{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,10,28]],"date-time":"2026-10-28T23:58:22Z","timestamp":1793231902702,"version":"4.5.0"},"reference-count":49,"publisher":"Elsevier BV","license":[{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"},{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/legal\/tdmrep-license"}],"funder":[{"DOI":"10.13039\/100011033","name":"Thermo Fisher Scientific","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100011033","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["elsevier.com","sciencedirect.com"],"crossmark-restriction":true},"short-container-title":["Ultramicroscopy"],"published-print":{"date-parts":[[2019,1]]},"DOI":"10.1016\/j.ultramic.2018.10.011","type":"journal-article","created":{"date-parts":[[2018,10,26]],"date-time":"2018-10-26T03:07:40Z","timestamp":1540523260000},"page":"142-153","update-policy":"https:\/\/doi.org\/10.1016\/elsevier_cm_policy","source":"Crossref","is-referenced-by-count":27,"special_numbering":"C","title":["Temperature calibration of TEM specimen heating holders by isothermal sublimation of silver nanocubes"],"prefix":"10.1016","volume":"196","author":[{"given":"Sriram","family":"Vijayan","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6617-1409","authenticated-orcid":false,"given":"Mark","family":"Aindow","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"78","reference":[{"key":"10.1016\/j.ultramic.2018.10.011_bib0001","doi-asserted-by":"crossref","first-page":"833","DOI":"10.1088\/0034-4885\/42\/5\/002","article-title":"In situ experiments in the transmission electron microscope","volume":"42","author":"Butler","year":"1979","journal-title":"Rep. Prog. Phys."},{"key":"10.1016\/j.ultramic.2018.10.011_bib0002","series-title":"Transmission Electron Microscopy: Diffraction Imaging and Spectrometry","first-page":"17","article-title":"In situ and operando","author":"Jungjohann","year":"2016"},{"key":"10.1016\/j.ultramic.2018.10.011_bib0003","doi-asserted-by":"crossref","first-page":"867","DOI":"10.1021\/nl034222h","article-title":"Watching GaN nanowires grow","volume":"3","author":"Stach","year":"2003","journal-title":"Nano Lett."},{"key":"10.1016\/j.ultramic.2018.10.011_bib0004","doi-asserted-by":"crossref","first-page":"1646","DOI":"10.1126\/science.1151771","article-title":"Observation of giant diffusivity along dislocation cores","volume":"319","author":"Legros","year":"2008","journal-title":"Science"},{"key":"10.1016\/j.ultramic.2018.10.011_bib0005","doi-asserted-by":"crossref","first-page":"384","DOI":"10.1021\/nl404565j","article-title":"Real-time imaging of nanostructural evolution in aluminum alloys","volume":"14","author":"Malladi","year":"2014","journal-title":"Nano Lett"},{"key":"10.1016\/j.ultramic.2018.10.011_bib0006","doi-asserted-by":"crossref","first-page":"21","DOI":"10.1016\/j.scriptamat.2014.10.010","article-title":"Nucleation of FCC Ta when heating thin films","volume":"96","author":"Janish","year":"2015","journal-title":"Scr. Mater."},{"key":"10.1016\/j.ultramic.2018.10.011_bib0007","doi-asserted-by":"crossref","first-page":"86","DOI":"10.1016\/j.ultramic.2016.08.007","article-title":"Current status and future directions for in situ transmission electron microscopy","volume":"170","author":"Taheri","year":"2016","journal-title":"Ultramicroscopy"},{"key":"10.1016\/j.ultramic.2018.10.011_bib0008","doi-asserted-by":"crossref","first-page":"14","DOI":"10.1016\/j.ultramic.2018.05.005","article-title":"Advanced microheater for in situ transmission electron microscopy; enabling unexplored analytical studies and extreme spatial stability","volume":"192","author":"van Omme","year":"2018","journal-title":"Ultramicroscopy"},{"key":"10.1016\/j.ultramic.2018.10.011_bib0009","doi-asserted-by":"crossref","first-page":"208","DOI":"10.1002\/jemt.20673","article-title":"A new MEMS-based, system for ultra-high-resolution imaging at elevated temperatures","volume":"72","author":"Allard","year":"2009","journal-title":"Microsc. Res. Tech."