{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,20]],"date-time":"2025-10-20T10:01:35Z","timestamp":1760954495631},"reference-count":96,"publisher":"Elsevier BV","issue":"1","license":[{"start":{"date-parts":[[2004,1,1]],"date-time":"2004-01-01T00:00:00Z","timestamp":1072915200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Computer Standards & Interfaces"],"published-print":{"date-parts":[[2004,1]]},"DOI":"10.1016\/s0920-5489(03)00060-6","type":"journal-article","created":{"date-parts":[[2003,5,19]],"date-time":"2003-05-19T16:52:26Z","timestamp":1053363146000},"page":"31-42","source":"Crossref","is-referenced-by-count":30,"title":["A state of the art on ADC modelling"],"prefix":"10.1016","volume":"26","author":[{"given":"P.","family":"Arpaia","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"P.","family":"Daponte","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Rapuano","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"78","reference":[{"issue":"4","key":"10.1016\/S0920-5489(03)00060-6_BIB1","doi-asserted-by":"crossref","first-page":"682","DOI":"10.1109\/19.85334","article-title":"Almost uniformity of quantization errors","volume":"40","author":"Kushner","year":"1991","journal-title":"IEEE Trans. Instrum. Meas."},{"issue":"5","key":"10.1016\/S0920-5489(03)00060-6_BIB2","doi-asserted-by":"crossref","first-page":"733","DOI":"10.1109\/19.328894","article-title":"Bias of mean value and mean square value measurements based on quantized data","volume":"43","author":"Kollar","year":"1994","journal-title":"IEEE Trans. Instrum. Meas."},{"issue":"2","key":"10.1016\/S0920-5489(03)00060-6_BIB3","doi-asserted-by":"crossref","first-page":"353","DOI":"10.1109\/19.492748","article-title":"Statistical theory of quantization","volume":"45","author":"Widrow","year":"1996","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"10.1016\/S0920-5489(03)00060-6_BIB4","first-page":"1243","article-title":"A noise model for quantized data","volume":"2","author":"Bertocco","year":"1998","journal-title":"Proc. IEEE IMTC\/98"},{"issue":"5","key":"10.1016\/S0920-5489(03)00060-6_BIB5","doi-asserted-by":"crossref","first-page":"1042","DOI":"10.1109\/19.746553","article-title":"Code probability distributions of A\/D converters with random input noise","volume":"47","author":"Souders","year":"1998","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"10.1016\/S0920-5489(03)00060-6_BIB6","first-page":"1190","article-title":"Analog-to-digital converters: towards a generalization of Widrow's theorem","volume":"2","author":"Pacut","year":"1998","journal-title":"Proc. IEEE IMTC\/98"},{"issue":"3\u20134","key":"10.1016\/S0920-5489(03)00060-6_BIB7","doi-asserted-by":"crossref","first-page":"205","DOI":"10.1016\/S0920-5489(98)00017-8","article-title":"Equivalence of Widrow's and Gray's approaches to uniform quantizers","volume":"19","author":"Pacut","year":"1998","journal-title":"Comput. Stand. Interfaces"},{"issue":"3","key":"10.1016\/S0920-5489(03)00060-6_BIB8","doi-asserted-by":"crossref","first-page":"718","DOI":"10.1109\/19.32180","article-title":"Validity of uniform quantization error model for sinusoidal signals without and with dither","volume":"38","author":"Wagdy","year":"1989","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"10.1016\/S0920-5489(03)00060-6_BIB9","article-title":"ADC uncertainties and sinewave amplitude measurement","author":"Bellan","year":"1998"},{"key":"10.1016\/S0920-5489(03)00060-6_BIB10","unstructured":"D. Bellan, A. Brandolini, A. Gandelli, Quantization error for a sine wave: a comprehensive approach, Proc. of IMEKO TC-4 3rd Int. Workshop on ADC Modeling and Testing, pp. 128, vol. 1, pp. 399\u2013404, 1998 Sept."