{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,25]],"date-time":"2026-07-25T18:34:34Z","timestamp":1785004474713,"version":"3.55.0"},"reference-count":16,"publisher":"Elsevier BV","license":[{"start":{"date-parts":[[2026,3,1]],"date-time":"2026-03-01T00:00:00Z","timestamp":1772323200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"},{"start":{"date-parts":[[2026,3,1]],"date-time":"2026-03-01T00:00:00Z","timestamp":1772323200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/legal\/tdmrep-license"},{"start":{"date-parts":[[2025,12,4]],"date-time":"2025-12-04T00:00:00Z","timestamp":1764806400000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100001665","name":"French National Research Agency","doi-asserted-by":"publisher","award":["ANR-21-CE08-0013"],"award-info":[{"award-number":["ANR-21-CE08-0013"]}],"id":[{"id":"10.13039\/501100001665","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["elsevier.com","sciencedirect.com"],"crossmark-restriction":true},"short-container-title":["Micron"],"published-print":{"date-parts":[[2026,3]]},"DOI":"10.1016\/j.micron.2025.103980","type":"journal-article","created":{"date-parts":[[2025,12,5]],"date-time":"2025-12-05T00:35:08Z","timestamp":1764894908000},"page":"103980","update-policy":"https:\/\/doi.org\/10.1016\/elsevier_cm_policy","source":"Crossref","is-referenced-by-count":2,"special_numbering":"C","title":["Development and validation of an interface for automated image acquisition during high-temperature environmental scanning electron microscopy experiments"],"prefix":"10.1016","volume":"202","author":[{"given":"J.","family":"Lautru","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"R.","family":"Podor","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"78","reference":[{"key":"10.1016\/j.micron.2025.103980_bib1","unstructured":"J.W. Brouillette, W.E. Leyshon, 1975. Hot sub-stage for a scanning electron microscope. US patent n\u00b03919558. \u3008https:\/\/patents.google.com\/patent\/US3919558\u3009."},{"key":"10.1016\/j.micron.2025.103980_bib2","doi-asserted-by":"crossref","first-page":"51","DOI":"10.1111\/j.1365-2818.1989.tb01466.x","article-title":"A hot stage SEM for gas-solid reaction studies","volume":"153","author":"Brown","year":"1989","journal-title":"J. Microsc."},{"key":"10.1016\/j.micron.2025.103980_bib3","doi-asserted-by":"crossref","first-page":"85","DOI":"10.1016\/0039-6028(75)90010-2","article-title":"Oxidation of iron within the scanning electron microscope: oxide crystallite growth kinetics during the oxidation of iron in CO2","volume":"52","author":"Brown","year":"1975","journal-title":"Surf. Sci."},{"key":"10.1016\/j.micron.2025.103980_bib4","doi-asserted-by":"crossref","first-page":"137","DOI":"10.1016\/0010-938X(76)90054-8","article-title":"In-situ oxidation of iron and steel in the scanning electron microscope","volume":"16","author":"Castle","year":"1976","journal-title":"Corros. Sci."},{"key":"10.1016\/j.micron.2025.103980_bib5","doi-asserted-by":"crossref","first-page":"43","DOI":"10.1002\/pssa.2211540106","article-title":"In-situ electron microscopy studies of hot filament chemical vapour deposition diamond thin film growth in an environmental SEM","volume":"154","author":"Charyshkin","year":"1996","journal-title":"Phys. Status Solidi A"},{"key":"10.1016\/j.micron.2025.103980_bib6","doi-asserted-by":"crossref","first-page":"72","DOI":"10.1002\/sca.4950020202","article-title":"Principles of scanning electron microscopy at high specimen pressures","volume":"2","author":"Danilatos","year":"1979","journal-title":"Scanning"},{"key":"10.1016\/j.micron.2025.103980_bib7","unstructured":"R.M. Fulrath, 1972. Scanning Electron Microscopy to 1600\u00a0\u00b0C. SEM. p. 17\u201324, Chicago (Illinois). \u3008https:\/\/www.osti.gov\/biblio\/4627284-scanning-electron-microscopy-sup\u3009."