{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,27]],"date-time":"2025-10-27T20:25:03Z","timestamp":1761596703237},"reference-count":22,"publisher":"Elsevier BV","issue":"4","license":[{"start":{"date-parts":[[2000,10,1]],"date-time":"2000-10-01T00:00:00Z","timestamp":970358400000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Artificial Intelligence in Engineering"],"published-print":{"date-parts":[[2000,10]]},"DOI":"10.1016\/s0954-1810(00)00021-2","type":"journal-article","created":{"date-parts":[[2002,7,25]],"date-time":"2002-07-25T21:01:59Z","timestamp":1027630919000},"page":"331-351","source":"Crossref","is-referenced-by-count":17,"title":["Debugging VHDL designs using model-based reasoning"],"prefix":"10.1016","volume":"14","author":[{"given":"F.","family":"Wotawa","sequence":"first","affiliation":[]}],"member":"78","reference":[{"key":"10.1016\/S0954-1810(00)00021-2_BIB1","doi-asserted-by":"crossref","first-page":"57","DOI":"10.1016\/S0004-3702(99)00039-9","article-title":"Enhancing model checking in verification by AI techniques","volume":"112","author":"Buccafurri","year":"1999","journal-title":"Artificial Intelligence"},{"key":"10.1016\/S0954-1810(00)00021-2_BIB2","doi-asserted-by":"crossref","unstructured":"Burnell L, Horvitz E. A synthesis of logical and probabilistic reasoning for program understanding and debugging. In: Proceedings of the International Conference on Uncertainty in Artificial Intelligence, 1993. p. 285\u201391.","DOI":"10.1016\/B978-1-4832-1451-1.50039-1"},{"key":"10.1016\/S0954-1810(00)00021-2_BIB3","doi-asserted-by":"crossref","first-page":"31","DOI":"10.1145\/203330.203338","article-title":"Structure and chance: melding logic and probability for software debugging","author":"Burnell","year":"1995","journal-title":"Communications of the ACM"},{"key":"10.1016\/S0954-1810(00)00021-2_BIB4","doi-asserted-by":"crossref","first-page":"320","DOI":"10.1109\/92.311641","article-title":"Logic design error diagnosis and correction","volume":"2","author":"Chung","year":"1994","journal-title":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems"},{"issue":"5","key":"10.1016\/S0954-1810(00)00021-2_BIB5","doi-asserted-by":"crossref","first-page":"1512","DOI":"10.1145\/186025.186051","article-title":"Model checking and abstraction","volume":"16","author":"Clarke","year":"1994","journal-title":"ACM Transactions on Database Systems"},{"issue":"2","key":"10.1016\/S0954-1810(00)00021-2_BIB6","doi-asserted-by":"crossref","first-page":"244","DOI":"10.1145\/5397.5399","article-title":"Automatic verification of finite-state concurrent systems using temporal logic specifications","volume":"8","author":"Clarke","year":"1986","journal-title":"ACM Transactions on Database Systems"},{"issue":"1","key":"10.1016\/S0954-1810(00)00021-2_BIB7","doi-asserted-by":"crossref","first-page":"97","DOI":"10.1016\/0004-3702(87)90063-4","article-title":"Diagnosing multiple faults","volume":"32","author":"de Kleer","year":"1987","journal-title":"Artificial Intelligence"},{"key":"10.1016\/S0954-1810(00)00021-2_BIB8","unstructured":"Friedrich G, Gottlob G, Nejdl W. Physical impossibility instead of fault models. In: Proceedings of the National Conference on Artificial Intelligence (AAAI), Boston, August 1990. p. 331\u20136. (Also appears in: Readings in Model-Based Diagnosis. Los Altos, CA: Morgan Kaufmann, 1992.)"},{"key":"10.1016\/S0954-1810(00)00021-2_BIB9","unstructured":"Friedrich G, Stumptner M, Wotawa F. Model-based diagnosis of hardware designs. In: Proceedings of the European Conference on Artificial Intelligence (ECAI), Budapest, August 1996."},{"issue":"2","key":"10.1016\/S0954-1810(00)00021-2_BIB10","doi-asserted-by":"crossref","first-page":"3","DOI":"10.1016\/S0004-3702(99)00034-X","article-title":"Model-based diagnosis of hardware designs","volume":"111","author":"Friedrich","year":"1999","journal-title":"Artificial Intelligence"},{"key":"10.1016\/S0954-1810(00)00021-2_BIB11","unstructured":"IEEE. IEEE Standard VHDL Language Reference Manual LRM Std 1076-1987, 1988. Institute of Electrical and Electronics Engineers, Inc."