},{"key":"10.1016\/S0920-5489(03)00060-6_BIB11","series-title":"Proc. of IMEKO TC-4 Int. Workshop on ADC Modelling, Smolenice Castle, Slovak Republic","first-page":"106","article-title":"Dithered quantizing systems","author":"Petri","year":"1996"},{"issue":"4","key":"10.1016\/S0920-5489(03)00060-6_BIB12","doi-asserted-by":"crossref","first-page":"271","DOI":"10.1016\/S0263-2241(98)00037-2","article-title":"Dithering design for measurement of slowly varying signals","volume":"23","author":"Aumala","year":"1998","journal-title":"Measurement"},{"issue":"1","key":"10.1016\/S0920-5489(03)00060-6_BIB13","doi-asserted-by":"crossref","first-page":"41","DOI":"10.1016\/S0263-2241(96)00062-0","article-title":"Turning interference and noise into improved resolution","volume":"19","author":"Aumala","year":"1996","journal-title":"Measurement"},{"key":"10.1016\/S0920-5489(03)00060-6_BIB14","first-page":"195","article-title":"Dithering design of data acquisition of noise or interference corrupted measurement signals","volume":"vol. 4A","author":"Aumala","year":"1997"},{"issue":"2","key":"10.1016\/S0920-5489(03)00060-6_BIB15","doi-asserted-by":"crossref","first-page":"139","DOI":"10.1109\/19.293410","article-title":"Dither signal effects on the resolution of nonlinear quantizers","volume":"43","author":"Carbone","year":"1994","journal-title":"IEEE Trans. Instrum. Meas."},{"issue":"2","key":"10.1016\/S0920-5489(03)00060-6_BIB16","doi-asserted-by":"crossref","first-page":"146","DOI":"10.1109\/19.293411","article-title":"Linearizing average transfer characteristics of ideal ADC's via analog and digital dither","volume":"43","author":"Wagdy","year":"1994","journal-title":"IEEE Trans. Instrum. Meas."},{"issue":"2","key":"10.1016\/S0920-5489(03)00060-6_BIB17","doi-asserted-by":"crossref","first-page":"610","DOI":"10.1109\/19.492797","article-title":"Effect of additive dither on the resolution of ADC's with single-bit or multibit errors","volume":"45","author":"Wagdy","year":"1996","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"10.1016\/S0920-5489(03)00060-6_BIB18","first-page":"78","article-title":"Simulation results on A\/D converter dithering","volume":"1","author":"Wagdy","year":"1998","journal-title":"Proc. IEEE IMTC\/98"},{"issue":"3","key":"10.1016\/S0920-5489(03)00060-6_BIB19","doi-asserted-by":"crossref","first-page":"656","DOI":"10.1109\/19.585423","article-title":"Quantitative criteria for the design of dither-based quantizing systems","volume":"46","author":"Carbone","year":"1997","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"10.1016\/S0920-5489(03)00060-6_BIB20","first-page":"1992","article-title":"ADC modeling and testing","volume":"3","author":"Chiorboli","year":"2001","journal-title":"Proc. IEEE IMTC 2001"},{"issue":"1","key":"10.1016\/S0920-5489(03)00060-6_BIB21","doi-asserted-by":"crossref","first-page":"41","DOI":"10.1109\/19.481309","article-title":"Generalized model of the quantization error\u2014a unified approach","volume":"45","author":"Hejn","year":"1996","journal-title":"IEEE Trans. Instrum. Meas."},{"issue":"1","key":"10.1016\/S0920-5489(03)00060-6_BIB22","doi-asserted-by":"crossref","first-page":"56","DOI":"10.1109\/19.552157","article-title":"Uncertainties in quantization noise estimates for analog-to-digital converters","volume":"46","author":"Chiorboli","year":"1997","journal-title":"IEEE Trans. Instrum. Meas."},{"issue":"3","key":"10.1016\/S0920-5489(03)00060-6_BIB23","doi-asserted-by":"crossref","first-page":"384","DOI":"10.1109\/19.293455","article-title":"An improved code density test for the dynamic characterization of flash A\/D converters","volume":"43","author":"Morandi","year":"1994","journal-title":"IEEE Trans. Instrum. Meas."