{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,17]],"date-time":"2025-10-17T13:20:29Z","timestamp":1760707229575,"version":"3.30.2"},"reference-count":28,"publisher":"Elsevier BV","issue":"1","license":[{"start":{"date-parts":[[2003,1,1]],"date-time":"2003-01-01T00:00:00Z","timestamp":1041379200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Computers &amp; Electrical Engineering"],"published-print":{"date-parts":[[2003,1]]},"DOI":"10.1016\/s0045-7906(01)00020-9","type":"journal-article","created":{"date-parts":[[2004,3,18]],"date-time":"2004-03-18T13:14:53Z","timestamp":1079615693000},"page":"213-229","source":"Crossref","is-referenced-by-count":21,"title":["Fault isolation in analog circuits using a fuzzy inference system"],"prefix":"10.1016","volume":"29","author":[{"given":"M.A.","family":"El-Gamal","sequence":"first","affiliation":[]},{"given":"M.","family":"Abdulghafour","sequence":"additional","affiliation":[]}],"member":"78","reference":[{"key":"10.1016\/S0045-7906(01)00020-9_BIB1","doi-asserted-by":"crossref","unstructured":"Abdulghafour M, Fellah A, Abidi MA. Fuzzy logic-based data integration: theory and applications. Proceedings of IEEE International Conference on Multisensor Fusion and Integration for Intelligent Systems, Las Vegas, NV, 1994. p. 151\u201360","DOI":"10.1109\/MFI.1994.398463"},{"key":"10.1016\/S0045-7906(01)00020-9_BIB2","doi-asserted-by":"crossref","unstructured":"Abdulghafour M, El-Gamal MA. A fuzzy logic system for analog fault diagnosis. Proceedings of IEEE International Symposium on Circuits and Systems, Atlanta, GA, 1996. p. 97\u2013100","DOI":"10.1109\/ISCAS.1996.539817"},{"key":"10.1016\/S0045-7906(01)00020-9_BIB3","doi-asserted-by":"crossref","first-page":"833","DOI":"10.1016\/0967-0661(94)90348-4","article-title":"Fusion of visual and range features using fuzzy logic","volume":"2","author":"Abidi","year":"1994","journal-title":"J Cont Engng Pract"},{"key":"10.1016\/S0045-7906(01)00020-9_BIB4","doi-asserted-by":"crossref","unstructured":"Ahmed S, Cheung P. Analog fault diagnosis \u2013 a practical approach. IEEE International Symposium on Circuits and Systems 1994;6:134\u201339","DOI":"10.1109\/ISCAS.1994.408869"},{"key":"10.1016\/S0045-7906(01)00020-9_BIB5","doi-asserted-by":"crossref","unstructured":"Bandler JW, Salama AE. Fault diagnosis of analog circuits. Proc IEEE 1985;73:1270\u2013325","DOI":"10.1109\/PROC.1985.13281"},{"key":"10.1016\/S0045-7906(01)00020-9_BIB6","doi-asserted-by":"crossref","first-page":"849","DOI":"10.1002\/(SICI)1098-111X(199711\/12)12:11\/12<849::AID-INT4>3.0.CO;2-X","article-title":"A probabilistic ATMS contribution to diagnose analog electronic circuits","volume":"12","author":"Bos-Plachez","year":"1997","journal-title":"Int J Intell Syst"},{"key":"10.1016\/S0045-7906(01)00020-9_BIB7","first-page":"70","article-title":"A qualitative physics based on confluences","volume":"24","author":"Dekieer","year":"1992","journal-title":"Artif Intell"},{"key":"10.1016\/S0045-7906(01)00020-9_BIB8","unstructured":"El-Gamal MA. Fault location and parameter identification in analog circuits. PhD Dissertation, Ohio University, Athens, OH, 1990"},{"key":"10.1016\/S0045-7906(01)00020-9_BIB9","doi-asserted-by":"crossref","unstructured":"El-Gamal MA, Hassan AS, Abdel-Malek HL. A new approach for the selection of test points for fault diagnosis. Proceedings of IEEE International Symposium on Circuits and Systems, Seattle, WA, 1995. p. 2019\u201322","DOI":"10.1109\/ISCAS.1995.523819"},{"key":"10.1016\/S0045-7906(01)00020-9_BIB10","doi-asserted-by":"crossref","unstructured":"El-Gamal MA, A knowledge based approach for fault detection and isolation in analog circuits, Proceedings of IEEE International Conference on Neural Networks, Houston, TX, 1997. p. 1580\u20134","DOI":"10.1109\/ICNN.1997.614129"},{"key":"10.1016\/S0045-7906(01)00020-9_BIB11","doi-asserted-by":"crossref","first-page":"207","DOI":"10.1023\/A:1008353901973","article-title":"A combined clustering and neural network approach for analog multiple hard fault classification","volume":"14","author":"El-Gamal","year":"1999","journal-title":"J Electron Testing: Theory Appl"},{"key":"10.1016\/S0045-7906(01)00020-9_BIB12","doi-asserted-by":"crossref","first-page":"102","DOI":"10.1109\/43.184847","article-title":"Fault detection and classification in linear integrated circuits: an application of discrimination analysis and hypothesis testing","volume":"12","author":"Epstein","year":"1993","journal-title":"IEEE Trans Comput Aid Des"},{"key":"10.1016\/S0045-7906(01)00020-9_BIB13","doi-asserted-by":"crossref","first-page":"53","DOI":"10.1017\/S0890060400000068","article-title":"Qualitative dynamic diagnosis of circuits","volume":"7","author":"Fanni","year":"1993","journal-title":"Artif