{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,8]],"date-time":"2026-01-08T17:19:37Z","timestamp":1767892777042,"version":"3.49.0"},"reference-count":14,"publisher":"Elsevier BV","issue":"1","license":[{"start":{"date-parts":[[2004,1,1]],"date-time":"2004-01-01T00:00:00Z","timestamp":1072915200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Computer Standards & Interfaces"],"published-print":{"date-parts":[[2004,1]]},"DOI":"10.1016\/s0920-5489(03)00062-x","type":"journal-article","created":{"date-parts":[[2003,5,19]],"date-time":"2003-05-19T12:52:26Z","timestamp":1053348746000},"page":"51-56","source":"Crossref","is-referenced-by-count":96,"title":["Four-parameter fitting of sine wave testing result: iteration and convergence"],"prefix":"10.1016","volume":"26","author":[{"given":"Tam\u00e1s Zolt\u00e1n","family":"Bilau","sequence":"first","affiliation":[]},{"given":"Tam\u00e1s","family":"Megyeri","sequence":"additional","affiliation":[]},{"given":"Attila","family":"S\u00e1rhegyi","sequence":"additional","affiliation":[]},{"given":"J\u00e1nos","family":"M\u00e1rkus","sequence":"additional","affiliation":[]},{"given":"Istv\u00e1n","family":"Koll\u00e1r","sequence":"additional","affiliation":[]}],"member":"78","reference":[{"key":"10.1016\/S0920-5489(03)00062-X_BIB1","unstructured":"IEEE TC-10, IEEE Std 1241-2001, Standard for Terminology and Test Methods for Analog-to-Digital Converters."},{"key":"10.1016\/S0920-5489(03)00062-X_BIB2","unstructured":"IEEE TC-10, IEEE Std 1057-94\u2014IEEE Standard for Digitizing Wave-form Recorders."},{"key":"10.1016\/S0920-5489(03)00062-X_BIB3","series-title":"Proc. 6 Euro Workshop on ADC Modelling and Testing, September 13\u201314, Lisbon, Portugal","first-page":"121","article-title":"Improving convergence of sine fitting algorithms","author":"Fonseca da Silva","year":"2001"},{"key":"10.1016\/S0920-5489(03)00062-X_BIB4","doi-asserted-by":"crossref","first-page":"261","DOI":"10.1016\/S0263-2241(01)00041-0","article-title":"Standard environment for the sine wave test of ADC's","volume":"31","author":"M\u00e1rkus","year":"2002","journal-title":"Measurement Journal of IMEKO"},{"issue":"4","key":"10.1016\/S0920-5489(03)00062-X_BIB5","doi-asserted-by":"crossref","first-page":"1020","DOI":"10.1109\/19.650820","article-title":"Fast and accurate ADC testing via an enhanced sine wave fitting algorithm","volume":"46","author":"Giaquinto","year":"1997","journal-title":"IEEE Transactions on Instrumentation and Measurement"},{"key":"10.1016\/S0920-5489(03)00062-X_BIB6","first-page":"119","article-title":"ADC testing based on IEEE 1057-94 standard\u2014some critical notes","volume":"vol. 1","author":"Arpaia","year":"2000"},{"key":"10.1016\/S0920-5489(03)00062-X_BIB7","series-title":"Numerical Recipes: The Art of Scientific Computing","author":"Press","year":"1986"},{"issue":"2","key":"10.1016\/S0920-5489(03)00062-X_BIB8","doi-asserted-by":"crossref","first-page":"226","DOI":"10.1109\/19.137352","article-title":"The interpolated fast Fourier transform: a comparative study","volume":"IM-41","author":"Schoukens","year":"1992","journal-title":"IEEE Transactions on Instrumentation and Measurement"},{"key":"10.1016\/S0920-5489(03)00062-X_BIB9","unstructured":"P. Eykhoff, System Identification. Parameter and State Estimation."},{"issue":"6","key":"10.1016\/S0920-5489(03)00062-X_BIB10","doi-asserted-by":"crossref","first-page":"1189","DOI":"10.1109\/19.893254","article-title":"Properties of the IEEE-STD-1057 four-parameter sine wave fit algorithm","volume":"49","author":"H\u00e4ndel","year":"2000","journal-title":"IEEE Transactions on Instrumentation and Measurement"},{"key":"10.1016\/S0920-5489(03)00062-X_BIB11","first-page":"1504","article-title":"Sine-fitting software for IEEE standards 1057 and 1241","volume":"vol. 3","author":"Blair","year":"1999"},{"key":"10.1016\/S0920-5489(03)00062-X_BIB12","series-title":"Proc. IEEE Instrumentation and Measurement Technology Conference, IMTC\/2001, Budapest, Hungary, May 21\u201323","first-page":"1847","article-title":"A MATLAB tool to execute IEEE-STD 1241","author":"M\u00e1rkus","year":"2001"},{"key":"10.1016\/S0920-5489(03)00062-X_BIB13","unstructured":"J. M\u00e1rkus, ADC Test Data Evaluation Program for Matlab, Home Page URL: http:\/\/www.mit.bme.hu\/services\/ieee\/ADC-test\/."},{"key":"10.1016\/S0920-5489(03)00062-X_BIB14","unstructured":"Test data, URL: http:\/\/www.mit.bme.hu\/services\/ieee\/ADC-test\/data\/."}],"container-title":["Computer Standards & Interfaces"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S092054890300062X?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S092054890300062X?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2019,3,21]],"date-time":"2019-03-21T07:51:51Z","timestamp":1553154711000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/S092054890300062X"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2004,1]]},"references-count":14,"journal-issue":{"issue":"1","published-print":{"date-parts":[[2004,1]]}},"alternative-id":["S092054890300062X"],"URL":"https:\/\/doi.org\/10.1016\/s0920-5489(03)00062-x","relation":{},"ISSN":["0920-5489"],"issn-type":[{"value":"0920-5489","type":"print"}],"subject":[],"published":{"date-parts":[[2004,1]]}}}