},{"issue":"3\u20134","key":"10.1016\/S0920-5489(03)00060-6_BIB24","doi-asserted-by":"crossref","first-page":"139","DOI":"10.1016\/S0263-2241(97)00009-2","article-title":"ADC modeling techniques: a review","volume":"19","author":"Baccigalupi","year":"1996","journal-title":"Measurement"},{"issue":"2","key":"10.1016\/S0920-5489(03)00060-6_BIB25","doi-asserted-by":"crossref","first-page":"103","DOI":"10.1016\/0263-2241(96)00018-8","article-title":"A behavioural model for scan converter-based transient digitizers","volume":"17","author":"Arpaia","year":"1996","journal-title":"Measurement"},{"key":"10.1016\/S0920-5489(03)00060-6_BIB26","series-title":"Proc. of Southwest Symp. on Mixed-Signal Design 2001, Austin, Texas, USA","first-page":"147","article-title":"Behavioral model of pipeline ADC by using Simulink","author":"Bilhan","year":"2001"},{"issue":"3","key":"10.1016\/S0920-5489(03)00060-6_BIB27","doi-asserted-by":"crossref","first-page":"283","DOI":"10.1109\/4.75007","article-title":"A behavioral model of A\/D converters using a mixed mode simulator","volume":"26","author":"Ruan","year":"1991","journal-title":"IEEE J. Solid-State Circuits"},{"key":"10.1016\/S0920-5489(03)00060-6_BIB28","first-page":"229","article-title":"Behavioral modeling and simulation of data converters","volume":"10","author":"Maloberti","year":"2000","journal-title":"Proc. IMEKO 2000"},{"issue":"2","key":"10.1016\/S0920-5489(03)00060-6_BIB29","doi-asserted-by":"crossref","first-page":"220","DOI":"10.1109\/19.293424","article-title":"An improved error model of data acquisition systems","volume":"43","author":"Baccigalupi","year":"1994","journal-title":"IEEE Trans. Instrum. Meas."},{"issue":"2","key":"10.1016\/S0920-5489(03)00060-6_BIB30","doi-asserted-by":"crossref","first-page":"627","DOI":"10.1109\/19.492800","article-title":"ADC neural modeling","volume":"45","author":"Bernieri","year":"1996","journal-title":"IEEE Trans. Instrum. Meas."},{"issue":"6","key":"10.1016\/S0920-5489(03)00060-6_BIB31","doi-asserted-by":"crossref","first-page":"890","DOI":"10.1109\/19.65791","article-title":"A framework for design and testing of analog integrated circuits","volume":"39","author":"Soenen","year":"1990","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"10.1016\/S0920-5489(03)00060-6_BIB32","series-title":"Proc. of 2nd Int. IEEE Conf. on Advanced A\/D and D\/A Conversion Techniques and their Applications, Cambridge, UK","first-page":"110","article-title":"Precision behavioural modelling of circuit components for data converters","author":"Brigati","year":"1994"},{"issue":"2","key":"10.1016\/S0920-5489(03)00060-6_BIB33","doi-asserted-by":"crossref","first-page":"640","DOI":"10.1109\/19.492802","article-title":"Error compensation of A\/D converters using neural networks","volume":"45","author":"Baccigalupi","year":"1996","journal-title":"IEEE Trans. Instrum. Meas."},{"issue":"6","key":"10.1016\/S0920-5489(03)00060-6_BIB34","doi-asserted-by":"crossref","first-page":"867","DOI":"10.1109\/19.368083","article-title":"A neural network approach for identification and fault diagnosis on dynamic systems","volume":"43","author":"Bernieri","year":"1994","journal-title":"IEEE Trans. Instrum. Meas."},{"issue":"8","key":"10.1016\/S0920-5489(03)00060-6_BIB35","doi-asserted-by":"crossref","first-page":"775","DOI":"10.1109\/TCS.1986.1086004","article-title":"Dynamic testing and diagnostics of A\/D converters","volume":"CAS-33","author":"Van den Bossche","year":"1986","journal-title":"IEEE Trans. Circuits Syst."