},{"key":"10.1016\/j.micron.2025.103980_bib8","series-title":"Superalloys 2024. ISS 2024. The Minerals, Metals & Materials Series","article-title":"Oxidation behavior of platinum-containing Model \u03b3 and \u03b3\u2032 and TROPEA superalloy","author":"Hunault","year":"2024"},{"key":"10.1016\/j.micron.2025.103980_bib9","doi-asserted-by":"crossref","first-page":"1211","DOI":"10.1007\/s11085-024-10272-9","article-title":"Short-term oxidation in HT-SEM of the Pt-containing TROPEA single crystal Ni-based superalloy from 680 to 1000 \u00b0C","volume":"101","author":"Mathieu","year":"2024","journal-title":"High Temp. Corros. Mater."},{"key":"10.1016\/j.micron.2025.103980_bib10","doi-asserted-by":"crossref","first-page":"15","DOI":"10.1016\/j.matchar.2019.02.036","article-title":"Working with the ESEM at high temperature","volume":"151","author":"Podor","year":"2019","journal-title":"Mater. Charact."},{"issue":"1","key":"10.1016\/j.micron.2025.103980_bib11","doi-asserted-by":"crossref","first-page":"45","DOI":"10.1111\/jmi.12979","article-title":"Evaluation and application of a new scintillator-based heat-resistant back-scattered electron detector during heat treatment in the scanning electron microscope","volume":"282","author":"Podor","year":"2021","journal-title":"J. Microsc."},{"key":"10.1016\/j.micron.2025.103980_bib12","doi-asserted-by":"crossref","DOI":"10.1016\/j.matchar.2025.115754","article-title":"NiO whiskers growth driven by the presence of Pt nanoparticles during Ni-base superalloy oxidation","volume":"230","author":"Podor","year":"2025","journal-title":"Mater. Charact."},{"key":"10.1016\/j.micron.2025.103980_bib13","series-title":"Superalloys 2020. The Minerals, Metals & Materials Series","article-title":"Platinum-containing new generation nickel-based superalloy for single crystalline applications","author":"Rame","year":"2020"},{"key":"10.1016\/j.micron.2025.103980_bib14","series-title":"Principles and Practice of Variable Pressure\/Environmental Scanning Electron Microscopy (VP\/ESEM)","author":"Stokes","year":"2008"},{"key":"10.1016\/j.micron.2025.103980_bib15","doi-asserted-by":"crossref","first-page":"471","DOI":"10.1007\/BF00603538","article-title":"Hot-stage scanning electron microscope for high-temperature in-situ oxidation studies","volume":"15","author":"Verma","year":"1981","journal-title":"Oxid. Met."},{"key":"10.1016\/j.micron.2025.103980_bib16","doi-asserted-by":"crossref","first-page":"267","DOI":"10.1016\/j.msea.2005.09.067","article-title":"Investigation of eutectic island formation in SX superalloys","volume":"413\u2013414","author":"Warnken","year":"2005","journal-title":"Mater. Sci. Eng. A"}],"container-title":["Micron"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0968432825001982?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0968432825001982?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2026,3,19]],"date-time":"2026-03-19T00:31:11Z","timestamp":1773880271000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/S0968432825001982"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,3]]},"references-count":16,"alternative-id":["S0968432825001982"],"URL":"https:\/\/doi.org\/10.1016\/j.micron.2025.103980","relation":{},"ISSN":["0968-4328"],"issn-type":[{"value":"0968-4328","type":"print"}],"subject":[],"published":{"date-parts":[[2026,3]]},"assertion":[{"value":"Elsevier","name":"publisher","label":"This article is maintained by"},{"value":"Development and validation of an interface for automated image acquisition during high-temperature environmental scanning electron microscopy experiments","name":"articletitle","label":"Article Title"},{"value":"Micron","name":"journaltitle","label":"Journal Title"},{"value":"https:\/\/doi.org\/10.1016\/j.micron.2025.103980","name":"articlelink","label":"CrossRef DOI link to publisher maintained version"},{"value":"article","name":"content_type","label":"Content Type"},{"value":"\u00a9 2025 The Authors. Published by Elsevier Ltd.","name":"copyright","label":"Copyright"}],"article-number":"103980"}}