{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,3,30]],"date-time":"2022-03-30T14:57:27Z","timestamp":1648652247119},"reference-count":15,"publisher":"Elsevier BV","issue":"3-6","license":[{"start":{"date-parts":[[2003,3,1]],"date-time":"2003-03-01T00:00:00Z","timestamp":1046476800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Mathematics and Computers in Simulation"],"published-print":{"date-parts":[[2003,3]]},"DOI":"10.1016\/s0378-4754(02)00242-2","type":"journal-article","created":{"date-parts":[[2003,3,4]],"date-time":"2003-03-04T16:29:22Z","timestamp":1046795362000},"page":"471-478","source":"Crossref","is-referenced-by-count":5,"title":["Monte Carlo simulation of the transient response of single photon absorption in X-ray pixel detectors"],"prefix":"10.1016","volume":"62","author":[{"given":"Hans-Erik","family":"Nilsson","sequence":"first","affiliation":[]},{"given":"Ervin","family":"Dubaric","sequence":"additional","affiliation":[]},{"given":"Mats","family":"Hjelm","sequence":"additional","affiliation":[]},{"given":"Urban","family":"Englund","sequence":"additional","affiliation":[]}],"member":"78","reference":[{"key":"10.1016\/S0378-4754(02)00242-2_BIB1","doi-asserted-by":"crossref","first-page":"209","DOI":"10.1016\/S0168-9002(01)00847-6","article-title":"Calculation of the modulation transfer function for the X-ray imaging detector DIXI using Monte Carlo simulation data","volume":"466","author":"del Risco Norrlid","year":"2001","journal-title":"Nucl. Instrum. Methods A"},{"key":"10.1016\/S0378-4754(02)00242-2_BIB2","doi-asserted-by":"crossref","first-page":"178","DOI":"10.1016\/S0168-9002(01)00842-7","article-title":"Resolution and noise properties of scintillator coated X-ray detectors","volume":"466","author":"Dubaric","year":"2001","journal-title":"Nucl. Instrum. Methods A"},{"key":"10.1016\/S0378-4754(02)00242-2_BIB3","doi-asserted-by":"crossref","first-page":"81","DOI":"10.1016\/S0168-9002(00)01100-1","article-title":"Performance limits of a single photon counting pixel system","volume":"460","author":"Chmeissani","year":"2000","journal-title":"Nucl. Instrum. Methods A"},{"key":"10.1016\/S0378-4754(02)00242-2_BIB4","unstructured":"Los Alamos Monte Carlo Group, MCNP-4B General Monte Carlo N-particle Transport Code, Los Alamos National Laboratories Report LA-12625-M, 1997."},{"key":"10.1016\/S0378-4754(02)00242-2_BIB5","doi-asserted-by":"crossref","first-page":"1283","DOI":"10.1016\/S0925-9635(00)00382-4","article-title":"Monte Carlo simulation of vertical MESFETs in 2H, 4H and 6H-SiC","volume":"10","author":"Bertilsson","year":"2001","journal-title":"Diamond Relat. Mater."},{"key":"10.1016\/S0378-4754(02)00242-2_BIB6","unstructured":"M. Hjelm, H.-E. Nilsson, E. Dubaric, P. Kackell, C.S. Petersson, Full band Monte Carlo simulation of a 100 nm 4H-SiC high frequency MOSFET, in: Proceedings of the 25th International Symposium on Compound Semiconductors, San Francisco, 1999, pp. 273\u2013278."},{"key":"10.1016\/S0378-4754(02)00242-2_BIB7","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1016\/S0169-4332(01)00502-5","article-title":"Full band Monte Carlo study of bulk and surface transport properties in 4H and 6H-SiC","volume":"184","author":"Hjelm","year":"2001","journal-title":"Appl. Surf. Sci."},{"key":"10.1016\/S0378-4754(02)00242-2_BIB8","doi-asserted-by":"crossref","first-page":"1589","DOI":"10.1088\/0022-3719\/10\/10\/003","article-title":"Reconciliation of the Conwell\u2013Weisskopf and Brooks\u2013Herring formulae for charged-impurity scattering in semiconductors: third-body interference","volume":"10","author":"Ridley","year":"1977","journal-title":"J. Phys. C: Solid State Phys."},{"key":"10.1016\/S0378-4754(02)00242-2_BIB9","doi-asserted-by":"crossref","first-page":"813","DOI":"10.1063\/1.336603","article-title":"Ionized impurity scattering in Monte Carlo calculations","volume":"82","author":"van der Roer","year":"1986","journal-title":"J. Appl. Phys."},{"key":"10.1016\/S0378-4754(02)00242-2_BIB10","unstructured":"S.M. Sze, Physics of Semiconductor Devices, Wiley, Chichester, UK, 1981."},{"key":"10.1016\/S0378-4754(02)00242-2_BIB11","doi-asserted-by":"crossref","first-page":"122","DOI":"10.1063\/1.1735385","article-title":"Impurity effects upon mobility in silicon","volume":"31","author":"Logan","year":"1960","journal-title":"J. Appl. Phys."},{"key":"10.1016\/S0378-4754(02)00242-2_BIB12","doi-asserted-by":"crossref","first-page":"28","DOI":"10.1103\/PhysRev.96.28","article-title":"Electrical properties of silicon containing arsenic and boron","volume":"96","author":"Morin","year":"1954","journal-title":"Phys. Rev."},{"key":"10.1016\/S0378-4754(02)00242-2_BIB13","doi-asserted-by":"crossref","first-page":"297","DOI":"10.1063\/1.355849","article-title":"A Monte Carlo simulation of anisotropic electron transport in silicon including full band structure and anisotropic impact-ionization model","volume":"75","author":"Kunikiyo","year":"1994","journal-title":"J. Appl. Phys."},{"key":"10.1016\/S0378-4754(02)00242-2_BIB14","doi-asserted-by":"crossref","first-page":"139","DOI":"10.1038\/sj.dmfr.4600241","article-title":"Physical performance of radiographic imaging systems","volume":"26","author":"Workman","year":"1997","journal-title":"Dentomaxillofacial Radiol."},{"key":"10.1016\/S0378-4754(02)00242-2_BIB15","doi-asserted-by":"crossref","first-page":"202","DOI":"10.1016\/S0168-9002(01)00846-4","article-title":"Characterisation of a single photon counting pixel detector","volume":"466","author":"Passmore","year":"2001","journal-title":"Nucl. Instrum. Methods A"}],"container-title":["Mathematics and Computers in Simulation"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0378475402002422?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0378475402002422?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2019,3,30]],"date-time":"2019-03-30T10:56:03Z","timestamp":1553943363000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/S0378475402002422"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2003,3]]},"references-count":15,"journal-issue":{"issue":"3-6","published-print":{"date-parts":[[2003,3]]}},"alternative-id":["S0378475402002422"],"URL":"https:\/\/doi.org\/10.1016\/s0378-4754(02)00242-2","relation":{},"ISSN":["0378-4754"],"issn-type":[{"value":"0378-4754","type":"print"}],"subject":[],"published":{"date-parts":[[2003,3]]}}}