{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,3]],"date-time":"2025-12-03T17:25:14Z","timestamp":1764782714941},"reference-count":25,"publisher":"Elsevier BV","issue":"3","license":[{"start":{"date-parts":[[2001,8,1]],"date-time":"2001-08-01T00:00:00Z","timestamp":996624000000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Ultramicroscopy"],"published-print":{"date-parts":[[2001,8]]},"DOI":"10.1016\/s0304-3991(01)00077-8","type":"journal-article","created":{"date-parts":[[2002,7,25]],"date-time":"2002-07-25T18:23:14Z","timestamp":1027621394000},"page":"179-186","source":"Crossref","is-referenced-by-count":55,"title":["Image-spectroscopy \u2013 I. The advantages of increased spectral information for compositional EFTEM analysis"],"prefix":"10.1016","volume":"88","author":[{"given":"P.J","family":"Thomas","sequence":"first","affiliation":[]},{"given":"P.A","family":"Midgley","sequence":"additional","affiliation":[]}],"member":"78","reference":[{"key":"10.1016\/S0304-3991(01)00077-8_BIB1","doi-asserted-by":"crossref","first-page":"42","DOI":"10.1046\/j.1365-2818.1999.00469.x","volume":"194","author":"Freitag","year":"1998","journal-title":"J. Microsc."},{"key":"10.1016\/S0304-3991(01)00077-8_BIB2","doi-asserted-by":"crossref","first-page":"257","DOI":"10.1051\/mmm:0199100202-3025700","volume":"2","author":"Krivanek","year":"1991","journal-title":"Microsc. Microanal. Microstruct."},{"key":"10.1016\/S0304-3991(01)00077-8_BIB3","series-title":"51st Ann. Proc. Electron. Microsc. Soc. Am","first-page":"586","author":"Krivanek","year":"1993"},{"key":"10.1016\/S0304-3991(01)00077-8_BIB4","doi-asserted-by":"crossref","first-page":"237","DOI":"10.1016\/S0304-3991(78)80030-8","volume":"3","author":"Jeanguillaume","year":"1978","journal-title":"Ultramicroscopy"},{"key":"10.1016\/S0304-3991(01)00077-8_BIB5","doi-asserted-by":"crossref","first-page":"517","DOI":"10.1051\/mmm:0199200306051700","volume":"3","author":"Lavergne","year":"1992","journal-title":"Microsc. Microanal. Microstruct."},{"key":"10.1016\/S0304-3991(01)00077-8_BIB6","doi-asserted-by":"crossref","first-page":"361","DOI":"10.1016\/S0968-4328(97)00037-1","volume":"28","author":"Mayer","year":"1997","journal-title":"Micron"},{"key":"10.1016\/S0304-3991(01)00077-8_BIB7","doi-asserted-by":"crossref","first-page":"149","DOI":"10.1111\/j.1365-2818.1994.tb03463.x","volume":"174","author":"K\u00f6rtje","year":"1994","journal-title":"J. Microsc."},{"key":"10.1016\/S0304-3991(01)00077-8_BIB8","doi-asserted-by":"crossref","first-page":"171","DOI":"10.1111\/j.1365-2818.1994.tb03465.x","volume":"174","author":"Beckers","year":"1994","journal-title":"J. Microsc."},{"key":"10.1016\/S0304-3991(01)00077-8_BIB9","doi-asserted-by":"crossref","first-page":"252","DOI":"10.1016\/0304-3991(89)90304-5","volume":"28","author":"Jeanguillaume","year":"1989","journal-title":"Ultramicroscopy"},{"key":"10.1016\/S0304-3991(01)00077-8_BIB10","doi-asserted-by":"crossref","first-page":"361","DOI":"10.1016\/S0968-4328(97)00037-1","volume":"28","author":"Mayer","year":"1997","journal-title":"Micron"},{"key":"10.1016\/S0304-3991(01)00077-8_BIB11","first-page":"245","volume":"145","author":"Unser","year":"1986","journal-title":"J. Microsc."