},{"issue":"2","key":"10.1016\/S0954-1810(00)00021-2_BIB12","doi-asserted-by":"crossref","first-page":"109","DOI":"10.1145\/210134.210135","article-title":"Aspect: detecting bugs with abstract dependences","volume":"4","author":"Jackson","year":"1995","journal-title":"ACM Transactions on Software Engineering and Methodology"},{"key":"10.1016\/S0954-1810(00)00021-2_BIB13","doi-asserted-by":"crossref","unstructured":"Kuper RI. Dependency-directed localization of software bugs. Technical Report AI-TR 1053, MIT AI Lab, May 1989.","DOI":"10.21236\/ADA210837"},{"key":"10.1016\/S0954-1810(00)00021-2_BIB14","series-title":"VHDL analysis and modeling of digital systems","author":"Navabi","year":"1993"},{"issue":"1","key":"10.1016\/S0954-1810(00)00021-2_BIB15","doi-asserted-by":"crossref","first-page":"57","DOI":"10.1016\/0004-3702(87)90062-2","article-title":"A theory of diagnosis from first principles","volume":"32","author":"Reiter","year":"1987","journal-title":"Artificial Intelligence"},{"key":"10.1016\/S0954-1810(00)00021-2_BIB16","unstructured":"Struss P, Dressler O. Physical negation \u2014 integrating fault models into the general diagnostic engine. In: Proceedings of the 11th International Joint Conference on Artificial Intelligence (IJCAI), Detroit, August 1989. p. 1318\u201323."},{"key":"10.1016\/S0954-1810(00)00021-2_BIB17","unstructured":"Stumptner M, Wotawa F. Model-based program debugging and repair. In: Proceedings of the International Conference on Industrial and Engineering Applications of Artificial Intelligence and Expert Systems (IEA\/AIE), Fukuoka, 1996."},{"key":"10.1016\/S0954-1810(00)00021-2_BIB18","doi-asserted-by":"crossref","unstructured":"Stumptner M, Wotawa F. A model-based tool for finding faults in hardware designs. In: Proceedings of Artificial Intelligence in Design (AID), Stanford, 1996.","DOI":"10.1007\/978-94-009-0279-4_29"},{"issue":"1","key":"10.1016\/S0954-1810(00)00021-2_BIB19","first-page":"35","article-title":"A. Survey of intelligent debugging","volume":"11","author":"Stumptner","year":"1998","journal-title":"AI Communications"},{"issue":"7","key":"10.1016\/S0954-1810(00)00021-2_BIB20","doi-asserted-by":"crossref","first-page":"446","DOI":"10.1145\/358557.358577","article-title":"Programmers use slices when debugging","volume":"25","author":"Weiser","year":"1982","journal-title":"Communications of the ACM"},{"issue":"4","key":"10.1016\/S0954-1810(00)00021-2_BIB21","doi-asserted-by":"crossref","first-page":"352","DOI":"10.1109\/TSE.1984.5010248","article-title":"Program slicing","volume":"10","author":"Weiser","year":"1984","journal-title":"IEEE Transactions on Software Engineering"},{"key":"10.1016\/S0954-1810(00)00021-2_BIB22","unstructured":"Wotawa F. Applying model-based diagnosis to software debugging of concurrent and sequential imperative programming languages. PhD thesis, Technische Universitat Wien, 1996."}],"container-title":["Artificial Intelligence in Engineering"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0954181000000212?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0954181000000212?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2019,4,20]],"date-time":"2019-04-20T20:26:03Z","timestamp":1555791963000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/S0954181000000212"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2000,10]]},"references-count":22,"journal-issue":{"issue":"4","published-print":{"date-parts":[[2000,10]]}},"alternative-id":["S0954181000000212"],"URL":"https:\/\/doi.org\/10.1016\/s0954-1810(00)00021-2","relation":{},"ISSN":["0954-1810"],"issn-type":[{"value":"0954-1810","type":"print"}],"subject":[],"published":{"date-parts":[[2000,10]]}}}