},{"key":"10.1016\/j.ultramic.2018.10.011_bib0010","series-title":"Proc. IEEE 11th Annu. Int. Conf. Nano\/Micro Eng. Mol. Syst. (NEMS)","first-page":"85","article-title":"The \u2018climate\u2019 system: nano-reactor for in situ analysis of solid-gas interactions inside the TEM","author":"Perez-Garza","year":"2016"},{"key":"10.1016\/j.ultramic.2018.10.011_bib0011","doi-asserted-by":"crossref","first-page":"239","DOI":"10.1002\/jemt.22623","article-title":"A MEMS-based heating holder for the direct imaging of simultaneous in-situ heating and biasing experiments in scanning\/transmission electron microscopes","volume":"79","author":"Mele","year":"2016","journal-title":"Microsc. Res. Tech."},{"key":"10.1016\/j.ultramic.2018.10.011_bib0012","doi-asserted-by":"crossref","first-page":"1165","DOI":"10.1109\/JMEMS.2017.2757402","article-title":"A review on development and optimization of microheaters for high temperature in situ studies","volume":"26","author":"Spruit","year":"2017","journal-title":"J. Microelectromech. Syst."},{"key":"10.1016\/j.ultramic.2018.10.011_bib0013","doi-asserted-by":"crossref","first-page":"21","DOI":"10.1088\/0022-3735\/6\/1\/009","article-title":"A method for calibrating a specimen heating stage in the electron microscope","volume":"6","author":"Martin","year":"1973","journal-title":"J. Phys. E: Sci. Instrum."},{"key":"10.1016\/j.ultramic.2018.10.011_bib0014","doi-asserted-by":"crossref","first-page":"531","DOI":"10.1038\/322531a0","article-title":"High resolution transmission electron microscopy of silicon regrowth at controlled elevated temperatures","volume":"322","author":"Sinclair","year":"1986","journal-title":"Nature"},{"key":"10.1016\/j.ultramic.2018.10.011_bib0015","doi-asserted-by":"crossref","first-page":"294","DOI":"10.1017\/S1431927698980308","article-title":"In situ studies of the interaction of dislocations with point defects during annealing of ion implanted Si\/SiGe\/Si (001) heterostructures","volume":"4","author":"Stach","year":"1998","journal-title":"Microsc. Microanal."},{"key":"10.1016\/j.ultramic.2018.10.011_bib0016","doi-asserted-by":"crossref","first-page":"2913","DOI":"10.1063\/1.1616201","article-title":"Temperature measurement using a gallium-filled carbon nanotube nanothermometer","volume":"83","author":"Gao","year":"2003","journal-title":"Appl. Phys. Lett."},{"key":"10.1016\/j.ultramic.2018.10.011_bib0017","doi-asserted-by":"crossref","DOI":"10.1063\/1.2840574","article-title":"Au(Si)-filled \u03b2-Ga2O3 nanotubes as wide range high temperature nanothermometers","volume":"92","author":"Gong","year":"2008","journal-title":"Appl. Phys. Lett."},{"key":"10.1016\/j.ultramic.2018.10.011_bib0018","article-title":"Probing nanoscale solids at thermal extremes","volume":"99","author":"Begtrup","year":"2007","journal-title":"Phys. Rev. Lett."},{"key":"10.1016\/j.ultramic.2018.10.011_bib0019","doi-asserted-by":"crossref","first-page":"582","DOI":"10.1021\/nl0729375","article-title":"Electron thermal microscopy","volume":"8","author":"Brintlinger","year":"2008","journal-title":"Nano Lett."