{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,31]],"date-time":"2025-12-31T20:19:01Z","timestamp":1767212341522},"reference-count":14,"publisher":"Elsevier BV","issue":"8","license":[{"start":{"date-parts":[[2003,8,1]],"date-time":"2003-08-01T00:00:00Z","timestamp":1059696000000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Microelectronics Reliability"],"published-print":{"date-parts":[[2003,8]]},"DOI":"10.1016\/s0026-2714(03)00174-4","type":"journal-article","created":{"date-parts":[[2003,7,22]],"date-time":"2003-07-22T22:21:43Z","timestamp":1058912503000},"page":"1211-1214","source":"Crossref","is-referenced-by-count":9,"title":["New insights into the change of voltage acceleration and temperature activation of oxide breakdown"],"prefix":"10.1016","volume":"43","author":[{"given":"G.","family":"Ribes","sequence":"first","affiliation":[]},{"given":"S.","family":"Bruy\u00e8re","sequence":"additional","affiliation":[]},{"given":"F.","family":"Monsieur","sequence":"additional","affiliation":[]},{"given":"D.","family":"Roy","sequence":"additional","affiliation":[]},{"given":"V.","family":"Huard","sequence":"additional","affiliation":[]}],"member":"78","reference":[{"key":"10.1016\/S0026-2714(03)00174-4_BIB1","first-page":"171","author":"McPherson","year":"1998","journal-title":"IEEE\/IEDM"},{"key":"10.1016\/S0026-2714(03)00174-4_BIB2","first-page":"190","author":"Kimura","year":"1997","journal-title":"IEEE\/IRPS"},{"key":"10.1016\/S0026-2714(03)00174-4_BIB3","first-page":"54","author":"Wu","year":"2000","journal-title":"IEEE\/IEDM"},{"key":"10.1016\/S0026-2714(03)00174-4_BIB4","doi-asserted-by":"crossref","first-page":"1752","DOI":"10.1063\/1.123677","volume":"74","author":"Dimaria","year":"1999","journal-title":"Appl. Phys. Lett."},{"key":"10.1016\/S0026-2714(03)00174-4_BIB5","doi-asserted-by":"crossref","first-page":"1514","DOI":"10.1109\/16.848301","volume":"47","author":"Kaczer","year":"2000","journal-title":"Trans. Electron Dev."},{"key":"10.1016\/S0026-2714(03)00174-4_BIB6","unstructured":"Degraeve R et al. In: VLSI Symp, 1999. p. 59\u201360"},{"key":"10.1016\/S0026-2714(03)00174-4_BIB7","doi-asserted-by":"crossref","first-page":"1295","DOI":"10.1016\/S0026-2714(01)00183-4","volume":"41","author":"Monsieur","year":"2001","journal-title":"Microelectron. Reliab."},{"key":"10.1016\/S0026-2714(03)00174-4_BIB8","first-page":"47","author":"McPherson","year":"1998","journal-title":"IEEE\/IRPS"},{"key":"10.1016\/S0026-2714(03)00174-4_BIB9","first-page":"33","author":"Suehle","year":"2000","journal-title":"IEEE\/IRPS"},{"key":"10.1016\/S0026-2714(03)00174-4_BIB10","doi-asserted-by":"crossref","first-page":"1903","DOI":"10.1149\/1.2114251","volume":"132","author":"McPherson","year":"1985","journal-title":"J. Electrochem. Soc."},{"key":"10.1016\/S0026-2714(03)00174-4_BIB11","first-page":"12","volume":"22","author":"Wu","year":"2001","journal-title":"IEEE\/Electron. Dev. Lett."},{"key":"10.1016\/S0026-2714(03)00174-4_BIB12","first-page":"21","author":"Alam","year":"2000","journal-title":"IEEE\/IRPS"},{"key":"10.1016\/S0026-2714(03)00174-4_BIB13","first-page":"47","author":"Hu","year":"1999","journal-title":"IEEE\/IRPS"},{"key":"10.1016\/S0026-2714(03)00174-4_BIB14","doi-asserted-by":"crossref","first-page":"3444","DOI":"10.1103\/PhysRevB.42.3444","volume":"42","author":"Brower","year":"1990","journal-title":"Phys. Rev. B"}],"container-title":["Microelectronics Reliability"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0026271403001744?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0026271403001744?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2019,3,17]],"date-time":"2019-03-17T09:27:45Z","timestamp":1552814865000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/S0026271403001744"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2003,8]]},"references-count":14,"journal-issue":{"issue":"8","published-print":{"date-parts":[[2003,8]]}},"alternative-id":["S0026271403001744"],"URL":"https:\/\/doi.org\/10.1016\/s0026-2714(03)00174-4","relation":{},"ISSN":["0026-2714"],"issn-type":[{"value":"0026-2714","type":"print"}],"subject":[],"published":{"date-parts":[[2003,8]]}}}