{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,16]],"date-time":"2025-10-16T19:56:39Z","timestamp":1760644599158},"reference-count":0,"publisher":"Elsevier BV","issue":"9-11","license":[{"start":{"date-parts":[[2002,9,1]],"date-time":"2002-09-01T00:00:00Z","timestamp":1030838400000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Microelectronics Reliability"],"published-print":{"date-parts":[[2002,9]]},"DOI":"10.1016\/s0026-2714(02)00234-2","type":"journal-article","created":{"date-parts":[[2003,5,13]],"date-time":"2003-05-13T01:38:09Z","timestamp":1052789889000},"page":"1801-1806","source":"Crossref","is-referenced-by-count":12,"title":["Yield Evaluation of Gold Sensor Electrodes Used for Fully Electronic DNA Detection Arrays on CMOS"],"prefix":"10.1016","volume":"42","author":[{"given":"A.","family":"Frey","sequence":"first","affiliation":[]},{"given":"F.","family":"Hofmann","sequence":"additional","affiliation":[]},{"given":"R.","family":"Peters","sequence":"additional","affiliation":[]},{"given":"B.","family":"Holzapfl","sequence":"additional","affiliation":[]},{"given":"M.","family":"Schienle","sequence":"additional","affiliation":[]},{"given":"C.","family":"Paulus","sequence":"additional","affiliation":[]},{"given":"P.","family":"Schindler-Bauer","sequence":"additional","affiliation":[]},{"given":"D.","family":"Kuhlmeier","sequence":"additional","affiliation":[]},{"given":"J.","family":"Krause","sequence":"additional","affiliation":[]},{"given":"G.","family":"Eckstein","sequence":"additional","affiliation":[]},{"given":"R.","family":"Thewes","sequence":"additional","affiliation":[]}],"member":"78","container-title":["Microelectronics Reliability"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0026271402002342?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0026271402002342?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2019,4,2]],"date-time":"2019-04-02T12:50:05Z","timestamp":1554209405000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/S0026271402002342"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2002,9]]},"references-count":0,"journal-issue":{"issue":"9-11","published-print":{"date-parts":[[2002,9]]}},"alternative-id":["S0026271402002342"],"URL":"https:\/\/doi.org\/10.1016\/s0026-2714(02)00234-2","relation":{},"ISSN":["0026-2714"],"issn-type":[{"value":"0026-2714","type":"print"}],"subject":[],"published":{"date-parts":[[2002,9]]}}}