{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,22]],"date-time":"2026-01-22T22:25:01Z","timestamp":1769120701416,"version":"3.49.0"},"reference-count":9,"publisher":"Elsevier BV","issue":"3-4","license":[{"start":{"date-parts":[[1998,9,1]],"date-time":"1998-09-01T00:00:00Z","timestamp":904608000000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Computer Standards & Interfaces"],"published-print":{"date-parts":[[1998,9]]},"DOI":"10.1016\/s0920-5489(98)00011-7","type":"journal-article","created":{"date-parts":[[2002,7,25]],"date-time":"2002-07-25T14:53:54Z","timestamp":1027608834000},"page":"231-236","source":"Crossref","is-referenced-by-count":10,"title":["Improved definition of the effective number of bits in ADC testing"],"prefix":"10.1016","volume":"19","author":[{"given":"Diego","family":"Bellan","sequence":"first","affiliation":[]},{"given":"Arnaldo","family":"Brandolini","sequence":"additional","affiliation":[]},{"given":"Luca","family":"di Rienzo","sequence":"additional","affiliation":[]},{"given":"Alessandro","family":"Gandelli","sequence":"additional","affiliation":[]}],"member":"78","reference":[{"key":"10.1016\/S0920-5489(98)00011-7_BIB1","unstructured":"Dynamic performance testing of analog to digital converters, Hewlett Packard, product note 5180A-2."},{"key":"10.1016\/S0920-5489(98)00011-7_BIB2","unstructured":"Seitzer, Pretzl, Hamdy, Electronic analog-to-digital converters\u2014Principles, circuits, devices, testing, Wiley, Chichester, 1989."},{"key":"10.1016\/S0920-5489(98)00011-7_BIB3","unstructured":"The Engineering Staff of Analog Devices, Analog-digital Conversion Handbook, Prentice-Hall, Englewood Cliffs, 1986."},{"key":"10.1016\/S0920-5489(98)00011-7_BIB4","unstructured":"H.-H. Albrecht, N. Zisky, H. Schumny, Metrological investigation of high-resolution A\/D converters, IMEKO TC-4, International Workshop on ADC Modelling, Smolenice Castle, Slovak Republik, May 7\u20139, 1996."},{"key":"10.1016\/S0920-5489(98)00011-7_BIB5","doi-asserted-by":"crossref","unstructured":"N. Giaquinto, A. Trotta, Fast and accurate ADC testing via an enhanced sine wave fitting algorithm, IMTC `96, Brussels, Belgium, June 4\u20136, 1996.","DOI":"10.1109\/19.650820"},{"key":"10.1016\/S0920-5489(98)00011-7_BIB6","unstructured":"D. Bellan, Deterministic theory of quantization in electrical measurements, MS Thesis, in Italian, Politecnico di Milano, Milano, Italy, Oct. 21, 1994."},{"key":"10.1016\/S0920-5489(98)00011-7_BIB7","unstructured":"D. Bellan, A. Brandolini, A. Gandelli, Advanced signal quantization theory, Proceeding of the International workshop on Advanced Mathematical Methods in Electrical and Electronic Measurements, Como, Villa Olmo, July 6\u20138, 1994."},{"key":"10.1016\/S0920-5489(98)00011-7_BIB8","doi-asserted-by":"crossref","unstructured":"D. Bellan, A. Brandolini, A. Gandelli, Quantization effects in sampling processes, IMTC `96, Brussels, Belgium, June 4\u20136, 1996.","DOI":"10.1109\/IMTC.1996.507476"},{"key":"10.1016\/S0920-5489(98)00011-7_BIB9","doi-asserted-by":"crossref","DOI":"10.1109\/TIM.1984.4315198","article-title":"Effective bits: is that all there is?","volume":"33","author":"Linnenbrink","year":"1984","journal-title":"IEEE Trans. Instrum. Meas."}],"container-title":["Computer Standards & Interfaces"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0920548998000117?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0920548998000117?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2020,1,9]],"date-time":"2020-01-09T21:11:13Z","timestamp":1578604273000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/S0920548998000117"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1998,9]]},"references-count":9,"journal-issue":{"issue":"3-4","published-print":{"date-parts":[[1998,9]]}},"alternative-id":["S0920548998000117"],"URL":"https:\/\/doi.org\/10.1016\/s0920-5489(98)00011-7","relation":{},"ISSN":["0920-5489"],"issn-type":[{"value":"0920-5489","type":"print"}],"subject":[],"published":{"date-parts":[[1998,9]]}}}