{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,10,7]],"date-time":"2023-10-07T03:13:12Z","timestamp":1696648392301},"reference-count":12,"publisher":"Elsevier BV","issue":"2-3","license":[{"start":{"date-parts":[[1998,3,1]],"date-time":"1998-03-01T00:00:00Z","timestamp":888710400000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Computers &amp; Graphics"],"published-print":{"date-parts":[[1998,3]]},"DOI":"10.1016\/s0097-8493(98)00008-9","type":"journal-article","created":{"date-parts":[[2002,7,25]],"date-time":"2002-07-25T15:05:05Z","timestamp":1027609505000},"page":"203-208","source":"Crossref","is-referenced-by-count":8,"title":["Computer-aided chromatic interferometry"],"prefix":"10.1016","volume":"22","author":[{"given":"Martin","family":"Hartl","sequence":"first","affiliation":[]},{"given":"Ivan","family":"K\u0159upka","sequence":"additional","affiliation":[]},{"given":"Radek","family":"Poli\u0161\u010duk","sequence":"additional","affiliation":[]},{"given":"Miroslav","family":"Li\u0161ka","sequence":"additional","affiliation":[]}],"member":"78","reference":[{"key":"10.1016\/S0097-8493(98)00008-9_BIB1","doi-asserted-by":"crossref","first-page":"37","DOI":"10.1016\/0143-8166(86)90034-5","article-title":"Automatic fringe pattern analysis: a review","volume":"7","author":"Reid","year":"1986","journal-title":"Opt. and Laser in Engng."},{"key":"10.1016\/S0097-8493(98)00008-9_BIB2","doi-asserted-by":"crossref","unstructured":"Schwinder, J., Advanced evaluation techniques in interferometry. In Progress in Optics, Vol. XXVIII, ed. E. Wolf. North-Holland Elsevier Science Publishers, Amsterdam, 1990, pp. 271\u2013359","DOI":"10.1016\/S0079-6638(08)70291-9"},{"key":"10.1016\/S0097-8493(98)00008-9_BIB3","unstructured":"Malacara D. and DeVore, S. L., Interferogram evaluation and wavefront fitting. In Optical Shop Testing, ed. D. Malacara. John Wiley & Sons, New York, 1992, pp. 455\u2013499"},{"key":"10.1016\/S0097-8493(98)00008-9_BIB4","doi-asserted-by":"crossref","first-page":"4481","DOI":"10.1364\/AO.21.004481","article-title":"Computer-aided surface reconstruction of interference contours","volume":"21","author":"Cline","year":"1982","journal-title":"Applied Optics"},{"key":"10.1016\/S0097-8493(98)00008-9_BIB5","doi-asserted-by":"crossref","first-page":"1656","DOI":"10.1109\/TMAG.1983.1062741","article-title":"Measurement of surface topography of magnetic recording materials through computer analyzed microscopic interferometry","volume":"5","author":"Perry","year":"1983","journal-title":"IEEE Trans. on Magnetics MAG-19"},{"key":"10.1016\/S0097-8493(98)00008-9_BIB6","doi-asserted-by":"crossref","first-page":"2384","DOI":"10.1117\/1.601415","article-title":"Differential colorimetry\u2014tool for evaluation of chromatic interference pattern","volume":"36","author":"Hartl","year":"1997","journal-title":"Optical Engineering"},{"key":"10.1016\/S0097-8493(98)00008-9_BIB7","unstructured":"Hartl, M., K\u0159upka, I., Poli\u0161\u010duk, R. and Li\u0161ka, M. Computer-aided evaluation of chromatic interferograms. In Proceeding of the Fifth International Conference in Central Europe on Computer Graphics and Visualization. Plze\u0148, 1997, pp. 45\u201354"},{"key":"10.1016\/S0097-8493(98)00008-9_BIB8","doi-asserted-by":"crossref","first-page":"215","DOI":"10.1080\/05698196708972181","article-title":"The mapping of elastohydrodynamic contacts","volume":"10","author":"Gohar","year":"1967","journal-title":"ASLE Trans."},{"key":"10.1016\/S0097-8493(98)00008-9_BIB9","doi-asserted-by":"crossref","unstructured":"Mantravadi, M. V. Newton, Fizeau, and Haidinger interferometers. In Optical ShopTesting, ed. D. Malacara. John Wiley & Sons, New York, 1992, pp. 1\u201349","DOI":"10.1002\/9780470135976.ch1"},{"key":"10.1016\/S0097-8493(98)00008-9_BIB10","unstructured":"Fully Utilizing Photo CD Images, Article No. 4, Photo YCC Color Encoding and Compression Schemes, Photo CD Information Bulletin PCD 045, Marketing Technical Support Eastman Kodak Company, Rochester, 1994"},{"key":"10.1016\/S0097-8493(98)00008-9_BIB11","doi-asserted-by":"crossref","first-page":"123","DOI":"10.1145\/31336.31338","article-title":"An experimental comparison of RGB, YIQ, LAB, HSV, and opponent color models","volume":"6","author":"Schwarz","year":"1987","journal-title":"ACM Trans. on Graph."},{"key":"10.1016\/S0097-8493(98)00008-9_BIB12","unstructured":"Billmeyer, F. W. Jr and Saltzman, M. Principles of color technology. John Wiley & Sons, New York, 1981"}],"container-title":["Computers &amp; Graphics"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0097849398000089?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0097849398000089?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2020,1,14]],"date-time":"2020-01-14T20:05:35Z","timestamp":1579032335000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/S0097849398000089"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1998,3]]},"references-count":12,"journal-issue":{"issue":"2-3","published-print":{"date-parts":[[1998,3]]}},"alternative-id":["S0097849398000089"],"URL":"https:\/\/doi.org\/10.1016\/s0097-8493(98)00008-9","relation":{},"ISSN":["0097-8493"],"issn-type":[{"value":"0097-8493","type":"print"}],"subject":[],"published":{"date-parts":[[1998,3]]}}}