{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,11]],"date-time":"2024-08-11T21:06:00Z","timestamp":1723410360271},"reference-count":0,"publisher":"Elsevier BV","issue":"9-11","license":[{"start":{"date-parts":[[2003,9,1]],"date-time":"2003-09-01T00:00:00Z","timestamp":1062374400000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Microelectronics Reliability"],"published-print":{"date-parts":[[2003,9]]},"DOI":"10.1016\/s0026-2714(03)00319-6","type":"journal-article","created":{"date-parts":[[2003,9,12]],"date-time":"2003-09-12T16:10:05Z","timestamp":1063383005000},"page":"1877-1882","source":"Crossref","is-referenced-by-count":22,"title":["Hot-Spot Meaurements and Analysis of Electro-Thermal Effects in Low-Voltage Power-MOSFET\u2019s"],"prefix":"10.1016","volume":"43","author":[{"given":"A.","family":"Castellazzi","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"V.","family":"Kartal","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"R.","family":"Kraus","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"N.","family":"Seliger","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Honsberg-Riedl","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"D.","family":"Schmitt-Landsiedel","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"78","container-title":["Microelectronics Reliability"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0026271403003196?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0026271403003196?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2019,2,24]],"date-time":"2019-02-24T11:54:15Z","timestamp":1551009255000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/S0026271403003196"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2003,9]]},"references-count":0,"journal-issue":{"issue":"9-11","published-print":{"date-parts":[[2003,9]]}},"alternative-id":["S0026271403003196"],"URL":"https:\/\/doi.org\/10.1016\/s0026-2714(03)00319-6","relation":{},"ISSN":["0026-2714"],"issn-type":[{"value":"0026-2714","type":"print"}],"subject":[],"published":{"date-parts":[[2003,9]]}}}