},{"key":"10.1016\/S0304-3991(01)00077-8_BIB12","unstructured":"P.J. Thomas, P.A. Midgley, Inst. Phys. Conf. Ser. 161 (EMAG) (1999) 179."},{"key":"10.1016\/S0304-3991(01)00077-8_BIB13","first-page":"93","volume":"3","author":"Leapman","year":"1995","journal-title":"J. Microsc. Soc. Am."},{"key":"10.1016\/S0304-3991(01)00077-8_BIB14","unstructured":"G. Deshais, Stress corrosion cracking in Al based alloys, Ph.D. Thesis, University of Cambridge, 1999."},{"key":"10.1016\/S0304-3991(01)00077-8_BIB15","doi-asserted-by":"crossref","first-page":"313","DOI":"10.1111\/j.1365-2818.1995.tb03691.x","volume":"180","author":"Yuan","year":"1995","journal-title":"J. Microsc."},{"key":"10.1016\/S0304-3991(01)00077-8_BIB16","doi-asserted-by":"crossref","first-page":"277","DOI":"10.1111\/j.1365-2818.1995.tb03686.x","volume":"180","author":"Krivanek","year":"1995","journal-title":"J. Microsc."},{"key":"10.1016\/S0304-3991(01)00077-8_BIB17","doi-asserted-by":"crossref","first-page":"269","DOI":"10.1002\/(SICI)1097-0029(20000501)49:3<269::AID-JEMT5>3.0.CO;2-B","volume":"49","author":"Meyer","year":"2000","journal-title":"Microsc. Res. Tech."},{"key":"10.1016\/S0304-3991(01)00077-8_BIB18","doi-asserted-by":"crossref","first-page":"387","DOI":"10.1016\/0304-3991(82)90101-2","volume":"9","author":"Egerton","year":"1982","journal-title":"Ultramicroscopy"},{"key":"10.1016\/S0304-3991(01)00077-8_BIB19","doi-asserted-by":"crossref","first-page":"349","DOI":"10.1016\/S0968-4328(98)00014-6","volume":"29","author":"Kothleitner","year":"1998","journal-title":"Micron"},{"key":"10.1016\/S0304-3991(01)00077-8_BIB20","unstructured":"EL\/P software v 2.1, \u00a9 Gatan Inc. 6678 Owens Drive, Pleasanton, CA 94588-3334 USA, 1993."},{"key":"10.1016\/S0304-3991(01)00077-8_BIB21","first-page":"177","volume":"78","author":"Chapman","year":"1985","journal-title":"Inst. Phys. Conf. Ser."},{"key":"10.1016\/S0304-3991(01)00077-8_BIB22","doi-asserted-by":"crossref","first-page":"1019","DOI":"10.1080\/01418638508241891","volume":"52","author":"Chan","year":"1985","journal-title":"Philos. Mag. B"},{"key":"10.1016\/S0304-3991(01)00077-8_BIB23","unstructured":"P.J. Thomas, P.A. Midgley, Ultramicroscopy, next paper in this issue, 88 (2001) 187."},{"key":"10.1016\/S0304-3991(01)00077-8_BIB24","first-page":"1315","volume":"12","author":"Rose","year":"1970","journal-title":"Image Technol."},{"key":"10.1016\/S0304-3991(01)00077-8_BIB25","first-page":"175","volume":"92","author":"Berger","year":"1993","journal-title":"Optik"}],"container-title":["Ultramicroscopy"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0304399101000778?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0304399101000778?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2019,4,23]],"date-time":"2019-04-23T22:20:48Z","timestamp":1556058048000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/S0304399101000778"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2001,8]]},"references-count":25,"journal-issue":{"issue":"3","published-print":{"date-parts":[[2001,8]]}},"alternative-id":["S0304399101000778"],"URL":"https:\/\/doi.org\/10.1016\/s0304-3991(01)00077-8","relation":{},"ISSN":["0304-3991"],"issn-type":[{"value":"0304-3991","type":"print"}],"subject":[],"published":{"date-parts":[[2001,8]]}}}