{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,9,1]],"date-time":"2026-09-01T12:26:20Z","timestamp":1788265580588,"version":"build-2803163510"},"reference-count":29,"publisher":"Elsevier BV","license":[{"start":{"date-parts":[[2026,11,1]],"date-time":"2026-11-01T00:00:00Z","timestamp":1793491200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"},{"start":{"date-parts":[[2026,11,1]],"date-time":"2026-11-01T00:00:00Z","timestamp":1793491200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/legal\/tdmrep-license"},{"start":{"date-parts":[[2026,7,31]],"date-time":"2026-07-31T00:00:00Z","timestamp":1785456000000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":["elsevier.com","sciencedirect.com"],"crossmark-restriction":true},"short-container-title":["Micron"],"published-print":{"date-parts":[[2026,11]]},"DOI":"10.1016\/j.micron.2026.104083","type":"journal-article","created":{"date-parts":[[2026,7,28]],"date-time":"2026-07-28T15:43:04Z","timestamp":1785253384000},"page":"104083","update-policy":"https:\/\/doi.org\/10.1016\/elsevier_cm_policy","source":"Crossref","is-referenced-by-count":0,"special_numbering":"C","title":["Simulation study on the influence of single and multiple atoms on quantitative STEM-DPC imaging of atomic charge distributions"],"prefix":"10.1016","volume":"207","author":[{"given":"Maja","family":"Groll","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Julius","family":"B\u00fcrger","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"J\u00f6rg K.N.","family":"Lindner","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"78","reference":[{"key":"10.1016\/j.micron.2026.104083_b1","doi-asserted-by":"crossref","DOI":"10.1016\/j.ultramic.2020.113118","article-title":"Influence of lens aberrations, specimen thickness and tilt on differential phase contrast STEM images","volume":"219","author":"B\u00fcrger","year":"2020","journal-title":"Ultramicroscopy"},{"issue":"24","key":"10.1016\/j.micron.2026.104083_b2","doi-asserted-by":"crossref","first-page":"10157","DOI":"10.1021\/acs.nanolett.1c02334","article-title":"Atomic electrostatic maps of point defects in MoS2","volume":"21","author":"Calderon V","year":"2021","journal-title":"Nano Lett."},{"key":"10.1016\/j.micron.2026.104083_b3","doi-asserted-by":"crossref","first-page":"124","DOI":"10.1016\/j.ultramic.2015.09.002","article-title":"Towards quantitative, atomic-resolution reconstruction of the electrostatic potential via differential phase contrast using electrons","volume":"159","author":"Close","year":"2015","journal-title":"Ultramicroscopy"},{"issue":"21","key":"10.1016\/j.micron.2026.104083_b4","doi-asserted-by":"crossref","first-page":"2832","DOI":"10.1039\/b801115j","article-title":"Covalent radii revisited","volume":"37","author":"Cordero","year":"2008","journal-title":"Dalton Trans."},{"issue":"10","key":"10.1016\/j.micron.2026.104083_b5","doi-asserted-by":"crossref","first-page":"609","DOI":"10.1107\/S0365110X57002194","article-title":"The scattering of electrons by atoms and crystals. I. A new theoretical approach","volume":"10","author":"Cowley","year":"1957","journal-title":"Acta Crystallogr."},{"key":"10.1016\/j.micron.2026.104083_b6","doi-asserted-by":"crossref","DOI":"10.1016\/j.ultramic.2023.113702","article-title":"A decade of atom-counting in STEM: From the first results toward reliable 3D atomic models from a single projection","volume":"247","author":"De Backer","year":"2023","journal-title":"Ultramicroscopy"},{"issue":"48","key":"10.1016\/j.micron.2026.104083_b7","doi-asserted-by":"crossref","first-page":"20683","DOI":"10.1039\/D1NR06614E","article-title":"Imaging atomic motion of light elements in 2D materials with 30 kV electron microscopy","volume":"13","author":"De Graaf","year":"2021","journal-title":"Nanoscale"},{"issue":"5","key":"10.1016\/j.micron.2026.104083_b8","doi-asserted-by":"crossref","first-page":"ozaf102","DOI":"10.1093\/mam\/ozaf102","article-title":"Optimizing atomic number contrast in multislice electron ptychography","volume":"31","author":"Denzer","year":"2025","journal-title":"Microsc. Microanal."