{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,2]],"date-time":"2025-10-02T06:10:48Z","timestamp":1759385448583},"reference-count":2,"publisher":"Elsevier BV","issue":"1","license":[{"start":{"date-parts":[[2001,3,1]],"date-time":"2001-03-01T00:00:00Z","timestamp":983404800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Computer Standards & Interfaces"],"published-print":{"date-parts":[[2001,3]]},"DOI":"10.1016\/s0920-5489(00)00067-2","type":"journal-article","created":{"date-parts":[[2002,7,25]],"date-time":"2002-07-25T19:50:50Z","timestamp":1027626650000},"page":"57-64","source":"Crossref","is-referenced-by-count":3,"title":["ADC standard and testing in Japanese industry"],"prefix":"10.1016","volume":"23","author":[{"given":"Haruo","family":"Kobayashi","sequence":"first","affiliation":[]},{"given":"Kensuke","family":"Kobayashi","sequence":"additional","affiliation":[]},{"given":"Hiroshi","family":"Sakayori","sequence":"additional","affiliation":[]},{"given":"Yasuyuki","family":"Kimura","sequence":"additional","affiliation":[]}],"member":"78","reference":[{"key":"10.1016\/S0920-5489(00)00067-2_BIB1","unstructured":"IEEE Standard for Digitizing Waveform Recorders, IEEE Std 1057 (1994)."},{"key":"10.1016\/S0920-5489(00)00067-2_BIB2","unstructured":"IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters, IEEE Std 1241 (1998)."}],"container-title":["Computer Standards & Interfaces"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0920548900000672?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0920548900000672?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2019,4,22]],"date-time":"2019-04-22T05:28:06Z","timestamp":1555910886000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/S0920548900000672"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2001,3]]},"references-count":2,"journal-issue":{"issue":"1","published-print":{"date-parts":[[2001,3]]}},"alternative-id":["S0920548900000672"],"URL":"https:\/\/doi.org\/10.1016\/s0920-5489(00)00067-2","relation":{},"ISSN":["0920-5489"],"issn-type":[{"value":"0920-5489","type":"print"}],"subject":[],"published":{"date-parts":[[2001,3]]}}}