},{"key":"10.1016\/S0920-5489(03)00060-6_BIB36","series-title":"Modeling of Analog to Digital Converters, Kosice, Slovak Republic","first-page":"51","author":"Michaeli","year":"2001"},{"key":"10.1016\/S0920-5489(03)00060-6_BIB37","first-page":"1273","article-title":"Dynamic characterization and compensation of analog to digital converters","author":"Irons","year":"1986","journal-title":"IEEE Int. Symp. Circuits Syst."},{"issue":"2","key":"10.1016\/S0920-5489(03)00060-6_BIB38","doi-asserted-by":"crossref","first-page":"151","DOI":"10.1109\/19.293412","article-title":"Analog-to-digital conversion and harmonic noises due to the integral nonlinearity","volume":"43","author":"Kim","year":"1994","journal-title":"IEEE Trans. Instrum. Meas."},{"issue":"5","key":"10.1016\/S0920-5489(03)00060-6_BIB39","doi-asserted-by":"crossref","first-page":"956","DOI":"10.1109\/19.799654","article-title":"Influence of the architecture on ADC error modeling","volume":"48","author":"Arpaia","year":"1999","journal-title":"IEEE Trans. Instrum. Meas."},{"issue":"4","key":"10.1016\/S0920-5489(03)00060-6_BIB40","doi-asserted-by":"crossref","first-page":"529","DOI":"10.1109\/19.9806","article-title":"Sinewave parameter estimation algorithm with application to waveform digitizer effective bits measurement","volume":"37","author":"Jenq","year":"1988","journal-title":"IEEE Trans. Instrum. Meas."},{"issue":"2","key":"10.1016\/S0920-5489(03)00060-6_BIB41","doi-asserted-by":"crossref","first-page":"200","DOI":"10.1109\/19.293420","article-title":"Waveform estimation with jitter noise using stochastic up and down method","volume":"43","author":"Wei-Da","year":"1994","journal-title":"IEEE Trans. Instrum. Meas."},{"issue":"3","key":"10.1016\/S0920-5489(03)00060-6_BIB42","doi-asserted-by":"crossref","first-page":"549","DOI":"10.1109\/19.87017","article-title":"More on jitter effects on sinewave measurement","volume":"40","author":"Awad","year":"1991","journal-title":"IEEE Trans. Instrum. Meas."},{"issue":"1","key":"10.1016\/S0920-5489(03)00060-6_BIB43","doi-asserted-by":"crossref","first-page":"15","DOI":"10.1016\/S0920-5489(02)00074-0","article-title":"Characterization of digitizer timebase jitter by means of the Allan variance","volume":"25","author":"Arpaia","year":"2003","journal-title":"Computer Standards and Interfaces"},{"issue":"2","key":"10.1016\/S0920-5489(03)00060-6_BIB44","doi-asserted-by":"crossref","first-page":"588","DOI":"10.1109\/19.492793","article-title":"An improved sine-wave fitting procedure for characterizing data acquisition channels","volume":"45","author":"Pintelon","year":"1996","journal-title":"IEEE Trans. Instrum. Meas."},{"issue":"1","key":"10.1016\/S0920-5489(03)00060-6_BIB45","doi-asserted-by":"crossref","first-page":"34","DOI":"10.1109\/19.728785","article-title":"Comparison of time base nonlinearity measurement techniques","volume":"47","author":"Stenbakken","year":"1998","journal-title":"IEEE Trans. Instrum. Meas."},{"issue":"6","key":"10.1016\/S0920-5489(03)00060-6_BIB46","doi-asserted-by":"crossref","first-page":"1753","DOI":"10.1109\/19.982976","article-title":"Measurement of frequency response functions using periodic excitations, corrupted by correlated input\/output errors","volume":"50","author":"Pintelon","year":"2001","journal-title":"IEEE Trans. Instrum. Meas."