Intell Engng Des, Anal Manufact"},{"key":"10.1016\/S0045-7906(01)00020-9_BIB14","doi-asserted-by":"crossref","first-page":"35","DOI":"10.1016\/0169-023X(91)90032-S","article-title":"Knowledge base refinement by backpropagation","volume":"7","author":"Fu","year":"1992","journal-title":"Data Knowledge Eng"},{"key":"10.1016\/S0045-7906(01)00020-9_BIB15","unstructured":"Jain LC, Martin NM, editors. Fusion of neural networks, fuzzy sets, and genetic algorithms. Florida: CRC Press; 1999"},{"key":"10.1016\/S0045-7906(01)00020-9_BIB16","unstructured":"Kosko B. Neural networks and fuzzy systems. Englewood Cliffs, NJ: Prentice-Hall; 1992"},{"key":"10.1016\/S0045-7906(01)00020-9_BIB17","doi-asserted-by":"crossref","first-page":"289","DOI":"10.1016\/0004-3702(86)90073-1","article-title":"Qualitative simulation","volume":"29","author":"Kuipers","year":"1986","journal-title":"Artif Intell"},{"key":"10.1016\/S0045-7906(01)00020-9_BIB18","doi-asserted-by":"crossref","first-page":"518","DOI":"10.1109\/TCS.1979.1084669","article-title":"Fault isolation algorithm for analog electronic systems using the fuzzy concept","volume":"26","author":"Lee","year":"1979","journal-title":"IEEE Trans Circ Syst"},{"key":"10.1016\/S0045-7906(01)00020-9_BIB19","doi-asserted-by":"crossref","unstructured":"Mohamed F, Marzouki M. Test and diagnosis of analog circuits: when fuzziness can lead to accuracy. J Electron Testing: Theory Appl 1996;9:203\u201316","DOI":"10.1007\/BF00137575"},{"key":"10.1016\/S0045-7906(01)00020-9_BIB20","doi-asserted-by":"crossref","first-page":"81","DOI":"10.1109\/TCS.1982.1085114","article-title":"Efficient approximations to fault bands for the simulation before test fault diagnosis of analog circuits","volume":"29","author":"Pahwa","year":"1982","journal-title":"IEEE Trans Circ Syst"},{"key":"10.1016\/S0045-7906(01)00020-9_BIB21","doi-asserted-by":"crossref","unstructured":"Parten C, Saeks R, Pap R. Fault diagnosis and neural networks. Proceedings of IEEE International Conference on Systems, 1996. p. 1517\u201321","DOI":"10.1109\/ICSMC.1991.169903"},{"key":"10.1016\/S0045-7906(01)00020-9_BIB22","doi-asserted-by":"crossref","unstructured":"Rutkowski G. A neural network approach to fault location in nonlinear DC circuits. Proceedings of the International Conference on Artificial Neural Networks, 1992. p. 1123\u20136","DOI":"10.1016\/B978-0-444-89488-5.50062-2"},{"key":"10.1016\/S0045-7906(01)00020-9_BIB23","doi-asserted-by":"crossref","unstructured":"Slamani M, Kaminska B. Fault observability analysis of analog circuits in frequency domain. IEEE Trans Circ Systems \u2013 II: Analog and Digital Signal Process 1996;43:134\u20139","DOI":"10.1109\/82.486460"},{"key":"10.1016\/S0045-7906(01)00020-9_BIB24","doi-asserted-by":"crossref","unstructured":"Starzyk JA, El-Gamal MA. Artificial neural network for testing analog circuits. Proceedings of IEEE International Symposium on Circuits and Systems, New Orleans, LA, 1990. p. 1851\u20134","DOI":"10.1109\/ISCAS.1990.112022"},{"key":"10.1016\/S0045-7906(01)00020-9_BIB25","doi-asserted-by":"crossref","unstructured":"Torralba A, Chavez J, Franquelo LG. Fault detection and classification of analog circuits by means of fuzzy logic-based techniques. Proceedings of IEEE International Symposium on Circuits and Systems, 1990. p. 1828\u201331","DOI":"10.1109\/ISCAS.1995.523770"},{"key":"10.1016\/S0045-7906(01)00020-9_BIB26","doi-asserted-by":"crossref","first-page":"695","DOI":"10.1049\/el:19940472","article-title":"Neural network approach to fault diagnosis in CMOS OPamps with gate oxide short faults","volume":"30","author":"Tu","year":"1994","journal-title":"Electron Lett"},{"year":"1992","series-title":"Spice: a guide to circuit simulation and analysis using PSpice","author":"Tuinega","key":"10.1016\/S0045-7906(01)00020-9_BIB27"},{"key":"10.1016\/S0045-7906(01)00020-9_BIB28","unstructured":"Zadeh LA. Fuzzy sets and applications: Selected Papers by L.A. Zadeh. New York: Wiley; 1987"}],"container-title":["Computers &amp; Electrical Engineering"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0045790601000209?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0045790601000209?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2024,12,15]],"date-time":"2024-12-15T16:11:29Z","timestamp":1734279089000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/S0045790601000209"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2003,1]]},"references-count":28,"journal-issue":{"issue":"1","published-print":{"date-parts":[[2003,1]]}},"alternative-id":["S0045790601000209"],"URL":"https:\/\/doi.org\/10.1016\/s0045-7906(01)00020-9","relation":{},"ISSN":["0045-7906"],"issn-type":[{"type":"print","value":"0045-7906"}],"subject":[],"published":{"date-parts":[[2003,1]]}}}