{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,3,30]],"date-time":"2022-03-30T23:32:30Z","timestamp":1648683150153},"reference-count":0,"publisher":"Elsevier BV","issue":"9-11","license":[{"start":{"date-parts":[[2003,9,1]],"date-time":"2003-09-01T00:00:00Z","timestamp":1062374400000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Microelectronics Reliability"],"published-print":{"date-parts":[[2003,9]]},"DOI":"10.1016\/s0026-2714(03)00281-6","type":"journal-article","created":{"date-parts":[[2003,9,12]],"date-time":"2003-09-12T16:10:05Z","timestamp":1063383005000},"page":"1603-1608","source":"Crossref","is-referenced-by-count":2,"title":["Latchup Analysis Using Emission Microscopy"],"prefix":"10.1016","volume":"43","author":[{"given":"Franco","family":"Stellari","sequence":"first","affiliation":[]},{"given":"Peilin","family":"Song","sequence":"additional","affiliation":[]},{"given":"Moyra K.","family":"McManus","sequence":"additional","affiliation":[]},{"given":"Alan J.","family":"Weger","sequence":"additional","affiliation":[]},{"given":"Robert","family":"Gauthier","sequence":"additional","affiliation":[]},{"given":"Kiran V.","family":"Chatty","sequence":"additional","affiliation":[]},{"given":"Mujahid","family":"Muhammad","sequence":"additional","affiliation":[]},{"given":"Pia","family":"Sanda","sequence":"additional","affiliation":[]},{"given":"Philip","family":"Wu","sequence":"additional","affiliation":[]},{"given":"Steve","family":"Wilson","sequence":"additional","affiliation":[]}],"member":"78","container-title":["Microelectronics Reliability"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0026271403002816?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0026271403002816?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2019,2,24]],"date-time":"2019-02-24T11:54:55Z","timestamp":1551009295000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/S0026271403002816"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2003,9]]},"references-count":0,"journal-issue":{"issue":"9-11","published-print":{"date-parts":[[2003,9]]}},"alternative-id":["S0026271403002816"],"URL":"https:\/\/doi.org\/10.1016\/s0026-2714(03)00281-6","relation":{},"ISSN":["0026-2714"],"issn-type":[{"value":"0026-2714","type":"print"}],"subject":[],"published":{"date-parts":[[2003,9]]}}}