},{"issue":"5","key":"10.1016\/S0920-5489(03)00060-6_BIB47","doi-asserted-by":"crossref","first-page":"1355","DOI":"10.1109\/19.963210","article-title":"An identification technique for data acquisition characterization in the presence of nonlinear distortions and time base distortions","volume":"50","author":"Vandersteen","year":"2001","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"10.1016\/S0920-5489(03)00060-6_BIB48","first-page":"2","article-title":"Measurement of frequency response functions in the presence of correlated input\/output errors","volume":"1","author":"Pintelon","year":"2001","journal-title":"Proc. IEEE IMTC 2001"},{"key":"10.1016\/S0920-5489(03)00060-6_BIB49","first-page":"1211","article-title":"System identification for data acquisition characterization","volume":"2","author":"Vandersteen","year":"1998","journal-title":"Proc. IEEE IMTC\/98"},{"issue":"4","key":"10.1016\/S0920-5489(03)00060-6_BIB50","doi-asserted-by":"crossref","first-page":"1005","DOI":"10.1109\/19.650817","article-title":"A sinewave fitting procedure for characterizing data acquisition channels in the presence of time base distortion and time jitter","volume":"46","author":"Schoukens","year":"1997","journal-title":"IEEE Trans. Instrum. Meas."},{"issue":"4","key":"10.1016\/S0920-5489(03)00060-6_BIB51","doi-asserted-by":"crossref","first-page":"860","DOI":"10.1109\/19.392871","article-title":"A critical note on histogram testing of data acquisition channels","volume":"44","author":"Schoukens","year":"1995","journal-title":"IEEE Trans. Instrum. Meas."},{"issue":"3","key":"10.1016\/S0920-5489(03)00060-6_BIB52","doi-asserted-by":"crossref","first-page":"659","DOI":"10.1109\/19.87042","article-title":"Another step towards an ideal data acquisition channel","volume":"40","author":"Kollar","year":"1991","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"10.1016\/S0920-5489(03)00060-6_BIB53","first-page":"27","article-title":"Modeling of non-ideal dynamic characteristics in S\/H\u2013ADC devices","author":"Mirri","year":"1995","journal-title":"Proc. IEEE IMTC\/95"},{"key":"10.1016\/S0920-5489(03)00060-6_BIB54","series-title":"Proc. of V IMEKO TC-4 Workshop on ADC Modeling and Testing, Wien, Austria","first-page":"301","article-title":"The problem of the standard characterization of ADC and digitising waveform recorder","author":"Savino","year":"2000"},{"issue":"6","key":"10.1016\/S0920-5489(03)00060-6_BIB55","doi-asserted-by":"crossref","first-page":"1114","DOI":"10.1109\/19.46415","article-title":"Diagnosing ADC nonlinearity at the bit level","volume":"38","author":"Wagdy","year":"1989","journal-title":"IEEE Trans. Instrum. Meas."},{"issue":"2","key":"10.1016\/S0920-5489(03)00060-6_BIB56","doi-asserted-by":"crossref","first-page":"218","DOI":"10.1109\/19.137351","article-title":"Some theorems on Walsh transforms of quantizer differential and integral nonlinearity","volume":"41","author":"Hejn","year":"1992","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"10.1016\/S0920-5489(03)00060-6_BIB57","first-page":"449","article-title":"Effects of ADC nonlinearities in sine-wave amplitude measurement","volume":"3","author":"Bellan","year":"1998","journal-title":"IEEE Int. Conf. Electron. Circuits Syst."},{"key":"10.1016\/S0920-5489(03)00060-6_BIB58","first-page":"1233","article-title":"ADC nonlinearities and harmonic distortion in FFT test","volume":"2","author":"Bellan","year":"1998","journal-title":"IEEE IMTC\/98"},{"key":"10.1016\/S0920-5489(03)00060-6_BIB59","first-page":"1298","article-title":"Dynamic testing of A\/D converters: how many samples for a given precision?","volume":"2","author":"Dallet","year":"1996","journal-title":"IEEE IMTC\/96"},{"issue":"4","key":"10.1016\/S0920-5489(03)00060-6_BIB60","doi-asserted-by":"crossref","first-page":"941","DOI":"10.1109\/19.948304","article-title":"A critical note to IEEE 1057-94 standard on hysteretic ADC dynamic