},{"key":"10.1016\/j.ultramic.2018.10.011_bib0020","doi-asserted-by":"crossref","first-page":"95","DOI":"10.9729\/AM.2015.45.2.95","article-title":"Temperature calibration of a specimen holder for transmission electron microscopy","volume":"45","author":"Kim","year":"2015","journal-title":"Appl. Microsc."},{"key":"10.1016\/j.ultramic.2018.10.011_bib0021","doi-asserted-by":"crossref","first-page":"1002","DOI":"10.1088\/0022-3735\/11\/10\/013","article-title":"Temperature measurement in controlled atmosphere electron microscopy","volume":"11","author":"Keep","year":"1978","journal-title":"J. Phys. E: Sci. Instrum."},{"key":"10.1016\/j.ultramic.2018.10.011_bib0022","doi-asserted-by":"crossref","first-page":"72","DOI":"10.1016\/j.ultramic.2013.04.004","article-title":"Method for local temperature measurement in a nanoreactor for in situ high-resolution electron microscopy","volume":"133","author":"Vendelbo","year":"2013","journal-title":"Ultramicroscopy"},{"key":"10.1016\/j.ultramic.2018.10.011_bib0023","doi-asserted-by":"crossref","first-page":"629","DOI":"10.1126\/science.aaa2433","article-title":"Nanoscale temperature mapping in operating microelectronic devices","volume":"347","author":"Mecklenburg","year":"2015","journal-title":"Science"},{"issue":"1\u20134","key":"10.1016\/j.ultramic.2018.10.011_bib0024","article-title":"Temperature measurement by a nanoscale electron probe using energy gain and loss spectroscopy","volume":"120","author":"Idrobo","year":"2018","journal-title":"Phys. Rev. Lett."},{"key":"10.1016\/j.ultramic.2018.10.011_bib0025","doi-asserted-by":"crossref","first-page":"10","DOI":"10.1016\/j.ultramic.2014.11.023","article-title":"Vibrational and optical spectroscopies integrated with environmental transmission electron microscopy","volume":"150","author":"Picher","year":"2015","journal-title":"Ultramicroscopy"},{"key":"10.1016\/j.ultramic.2018.10.011_bib0026","first-page":"69","article-title":"Temperature measurement on micro area of specimen in TEM using thermal diffuse scattering effect","volume":"39","author":"Takaoka","year":"1990","journal-title":"J. Electron Microsc."},{"key":"10.1016\/j.ultramic.2018.10.011_bib0027","doi-asserted-by":"crossref","DOI":"10.1088\/0957-4484\/23\/20\/205705","article-title":"Quantification of electron\u2013phonon scattering for determination of temperature variations at high spatial resolution in the transmission electron microscope,","volume":"23","author":"He","year":"2012","journal-title":"Nanotechnology"},{"key":"10.1016\/j.ultramic.2018.10.011_bib0028","doi-asserted-by":"crossref","first-page":"1622","DOI":"10.1017\/S1431927615015196","article-title":"Temperature calibration for in situ environmental transmission electron microscopy experiments","volume":"21","author":"Winterstein","year":"2015","journal-title":"Microsc. Microanal."},{"key":"10.1016\/j.ultramic.2018.10.011_bib0029","doi-asserted-by":"crossref","first-page":"10","DOI":"10.1016\/j.ultramic.2015.10.022","article-title":"Direct in situ thermometry: variations in reciprocal lattice vector and challenges with the Debye-Waller effect","volume":"161","author":"Cremons","year":"2016","journal-title":"Ultramicroscopy"},{"key":"10.1016\/j.ultramic.2018.10.011_bib0030","doi-asserted-by":"crossref","first-page":"208","DOI":"10.9729\/AM.2017.47.3.208","article-title":"Structural and morphological changes of Co nanoparticles Au-10at.%Pd thin film studied by in situ heaing in a transmission electron microscope","volume":"47","author":"Ji","year":"2017","journal-title":"Appl. Microsc."