},{"issue":"1","key":"10.1016\/j.micron.2026.104083_b9","doi-asserted-by":"crossref","first-page":"1127","DOI":"10.1038\/s41467-019-08904-9","article-title":"Atomic electrostatic maps of 1D channels in 2D semiconductors using 4D scanning transmission electron microscopy","volume":"10","author":"Fang","year":"2019","journal-title":"Nat. Commun."},{"issue":"35","key":"10.1016\/j.micron.2026.104083_b10","doi-asserted-by":"crossref","DOI":"10.1002\/smll.202311635","article-title":"DFT-assisted investigation of the electric field and charge density distribution of pristine and defective 2D WSe2 by differential phase contrast imaging","volume":"20","author":"Groll","year":"2024","journal-title":"Small"},{"issue":"1","key":"10.1016\/j.micron.2026.104083_b11","doi-asserted-by":"crossref","first-page":"10","DOI":"10.1186\/s40679-018-0059-4","article-title":"Sub-\u00c5ngstrom electric field measurements on a universal detector in a scanning transmission electron microscope","volume":"4","author":"Hachtel","year":"2018","journal-title":"Adv. Struct. Chem. Imaging"},{"key":"10.1016\/j.micron.2026.104083_b12","doi-asserted-by":"crossref","DOI":"10.1016\/j.ultramic.2024.114066","article-title":"Towards atom counting from first moment STEM images: Methodology and possibilities","volume":"268","author":"Hao","year":"2025","journal-title":"Ultramicroscopy"},{"issue":"1","key":"10.1016\/j.micron.2026.104083_b13","doi-asserted-by":"crossref","first-page":"3878","DOI":"10.1038\/s41467-018-06387-8","article-title":"Direct electric field imaging of graphene defects","volume":"9","author":"Ishikawa","year":"2018","journal-title":"Nat. Commun."},{"issue":"27","key":"10.1016\/j.micron.2026.104083_b14","article-title":"The atomic simulation environment\u2014a python library for working with atoms","volume":"29","author":"Larsen","year":"2017","journal-title":"J. Phys.: Condens. Matter."},{"key":"10.1016\/j.micron.2026.104083_b15","doi-asserted-by":"crossref","first-page":"265","DOI":"10.1016\/j.ultramic.2015.10.011","article-title":"Phase contrast STEM for thin samples: Integrated differential phase contrast","volume":"160","author":"Lazi\u0107","year":"2016","journal-title":"Ultramicroscopy"},{"issue":"6","key":"10.1016\/j.micron.2026.104083_b16","doi-asserted-by":"crossref","first-page":"636","DOI":"10.1107\/S205327331401643X","article-title":"An accurate parameterization for scattering factors, electron densities and electrostatic potentials for neutral atoms that obey all physical constraints","volume":"70","author":"Lobato","year":"2014","journal-title":"Acta Crystallogr. Sect. A Found. Adv."},{"issue":"24","key":"10.1016\/j.micron.2026.104083_b17","first-page":"13015","article-title":"abTEM: Transmission electron microscopy from first principles","volume":"1","author":"Madsen","year":"2021","journal-title":"Open Res. Eur."},{"issue":"1","key":"10.1016\/j.micron.2026.104083_b18","doi-asserted-by":"crossref","first-page":"4363","DOI":"10.1038\/s41467-023-39304-9","article-title":"Imaging the electron charge density in monolayer MoS2 at the \u00c5ngstrom scale","volume":"14","author":"Martis","year":"2023","journal-title":"Nat. Commun."},{"issue":"9","key":"10.1016\/j.micron.2026.104083_b19","doi-asserted-by":"crossref","DOI":"10.1063\/5.0182685","article-title":"GPAW: An open Python package for electronic structure calculations","volume":"160","author":"Mortensen","year":"2024","journal-title":"J. Chem. Phys."},{"issue":"1","key":"10.1016\/j.micron.2026.104083_b20","doi-asserted-by":"crossref","first-page":"5653","DOI":"10.1038\/ncomms6653","article-title":"Atomic electric fields revealed by a quantum mechanical approach to electron picodiffraction","volume":"5","author":"M\u00fcller","year":"2014","journal-title":"Nat. Commun."