{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,17]],"date-time":"2025-10-17T19:09:02Z","timestamp":1760728142246},"reference-count":20,"publisher":"Elsevier BV","license":[{"start":{"date-parts":[[2015,4,1]],"date-time":"2015-04-01T00:00:00Z","timestamp":1427846400000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"}],"funder":[{"name":"Murray Edwards College, Cambridge"}],"content-domain":{"domain":["elsevier.com","sciencedirect.com"],"crossmark-restriction":true},"short-container-title":["Ultramicroscopy"],"published-print":{"date-parts":[[2015,4]]},"DOI":"10.1016\/j.ultramic.2014.12.003","type":"journal-article","created":{"date-parts":[[2014,12,23]],"date-time":"2014-12-23T05:01:44Z","timestamp":1419310904000},"page":"168-177","update-policy":"http:\/\/dx.doi.org\/10.1016\/elsevier_cm_policy","source":"Crossref","is-referenced-by-count":5,"special_numbering":"C","title":["Observation of lens aberrations for high resolution electron microscopy II: Simple expressions for optimal estimates"],"prefix":"10.1016","volume":"151","author":[{"given":"W. Owen","family":"Saxton","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"78","reference":[{"key":"10.1016\/j.ultramic.2014.12.003_bib1","first-page":"287","volume":"34","author":"Rose","year":"1971","journal-title":"Optik"},{"key":"10.1016\/j.ultramic.2014.12.003_bib2","first-page":"19","volume":"85","author":"Rose","year":"1990","journal-title":"Optik"},{"key":"10.1016\/j.ultramic.2014.12.003_bib3","doi-asserted-by":"crossref","first-page":"201","DOI":"10.1111\/j.1365-2818.1995.tb03633.x","volume":"179","author":"Saxton","year":"1995","journal-title":"J. Microsc."},{"key":"10.1016\/j.ultramic.2014.12.003_bib4","doi-asserted-by":"crossref","first-page":"45","DOI":"10.1016\/S0304-3991(99)00163-1","volume":"81","author":"Saxton","year":"2000","journal-title":"Ultramicroscopy"},{"key":"10.1016\/j.ultramic.2014.12.003_bib5","doi-asserted-by":"crossref","first-page":"49","DOI":"10.1016\/S0304-3991(78)80006-0","volume":"3","author":"Zemlin","year":"1978","journal-title":"Ultramicroscopy"},{"key":"10.1016\/j.ultramic.2014.12.003_bib6","first-page":"95","volume":"6","author":"De Jong","year":"1992","journal-title":"Scanning Microsc. Suppl."},{"key":"10.1016\/j.ultramic.2014.12.003_bib7","doi-asserted-by":"crossref","first-page":"89","DOI":"10.1016\/0304-3991(92)90052-L","volume":"40","author":"Koster","year":"1992","journal-title":"Ultramicroscopy"},{"key":"10.1016\/j.ultramic.2014.12.003_bib8","doi-asserted-by":"crossref","first-page":"49","DOI":"10.1016\/S0304-3991(99)00192-8","volume":"81","author":"Steinecker","year":"2000","journal-title":"Ultramicroscopy"},{"key":"10.1016\/j.ultramic.2014.12.003_bib9","volume":"Suppl. 6","author":"Krivanek","year":"1992","journal-title":"Scanning Microsc."},{"key":"10.1016\/j.ultramic.2014.12.003_bib10","doi-asserted-by":"crossref","first-page":"407","DOI":"10.1016\/0304-3991(94)90176-7","volume":"55","author":"Ishizuka","year":"1994","journal-title":"Ultramicroscopy"},{"key":"10.1016\/j.ultramic.2014.12.003_bib11","doi-asserted-by":"crossref","first-page":"163","DOI":"10.1016\/S0304-3991(96)00096-4","volume":"67","author":"Overwijk","year":"1997","journal-title":"Ultramicroscopy"},{"key":"10.1016\/j.ultramic.2014.12.003_bib12","doi-asserted-by":"crossref","first-page":"109","DOI":"10.1016\/S0304-3991(97)00102-2","volume":"72","author":"Uhlemann","year":"1998","journal-title":"Ultramicroscopy"},{"key":"10.1016\/j.ultramic.2014.12.003_bib13","doi-asserted-by":"crossref","first-page":"27","DOI":"10.1016\/j.ultramic.2010.09.007","volume":"111","author":"Barthel","year":"2010","journal-title":"Ultramicroscopy"},{"key":"10.1016\/j.ultramic.2014.12.003_bib14","unstructured":"D. Typke & K. Dierksen, Image Interpretation and Image Processing in Electron Microscopy: Autumn School 1992, Eds J. Heydenreich and W Neumann (1992) 96."},{"key":"10.1016\/j.ultramic.2014.12.003_bib15","first-page":"155","volume":"99","author":"Typke","year":"1995","journal-title":"Optik"},{"key":"10.1016\/j.ultramic.2014.12.003_bib16","doi-asserted-by":"crossref","first-page":"419","DOI":"10.1016\/0304-3991(94)90177-5","volume":"55","author":"Krivanek","year":"1994","journal-title":"Ultramicroscopy"},{"key":"10.1016\/j.ultramic.2014.12.003_bib17","doi-asserted-by":"crossref","first-page":"239","DOI":"10.1016\/0304-3991(95)00003-J","volume":"58","author":"Saxton","year":"1995","journal-title":"Ultramicroscopy"},{"key":"10.1016\/j.ultramic.2014.12.003_bib18","doi-asserted-by":"crossref","first-page":"89","DOI":"10.1016\/S0304-3991(02)00071-2","volume":"1:92","author":"Meyer","year":"2002","journal-title":"Ultramicroscopy"},{"key":"10.1016\/j.ultramic.2014.12.003_bib19","doi-asserted-by":"crossref","first-page":"461","DOI":"10.1017\/S1431927606060612","volume":"12","author":"Kirkland","year":"2006","journal-title":"Microsc. Microanal."},{"key":"10.1016\/j.ultramic.2014.12.003_bib20","doi-asserted-by":"crossref","first-page":"165","DOI":"10.1016\/S0304-3991(00)00054-1","volume":"85","author":"Lehmann","year":"2000","journal-title":"Ultramicroscopy"}],"container-title":["Ultramicroscopy"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0304399114002538?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0304399114002538?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2018,9,26]],"date-time":"2018-09-26T19:57:44Z","timestamp":1537991864000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/S0304399114002538"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,4]]},"references-count":20,"alternative-id":["S0304399114002538"],"URL":"https:\/\/doi.org\/10.1016\/j.ultramic.2014.12.003","relation":{},"ISSN":["0304-3991"],"issn-type":[{"value":"0304-3991","type":"print"}],"subject":[],"published":{"date-parts":[[2015,4]]},"assertion":[{"value":"Elsevier","name":"publisher","label":"This article is maintained by"},{"value":"Observation of lens aberrations for high resolution electron microscopy II: Simple expressions for optimal estimates","name":"articletitle","label":"Article Title"},{"value":"Ultramicroscopy","name":"journaltitle","label":"Journal Title"},{"value":"https:\/\/doi.org\/10.1016\/j.ultramic.2014.12.003","name":"articlelink","label":"CrossRef DOI link to publisher maintained version"},{"value":"article","name":"content_type","label":"Content Type"},{"value":"Copyright \u00a9 2015 Published by Elsevier B.V.","name":"copyright","label":"Copyright"}]}}