{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,25]],"date-time":"2026-01-25T15:21:42Z","timestamp":1769354502382,"version":"3.49.0"},"reference-count":6,"publisher":"Elsevier BV","issue":"6","license":[{"start":{"date-parts":[[2003,6,1]],"date-time":"2003-06-01T00:00:00Z","timestamp":1054425600000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Microelectronics Reliability"],"published-print":{"date-parts":[[2003,6]]},"DOI":"10.1016\/s0026-2714(03)00071-4","type":"journal-article","created":{"date-parts":[[2003,4,23]],"date-time":"2003-04-23T22:32:29Z","timestamp":1051137149000},"page":"859-864","source":"Crossref","is-referenced-by-count":11,"title":["Accelerated life test calculations using the method of maximum likelihood: an improvement over least squares"],"prefix":"10.1016","volume":"43","author":[{"given":"Charles S.","family":"Whitman","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"78","reference":[{"key":"10.1016\/S0026-2714(03)00071-4_BIB1","unstructured":"Guidelines for GaAs MMIC and FET Life Testing. JEDEC Publication JEP118, 1993, Available from: www.jedec.org"},{"key":"10.1016\/S0026-2714(03)00071-4_BIB2","unstructured":"Scarpulla J, Eng D, Leung D. A better way to predict reliability from lifetest data using a regression technique. Proc GaAs MANTECH Conference, 2000. p. 125\u20138"},{"key":"10.1016\/S0026-2714(03)00071-4_BIB3","series-title":"Statistical methods","author":"Snedecor","year":"1989"},{"key":"10.1016\/S0026-2714(03)00071-4_BIB4","series-title":"Statistical inference","author":"Casella","year":"1990"},{"key":"10.1016\/S0026-2714(03)00071-4_BIB5","series-title":"Applied reliability","author":"Tobias","year":"1990"},{"key":"10.1016\/S0026-2714(03)00071-4_BIB6","series-title":"Applied life data analysis","author":"Nelson","year":"1982"}],"container-title":["Microelectronics Reliability"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0026271403000714?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0026271403000714?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2019,3,22]],"date-time":"2019-03-22T02:26:37Z","timestamp":1553221597000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/S0026271403000714"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2003,6]]},"references-count":6,"journal-issue":{"issue":"6","published-print":{"date-parts":[[2003,6]]}},"alternative-id":["S0026271403000714"],"URL":"https:\/\/doi.org\/10.1016\/s0026-2714(03)00071-4","relation":{},"ISSN":["0026-2714"],"issn-type":[{"value":"0026-2714","type":"print"}],"subject":[],"published":{"date-parts":[[2003,6]]}}}