},{"issue":"12","key":"10.1016\/j.micron.2026.104083_b21","doi-asserted-by":"crossref","DOI":"10.1103\/PhysRevB.98.121408","article-title":"Atomic-scale quantification of charge densities in two-dimensional materials","volume":"98","author":"M\u00fcller-Caspary","year":"2018","journal-title":"Phys. Rev. B"},{"key":"10.1016\/j.micron.2026.104083_b22","doi-asserted-by":"crossref","first-page":"62","DOI":"10.1016\/j.ultramic.2016.05.004","article-title":"Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy","volume":"178","author":"M\u00fcller-Caspary","year":"2017","journal-title":"Ultramicroscopy"},{"issue":"1\u20133","key":"10.1016\/j.micron.2026.104083_b23","doi-asserted-by":"crossref","first-page":"26","DOI":"10.1016\/0304-3991(94)90143-0","article-title":"Breakdown of the weak-phase object approximation in amorphous objects and measurement of high-resolution electron optical parameters","volume":"56","author":"Murray Gibson","year":"1994","journal-title":"Ultramicroscopy"},{"key":"10.1016\/j.micron.2026.104083_b24","doi-asserted-by":"crossref","DOI":"10.1016\/j.ultramic.2024.113936","article-title":"Quantitative atomic cross section analysis by 4D-STEM and EELS","volume":"259","author":"Seifer","year":"2024","journal-title":"Ultramicroscopy"},{"issue":"10","key":"10.1016\/j.micron.2026.104083_b25","doi-asserted-by":"crossref","first-page":"708","DOI":"10.2109\/jcersj2.19118","article-title":"Atomic-resolution differential phase contrast electron microscopy","volume":"127","author":"Shibata","year":"2019","journal-title":"J. Ceram. Soc. Japan"},{"issue":"8","key":"10.1016\/j.micron.2026.104083_b26","doi-asserted-by":"crossref","first-page":"611","DOI":"10.1038\/nphys2337","article-title":"Differential phase-contrast microscopy at atomic resolution","volume":"8","author":"Shibata","year":"2012","journal-title":"Nat. Phys."},{"issue":"4","key":"10.1016\/j.micron.2026.104083_b27","doi-asserted-by":"crossref","first-page":"6657","DOI":"10.1021\/acsnano.2c01170","article-title":"Mapping 1D confined electromagnetic edge states in 2D monolayer semiconducting MoS2 using 4D-STEM","volume":"16","author":"Wen","year":"2022","journal-title":"ACS Nano"},{"issue":"9","key":"10.1016\/j.micron.2026.104083_b28","doi-asserted-by":"crossref","first-page":"6482","DOI":"10.1021\/acs.nanolett.9b02717","article-title":"Simultaneous identification of low and high atomic number atoms in monolayer 2D materials using 4D scanning transmission electron microscopy","volume":"19","author":"Wen","year":"2019","journal-title":"Nano Lett."},{"key":"10.1016\/j.micron.2026.104083_b29","series-title":"Transmission Electron Microscopy: A Textbook for Materials Science","author":"Williams","year":"2008"}],"container-title":["Micron"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0968432826000971?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0968432826000971?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2026,9,1]],"date-time":"2026-09-01T12:11:57Z","timestamp":1788264717000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/S0968432826000971"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,11]]},"references-count":29,"alternative-id":["S0968432826000971"],"URL":"https:\/\/doi.org\/10.1016\/j.micron.2026.104083","relation":{},"ISSN":["0968-4328"],"issn-type":[{"value":"0968-4328","type":"print"}],"subject":[],"published":{"date-parts":[[2026,11]]},"assertion":[{"value":"Elsevier","name":"publisher","label":"This article is maintained by"},{"value":"Simulation study on the influence of single and multiple atoms on quantitative STEM-DPC imaging of atomic charge distributions","name":"articletitle","label":"Article Title"},{"value":"Micron","name":"journaltitle","label":"Journal Title"},{"value":"https:\/\/doi.org\/10.1016\/j.micron.2026.104083","name":"articlelink","label":"CrossRef DOI link to publisher maintained version"},{"value":"article","name":"content_type","label":"Content Type"},{"value":"\u00a9 2026 The Authors. Published by Elsevier Ltd.","name":"copyright","label":"Copyright"}],"article-number":"104083"}}