00Z","timestamp":1030838400000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Microelectronics Reliability"],"published-print":{"date-parts":[[2002,9]]},"DOI":"10.1016\/s0026-2714(02)00227-5","type":"journal-article","created":{"date-parts":[[2003,5,12]],"date-time":"2003-05-12T21:38:09Z","timestamp":1052775489000},"page":"1763-1766","source":"Crossref","is-referenced-by-count":0,"title":["Magnetic field measurements for Non Destructive Failure Analysis"],"prefix":"10.1016","volume":"42","author":[{"given":"O.","family":"Cr\u00e9pel","sequence":"first","affiliation":[]},{"given":"C.","family":"Goupil","sequence":"additional","affiliation":[]},{"given":"B.","family":"Domeng\u00e8s","sequence":"additional","affiliation":[]},{"given":"P.","family":"Descamps","sequence":"additional","affiliation":[]},{"given":"P.","family":"Perdu","sequence":"additional","affiliation":[]},{"given":"A.","family":"Doukkali","sequence":"additional","affiliation":[]}],"member":"78","container-title":["Microelectronics Reliability"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0026271402002275?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0026271402002275?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2019,4,2]],"date-time":"2019-04-02T08:50:09Z","timestamp":1554195009000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/S0026271402002275"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2002,9]]},"references-count":0,"journal-issue":{"issue":"9-11","published-print":{"date-parts":[[2002,9]]}},"alternative-id":["S0026271402002275"],"URL":"https:\/\/doi.org\/10.1016\/s0026-2714(02)00227-5","relation":{},"ISSN":["0026-2714"],"issn-type":[{"value":"0026-2714","type":"print"}],"subject":[],"published":{"date-parts":[[2002,9]]}}}