{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,2]],"date-time":"2025-11-02T16:08:58Z","timestamp":1762099738852},"reference-count":9,"publisher":"Elsevier BV","issue":"3-4","license":[{"start":{"date-parts":[[1999,2,1]],"date-time":"1999-02-01T00:00:00Z","timestamp":917827200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Applied Surface Science"],"published-print":{"date-parts":[[1999,2]]},"DOI":"10.1016\/s0169-4332(98)00542-x","type":"journal-article","created":{"date-parts":[[2002,7,26]],"date-time":"2002-07-26T04:35:25Z","timestamp":1027658125000},"page":"287-292","source":"Crossref","is-referenced-by-count":51,"title":["Phase variation experiments in non-contact dynamic force microscopy using phase locked loop techniques"],"prefix":"10.1016","volume":"140","author":[{"given":"Ch.","family":"Loppacher","sequence":"first","affiliation":[]},{"given":"M.","family":"Bammerlin","sequence":"additional","affiliation":[]},{"given":"M.","family":"Guggisberg","sequence":"additional","affiliation":[]},{"given":"F.","family":"Battiston","sequence":"additional","affiliation":[]},{"given":"R.","family":"Bennewitz","sequence":"additional","affiliation":[]},{"given":"S.","family":"Rast","sequence":"additional","affiliation":[]},{"given":"A.","family":"Baratoff","sequence":"additional","affiliation":[]},{"given":"E.","family":"Meyer","sequence":"additional","affiliation":[]},{"given":"H.-J.","family":"G\u00fcntherodt","sequence":"additional","affiliation":[]}],"member":"78","reference":[{"key":"10.1016\/S0169-4332(98)00542-X_BIB1","doi-asserted-by":"crossref","first-page":"117","DOI":"10.1063\/1.109732","volume":"63","author":"Howald","year":"1993","journal-title":"Appl. Phys. Lett."},{"key":"10.1016\/S0169-4332(98)00542-X_BIB2","doi-asserted-by":"crossref","unstructured":"H.-J. G\u00fcntherodt, D. Anselmetti, E. Meyer (Eds.), Forces in Scanning Probe Methods, NATO ASI Series E: Applied Sciences Vol. 286, Kluwer Academic, 1995.","DOI":"10.1007\/978-94-011-0049-6"},{"key":"10.1016\/S0169-4332(98)00542-X_BIB3","doi-asserted-by":"crossref","first-page":"668","DOI":"10.1063\/1.347347","volume":"69","author":"Albrecht","year":"1991","journal-title":"J. Appl. Phys."},{"key":"10.1016\/S0169-4332(98)00542-X_BIB4","doi-asserted-by":"crossref","first-page":"3641","DOI":"10.1063\/1.365726","volume":"82","author":"D\u00fcrig","year":"1997","journal-title":"J. Appl. Phys."},{"key":"10.1016\/S0169-4332(98)00542-X_BIB5","doi-asserted-by":"crossref","first-page":"215","DOI":"10.1007\/s003390051132","volume":"66","author":"Loppacher","year":"1998","journal-title":"Appl. Phys. A"},{"key":"10.1016\/S0169-4332(98)00542-X_BIB6","doi-asserted-by":"crossref","first-page":"68","DOI":"10.1126\/science.267.5194.68","volume":"267","author":"Giessibl","year":"1995","journal-title":"Science"},{"key":"10.1016\/S0169-4332(98)00542-X_BIB7","doi-asserted-by":"crossref","first-page":"1646","DOI":"10.1126\/science.270.5242.1646","volume":"270","author":"Sugawara","year":"1995","journal-title":"Science"},{"key":"10.1016\/S0169-4332(98)00542-X_BIB8","first-page":"3","volume":"1","author":"Bammerlin","year":"1997","journal-title":"Probe Microscopy"},{"key":"10.1016\/S0169-4332(98)00542-X_BIB9","doi-asserted-by":"crossref","first-page":"879","DOI":"10.1007\/s003390051260","volume":"66","author":"Erlandsson","year":"1998","journal-title":"Appl. Phys. A"}],"container-title":["Applied Surface Science"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S016943329800542X?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S016943329800542X?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2019,4,12]],"date-time":"2019-04-12T05:28:11Z","timestamp":1555046891000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/S016943329800542X"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1999,2]]},"references-count":9,"journal-issue":{"issue":"3-4","published-print":{"date-parts":[[1999,2]]}},"alternative-id":["S016943329800542X"],"URL":"https:\/\/doi.org\/10.1016\/s0169-4332(98)00542-x","relation":{},"ISSN":["0169-4332"],"issn-type":[{"value":"0169-4332","type":"print"}],"subject":[],"published":{"date-parts":[[1999,2]]}}}