testing","volume":"50","author":"Arpaia","year":"2001","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"10.1016\/S0920-5489(03)00060-6_BIB61","first-page":"1677","article-title":"Phase-spectrum analysis for detection of ADC hysteretic distortion","volume":"3","author":"Monteiro","year":"2001","journal-title":"Proc. IEEE IMTC 2001"},{"issue":"2","key":"10.1016\/S0920-5489(03)00060-6_BIB62","doi-asserted-by":"crossref","first-page":"621","DOI":"10.1109\/19.492799","article-title":"Testing and optimising ADC performance: a probabilistic approach","volume":"45","author":"Giaquinto","year":"1996","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"10.1016\/S0920-5489(03)00060-6_BIB63","series-title":"Proc. of IEEE Int. Workshop on Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications, Foros, Ukraine","first-page":"148","article-title":"Minimization of parameters number describing accuracy of data acquisition system","author":"Bykov","year":"2001"},{"key":"10.1016\/S0920-5489(03)00060-6_BIB64","series-title":"IEEE Int. Workshop on Intelligent Data Acquisition and Advanced Computing Systems Technology and Applications, Foros, Ukraine","first-page":"211","article-title":"Computerised investigation of robust measurement systems","author":"Kolev","year":"2001"},{"key":"10.1016\/S0920-5489(03)00060-6_BIB65","series-title":"IEEE Int. Workshop on Intelligent Data Acquisition and Advanced Computing Systems Technology and Applications, Foros, Ukraine","first-page":"193","article-title":"Development of the integrating analog to digital converter for distributive data acquisition systems with improved noise immunity","author":"Kochan","year":"2001"},{"issue":"9","key":"10.1016\/S0920-5489(03)00060-6_BIB66","doi-asserted-by":"crossref","first-page":"1376","DOI":"10.1109\/43.240085","article-title":"TOSCA: a simulator for switched-capacitor noise-shaping A\/D converters","volume":"12","author":"Liberali","year":"1993","journal-title":"IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."},{"key":"10.1016\/S0920-5489(03)00060-6_BIB67","series-title":"Proc. of 3rd IEEE Int. Conf. on Advanced A\/D and D\/A Conversion Techniques and Their Applications (Conf. Publ. No. 466), Glasgow, UK","first-page":"145","article-title":"LEMMA-ADC: the linear error mechanism modelling algorithm applied to A\/D converters","author":"Carroll","year":"1999"},{"key":"10.1016\/S0920-5489(03)00060-6_BIB68","first-page":"215","article-title":"Symbolic synthesis of analog-to-digital conversion architectures using direct-mapping techniques","volume":"3","author":"Weibiao","year":"1998","journal-title":"Proc. IEEE Int. Conf. Electron. Circuits Syst."},{"key":"10.1016\/S0920-5489(03)00060-6_BIB69","first-page":"207","article-title":"Modelling and characterization of pipelined ADCs","author":"Dallet","year":"2002","journal-title":"Proc. IEEE IMTC"},{"issue":"3\u20134","key":"10.1016\/S0920-5489(03)00060-6_BIB70","first-page":"189","article-title":"Behavioural modelling of sigma-delta modulators","volume":"19","author":"Fischer","year":"1998","journal-title":"Comput. Stand. Interfaces"},{"key":"10.1016\/S0920-5489(03)00060-6_BIB71","series-title":"Delta-Sigma Data Converters\u2014Theory, Design and Simulation","author":"Norsworthy","year":"1997"},{"key":"10.1016\/S0920-5489(03)00060-6_BIB72","unstructured":"http:\/\/rf.rfglobalnet.com\/software_modeling\/software\/2\/551.htm."},{"key":"10.1016\/S0920-5489(03)00060-6_BIB73","unstructured":"Cirrus Logic, Crystal, http:\/\/www.cirrus.com\/design\/products\/overview\/detail.cfm?d=266."