},{"key":"10.1016\/j.ultramic.2018.10.011_bib0031","doi-asserted-by":"crossref","first-page":"161","DOI":"10.1016\/j.ultramic.2016.11.028","article-title":"Local temperature measurement in TEM by parallel beam electron diffraction","volume":"176","author":"Niekiel","year":"2017","journal-title":"Ultramicroscopy"},{"key":"10.1016\/j.ultramic.2018.10.011_bib0032","doi-asserted-by":"crossref","DOI":"10.1007\/BF00638277","article-title":"Messung der objekttemperatur im electronemikroskop mittels electronenbeugung","volume":"47","author":"Reimer","year":"1960","journal-title":"Naturwissenschaften"},{"key":"10.1016\/j.ultramic.2018.10.011_bib0033","doi-asserted-by":"crossref","first-page":"7844","DOI":"10.1021\/nn402771j","article-title":"In situ transmission electron microscopy observations of sublimation in silver nanoparticles","volume":"9","author":"Asoro","year":"2013","journal-title":"ACS Nano"},{"key":"10.1016\/j.ultramic.2018.10.011_bib0034","doi-asserted-by":"crossref","first-page":"1245","DOI":"10.1038\/2171245a0","volume":"217","author":"Blackman","year":"1968","journal-title":"Nature"},{"key":"10.1016\/j.ultramic.2018.10.011_bib0035","doi-asserted-by":"crossref","first-page":"507","DOI":"10.1098\/rspa.1970.0157","article-title":"An electron microscope study of evaporating small particles: the Kelvin equation for liquid lead and the mean surface energy of solid silver","volume":"318","author":"Sambles","year":"1970","journal-title":"Proc. R. Soc. Lond. A."},{"key":"10.1016\/j.ultramic.2018.10.011_bib0036","doi-asserted-by":"crossref","first-page":"309","DOI":"10.1179\/cmq.1984.23.3.309","article-title":"Vapour pressure equations for the metallic elements: 298\u20132500K","volume":"23","author":"Alcock","year":"1984","journal-title":"Can. Metall. Quart."},{"key":"10.1016\/j.ultramic.2018.10.011_bib0037","doi-asserted-by":"crossref","first-page":"708","DOI":"10.1017\/S1431927617000605","article-title":"Focused ion beam preparation of specimens for micro-electro-mechanical system-based transmission electron microscopy heating experiments","volume":"23","author":"Vijayan","year":"2017","journal-title":"Microsc. Microanal."},{"key":"10.1016\/j.ultramic.2018.10.011_bib0038","doi-asserted-by":"crossref","first-page":"67","DOI":"10.1038\/nmeth.2089","article-title":"NIH Image to ImageJ: 25 years of image analysis","volume":"9","author":"Schneider","year":"2012","journal-title":"Nat. Methods"},{"issue":"S3","key":"10.1016\/j.ultramic.2018.10.011_bib0039","doi-asserted-by":"crossref","first-page":"822","DOI":"10.1017\/S1431927616004967","article-title":"In situ TEM heating experiments on PVP-capped silver nano-cubes","volume":"22","author":"Vijayan","year":"2016","journal-title":"Microsc. Microanal."},{"key":"10.1016\/j.ultramic.2018.10.011_bib0040","doi-asserted-by":"crossref","first-page":"239","DOI":"10.1080\/00337577008235027","article-title":"On the temperature rise in electron irradiated foils","volume":"5","author":"Fisher","year":"1970","journal-title":"Radiat. Eff. Defects Solids"},{"key":"10.1016\/j.ultramic.2018.10.011_bib0041","doi-asserted-by":"crossref","first-page":"449","DOI":"10.1002\/pssa.2210150209","article-title":"Specimen temperature increases during transmission electron microscopy","volume":"15","author":"Thornburg","year":"1973","journal-title":"Phys. Status Solidi A"},{"key":"10.1016\/j.ultramic.2018.10.011_bib0042","doi-asserted-by":"crossref","first-page":"399","DOI":"10.1016\/j.micron.2004.02.003","article-title":"Radiation damage in the TEM and