{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,4,5]],"date-time":"2022-04-05T01:56:51Z","timestamp":1649123811289},"reference-count":16,"publisher":"Elsevier BV","issue":"3","license":[{"start":{"date-parts":[[2000,1,1]],"date-time":"2000-01-01T00:00:00Z","timestamp":946684800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Journal of Systems Architecture"],"published-print":{"date-parts":[[2000,1]]},"DOI":"10.1016\/s1383-7621(99)00003-x","type":"journal-article","created":{"date-parts":[[2003,4,7]],"date-time":"2003-04-07T14:33:56Z","timestamp":1049726036000},"page":"225-242","source":"Crossref","is-referenced-by-count":3,"title":["An extended-UIO-based method for protocol conformance testing"],"prefix":"10.1016","volume":"46","author":[{"given":"Giacomo","family":"Buonanno","sequence":"first","affiliation":[]},{"given":"Franco","family":"Fummi","sequence":"additional","affiliation":[]},{"given":"Donatella","family":"Sciuto","sequence":"additional","affiliation":[]}],"member":"78","reference":[{"key":"10.1016\/S1383-7621(99)00003-X_BIB1","doi-asserted-by":"crossref","first-page":"285","DOI":"10.1016\/0169-7552(88)90064-5","article-title":"A protocol test generation procedure","volume":"15","author":"Sabnani","year":"1988","journal-title":"North-Holland, Computer Networks and ISDN Systems"},{"issue":"8","key":"10.1016\/S1383-7621(99)00003-X_BIB2","doi-asserted-by":"crossref","first-page":"1317","DOI":"10.1109\/5.58319","article-title":"Formal methods for generating protocol conformance test sequences","volume":"78","author":"Dahbura","year":"1990","journal-title":"Proc. IEEE"},{"key":"10.1016\/S1383-7621(99)00003-X_BIB3","unstructured":"S. Naito, M. Tsunoyama, Fault detection for sequential machines by transition tours, Proceedings of the 11th IEEE Fault Tolerant Computing Symposium, 1981, pp. 238\u2013243"},{"key":"10.1016\/S1383-7621(99)00003-X_BIB4","unstructured":"M.U. Uyar, A.T. Dahbura, Optimal test sequence generation for protocols: the Chinese Postman Algoritm applied to Q.931, Proceedings of the 1986 IEEE Global Telecommunications Conference, 1986, pp. 68\u201372"},{"issue":"11","key":"10.1016\/S1383-7621(99)00003-X_BIB5","doi-asserted-by":"crossref","first-page":"1604","DOI":"10.1109\/26.111442","article-title":"An optimization technique for protocol conformance test generation based on UIO sequences and rural chinese postman tours","volume":"39","author":"Aho","year":"1991","journal-title":"IEEE Trans. on Commun."},{"key":"10.1016\/S1383-7621(99)00003-X_BIB6","unstructured":"Z. Kohavi, Switching and Finite Automata Theory, McGraw-Hill, New York, 1978"},{"key":"10.1016\/S1383-7621(99)00003-X_BIB7","doi-asserted-by":"crossref","unstructured":"F.C. Hennie, Fault detecting experiments for sequential circuits, Proceedings of the fifth Annual Symposium on Switching Circuit Theory and Logical Design, 1964, pp. 95\u2013110","DOI":"10.1109\/SWCT.1964.8"},{"issue":"3","key":"10.1016\/S1383-7621(99)00003-X_BIB8","doi-asserted-by":"crossref","first-page":"178","DOI":"10.1109\/TSE.1978.231496","article-title":"Testing software designs modeled by finite-state machines","volume":"4","author":"Chow","year":"1978","journal-title":"IEEE Trans. on Software Eng."},{"key":"10.1016\/S1383-7621(99)00003-X_BIB9","doi-asserted-by":"crossref","unstructured":"K.-T. Cheng, J.-Y. Jou, A single-state-transition fault model for sequential machines, Proceedings of the IEEE International Conference on Computer Aided Design, 1990, pp. 226\u2013229","DOI":"10.1109\/ICCAD.1990.129887"},{"issue":"4","key":"10.1016\/S1383-7621(99)00003-X_BIB10","doi-asserted-by":"crossref","first-page":"413","DOI":"10.1109\/32.16602","article-title":"Formal methods for protocol testing: a detailed study","volume":"15","author":"Sidhu","year":"1989","journal-title":"IEEE Trans. on Software Eng."},{"issue":"8","key":"10.1016\/S1383-7621(99)00003-X_BIB11","doi-asserted-by":"crossref","first-page":"1282","DOI":"10.1109\/26.156631","article-title":"Protocol conformance testing using multiple UIO sequences","volume":"40","author":"Shen","year":"1992","journal-title":"IEEE Trans. on Commun."},{"issue":"9","key":"10.1016\/S1383-7621(99)00003-X_BIB12","doi-asserted-by":"crossref","first-page":"976","DOI":"10.1109\/32.92918","article-title":"On the complexity of optimal test sequence generation","volume":"17","author":"Boyd","year":"1991","journal-title":"IEEE Trans. on Software Eng."},{"key":"10.1016\/S1383-7621(99)00003-X_BIB13","doi-asserted-by":"crossref","first-page":"31","DOI":"10.1002\/net.3230250105","article-title":"Lower bounds for the length of test sequences using UIOs","volume":"25","author":"Rodrigues","year":"1995","journal-title":"Networks"},{"key":"10.1016\/S1383-7621(99)00003-X_BIB14","unstructured":"M.-S. Chen, Y. Choi, A. Kershenbaum, Approaches Utilizing Segment Overlap to Minimize Test Sequences, Protocol Specification, testing and Verification, vol. 10, North-Holland, Amsterdam, 1990, pp. 85\u201398"},{"key":"10.1016\/S1383-7621(99)00003-X_BIB15","doi-asserted-by":"crossref","unstructured":"R.E. Miller, S. Paul, Generating minimal length test sequences for conformance testing of communication protcols, Proceedings of the IEEE INFOCOM '91, April 1991, pp. 8D.4.1\u20138D.4.10","DOI":"10.1109\/INFCOM.1991.147610"},{"key":"10.1016\/S1383-7621(99)00003-X_BIB16","doi-asserted-by":"crossref","unstructured":"G. Buonanno, F. Fummi, D. Sciuto, F. Lombardi, FsmTest: Functional Test Generator for Sequential Circuits, INTEGRATION, the VLSI Journal, vol. 20.3, Elsevier, Amsterdam, 1996, pp. 303\u2013325","DOI":"10.1016\/0167-9260(96)00006-5"}],"container-title":["Journal of Systems Architecture"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S138376219900003X?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S138376219900003X?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2020,1,10]],"date-time":"2020-01-10T22:31:14Z","timestamp":1578695474000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/S138376219900003X"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2000,1]]},"references-count":16,"journal-issue":{"issue":"3","published-print":{"date-parts":[[2000,1]]}},"alternative-id":["S138376219900003X"],"URL":"https:\/\/doi.org\/10.1016\/s1383-7621(99)00003-x","relation":{},"ISSN":["1383-7621"],"issn-type":[{"value":"1383-7621","type":"print"}],"subject":[],"published":{"date-parts":[[2000,1]]}}}