},{"key":"10.1016\/S0920-5489(03)00060-6_BIB74","series-title":"Proc. of IEEE Instrumentation and Measurement Technology Conference, Anchorage, Alaska, USA","first-page":"21","article-title":"A fourth-order single-bit switched-capacitor Sigma-Delta modulator for distributed sensor applications","author":"Brigati","year":"2002"},{"key":"10.1016\/S0920-5489(03)00060-6_BIB75","first-page":"715","article-title":"Measurement and enhancement of multistage sigma-delta modulators","author":"Hejn","year":"1992","journal-title":"Proc. IEEE IMTC\/92"},{"key":"10.1016\/S0920-5489(03)00060-6_BIB76","first-page":"96","article-title":"Modeling and characterization of sigma-delta analog-to-digital converters","author":"Arpaia","year":"1998","journal-title":"Proc. IEEE IMTC\/98"},{"issue":"6","key":"10.1016\/S0920-5489(03)00060-6_BIB77","doi-asserted-by":"crossref","first-page":"511","DOI":"10.1049\/el:19980405","article-title":"Wideband cascade delta-sigma modulator with digital correction for finite amplifier gain effects","volume":"34","author":"Fischer","year":"1998","journal-title":"Electron. Lett."},{"issue":"8","key":"10.1016\/S0920-5489(03)00060-6_BIB78","doi-asserted-by":"crossref","first-page":"802","DOI":"10.1109\/82.861422","article-title":"Efficient architectures for time-interleaved oversampling delta-sigma converters","volume":"47","author":"Kozak","year":"2000","journal-title":"IEEE Trans. Circuits Syst., II Analog Digit. Signal Process."},{"issue":"7","key":"10.1016\/S0920-5489(03)00060-6_BIB79","doi-asserted-by":"crossref","first-page":"639","DOI":"10.1109\/82.850423","article-title":"Novel topologies for time-interleaved deltasigma modulators","volume":"47","author":"Kozak","year":"2000","journal-title":"IEEE Trans. Circuits Syst., II Analog Digit. Signal Process."},{"issue":"10","key":"10.1016\/S0920-5489(03)00060-6_BIB80","doi-asserted-by":"crossref","first-page":"789","DOI":"10.1109\/82.633433","article-title":"Alternative topologies for sigma-delta modulators\u2014a comparative study","volume":"44","author":"Fischer","year":"1997","journal-title":"IEEE Trans. Circuits Syst., II Analog Digit. Signal Process."},{"key":"10.1016\/S0920-5489(03)00060-6_BIB81","series-title":"Proc. of 29th Midwest Symposium on Circuits and Systems, Lincoln, Nebraska, USA","first-page":"849","article-title":"Analog-to-Digital Converter compensation precision effects","author":"Irons","year":"1987"},{"key":"10.1016\/S0920-5489(03)00060-6_BIB82","first-page":"455","article-title":"A phase-plane approach to the compensation of high-speed analog-to-digital converters","author":"Rebold","year":"1987","journal-title":"Proc. IEEE Int. Symp. Circuits Syst."},{"key":"10.1016\/S0920-5489(03)00060-6_BIB83","first-page":"290","article-title":"Wideband distortion compensation for bipolar flash analog-to-digital converters","author":"Deyst","year":"1992","journal-title":"Proc. IMTC\/92"},{"key":"10.1016\/S0920-5489(03)00060-6_BIB84","first-page":"914","article-title":"Phase plane compensation of the NIST sampling comparator system","volume":"2","author":"Deyst","year":"1994","journal-title":"Proc. IMTC\/94"},{"key":"10.1016\/S0920-5489(03)00060-6_BIB85","series-title":"Proc. of IEEE Signal Processing Workshop on Higher-Order Statistics, South Lake Tahoe, California, USA","first-page":"379","article-title":"Applications of higher-order statistics to modelling, identification and cancellation of nonlinear distortion in high-speed samplers and analog-to-digital converters using the Volterra and Wiener methods","author":"Tsimbinos","year":"1993"},{"key":"10.1016\/S0920-5489(03)00060-6_BIB86","series-title":"Proc. of 2nd IEEE Int. Conf. on Advanced AD and DA Conversion Techniques and their Applications, Cambridge, UK","first-page":"130","article-title":"Improved state-space and phase plane error table compensation of analog-to-digital converters using pseudo-random calibration signals","author":"Tsimbinos","year":"1994"},{"issue":"6","key":"10.1016\/S0920-5489(03)00060-6_BIB87","doi-asserted-by":"crossref","first-page":"461","DOI":"10.1049\/el:19940367","article-title":"Improved error table compensation of analog-to-digital converters using pseudo-random calibration signals","volume":"30","author":"Tsimbinos","year":"1994","journal-title":"Electron. Lett."