SEM","volume":"35","author":"Egerton","year":"2004","journal-title":"Micron"},{"key":"10.1016\/j.ultramic.2018.10.011_bib0043","doi-asserted-by":"crossref","first-page":"2812","DOI":"10.1002\/smll.200901189","article-title":"Sublimation-induced shape evolution of silver cubes","volume":"5","author":"Ding","year":"2009","journal-title":"Small"},{"key":"10.1016\/j.ultramic.2018.10.011_bib0044","doi-asserted-by":"crossref","DOI":"10.1002\/smll.201700743","article-title":"Surface energy and surface stability of Ag nanocrystals at elevated temperatures and their dominance in sublimation-induced shape evolution","volume":"13","author":"He","year":"2017","journal-title":"Small"},{"key":"10.1016\/j.ultramic.2018.10.011_bib0045","doi-asserted-by":"crossref","first-page":"23","DOI":"10.1002\/app.21886","article-title":"Thermal decomposition behaviors of PVP coated platinum nanoparticles","volume":"99","author":"Du","year":"2006","journal-title":"J. Appl. Polym. Sci."},{"key":"10.1016\/j.ultramic.2018.10.011_bib0046","doi-asserted-by":"crossref","first-page":"75","DOI":"10.1115\/1.2130403","article-title":"Thermal conductivity measurements of ultra-thin single crystal silicon layers","volume":"128","author":"Liu","year":"2006","journal-title":"J. Heat Transfer"},{"key":"10.1016\/j.ultramic.2018.10.011_bib0047","doi-asserted-by":"crossref","first-page":"045001","DOI":"10.1088\/0960-1317\/22\/4\/045001","article-title":"Influence of strain on thermal conductivity of silicon nitride thin films","volume":"22","author":"Alam","year":"2012","journal-title":"J. Micromech. Microeng."},{"key":"10.1016\/j.ultramic.2018.10.011_bib0048","doi-asserted-by":"crossref","first-page":"339","DOI":"10.1098\/rspa.1971.0143","article-title":"An electron microscope study of evaporating gold particles: the Kelvin equation for liquid gold and the lowering of the melting point of solid gold particles","volume":"324","author":"Sambles","year":"1971","journal-title":"Proc. R. Soc. Lond. A"},{"key":"10.1016\/j.ultramic.2018.10.011_bib0049","doi-asserted-by":"crossref","first-page":"1156","DOI":"10.1021\/acs.nanolett.5b04439","article-title":"In situ observations on dislocation controlled sublimation of Mg nanoparticles","volume":"16","author":"Q.Yu","year":"2016","journal-title":"Nano Lett"}],"container-title":["Ultramicroscopy"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0304399118302298?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0304399118302298?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2025,10,5]],"date-time":"2025-10-05T01:19:49Z","timestamp":1759627189000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/S0304399118302298"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,1]]},"references-count":49,"alternative-id":["S0304399118302298"],"URL":"https:\/\/doi.org\/10.1016\/j.ultramic.2018.10.011","relation":{},"ISSN":["0304-3991"],"issn-type":[{"value":"0304-3991","type":"print"}],"subject":[],"published":{"date-parts":[[2019,1]]},"assertion":[{"value":"Elsevier","name":"publisher","label":"This article is maintained by"},{"value":"Temperature calibration of TEM specimen heating holders by isothermal sublimation of silver nanocubes","name":"articletitle","label":"Article Title"},{"value":"Ultramicroscopy","name":"journaltitle","label":"Journal Title"},{"value":"https:\/\/doi.org\/10.1016\/j.ultramic.2018.10.011","name":"articlelink","label":"CrossRef DOI link to publisher maintained version"},{"value":"article","name":"content_type","label":"Content Type"},{"value":"\u00a9 2018 Elsevier B.V. All rights reserved.","name":"copyright","label":"Copyright"}]}}