},{"issue":"2","key":"10.1016\/S0920-5489(03)00060-6_BIB88","doi-asserted-by":"crossref","first-page":"640","DOI":"10.1109\/19.492802","article-title":"Error compensation of A\/D converters using neural networks","volume":"45","author":"Baccigalupi","year":"1996","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"10.1016\/S0920-5489(03)00060-6_BIB89","first-page":"728","article-title":"Distortion compensation for time-interleaved analog to digital converters","author":"Hummels","year":"1996","journal-title":"Proc. IMTC\/96"},{"key":"10.1016\/S0920-5489(03)00060-6_BIB90","series-title":"Proc. of 35th Midwest Symposium on Circuits and Systems, Washington, DC, USA","first-page":"68","article-title":"Improved dynamic compensation of ADCs using an iterative estimate of the ADC calibration signal","author":"Hummels","year":"1992"},{"key":"10.1016\/S0920-5489(03)00060-6_BIB91","article-title":"A novel architecture for dynamic error correction of Analog-to-Digital Converters","author":"Irons","year":"1992"},{"key":"10.1016\/S0920-5489(03)00060-6_BIB92","doi-asserted-by":"crossref","first-page":"5","DOI":"10.1109\/ISCAS.1994.408891","article-title":"Characterization of Analog-to-Digital Converters using a noniterative procedure","author":"Hummels","year":"1994","journal-title":"Proc. IEEE Int. Symp. Circ. Syst."},{"key":"10.1016\/S0920-5489(03)00060-6_BIB93","first-page":"2015","article-title":"A new bidimensional histogram for the dynamic characterization of ADCs","volume":"3","author":"Acunto","year":"2001","journal-title":"Proc. IEEE IMTC 2001"},{"issue":"4","key":"10.1016\/S0920-5489(03)00060-6_BIB94","doi-asserted-by":"crossref","first-page":"849","DOI":"10.1109\/19.744632","article-title":"Analytical a priori approach to phase-plane modeling of SAR A\/D converters","volume":"47","author":"Arpaia","year":"1998","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"10.1016\/S0920-5489(03)00060-6_BIB95","series-title":"2nd Int. IMEKO TC-4 Symposium, Warsaw, Poland","first-page":"125","article-title":"Computer simulation of autocalibration for successive approximation A\/D converter","author":"Michaeli","year":"1987"},{"key":"10.1016\/S0920-5489(03)00060-6_BIB96","first-page":"693","article-title":"DNL ADC testing by the exponential shaped voltage","volume":"1","author":"Holcer","year":"2001","journal-title":"Proc. IEEE IMTC 2001"}],"container-title":["Computer Standards & Interfaces"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0920548903000606?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0920548903000606?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2019,3,21]],"date-time":"2019-03-21T11:51:51Z","timestamp":1553169111000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/S0920548903000606"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2004,1]]},"references-count":96,"journal-issue":{"issue":"1","published-print":{"date-parts":[[2004,1]]}},"alternative-id":["S0920548903000606"],"URL":"https:\/\/doi.org\/10.1016\/s0920-5489(03)00060-6","relation":{},"ISSN":["0920-5489"],"issn-type":[{"value":"0920-5489","type":"print"}],"subject":[],"published":{"date-parts":[[2004,1]]}}}