{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,8,5]],"date-time":"2026-08-05T04:50:40Z","timestamp":1785905440547,"version":"3.56.0"},"reference-count":33,"publisher":"Elsevier BV","license":[{"start":{"date-parts":[[2026,8,1]],"date-time":"2026-08-01T00:00:00Z","timestamp":1785542400000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"},{"start":{"date-parts":[[2026,8,1]],"date-time":"2026-08-01T00:00:00Z","timestamp":1785542400000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/legal\/tdmrep-license"},{"start":{"date-parts":[[2026,8,1]],"date-time":"2026-08-01T00:00:00Z","timestamp":1785542400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-017"},{"start":{"date-parts":[[2026,8,1]],"date-time":"2026-08-01T00:00:00Z","timestamp":1785542400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"},{"start":{"date-parts":[[2026,8,1]],"date-time":"2026-08-01T00:00:00Z","timestamp":1785542400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-012"},{"start":{"date-parts":[[2026,8,1]],"date-time":"2026-08-01T00:00:00Z","timestamp":1785542400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,8,1]],"date-time":"2026-08-01T00:00:00Z","timestamp":1785542400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-004"}],"content-domain":{"domain":["elsevier.com","sciencedirect.com"],"crossmark-restriction":true},"short-container-title":["Ultramicroscopy"],"published-print":{"date-parts":[[2026,8]]},"DOI":"10.1016\/j.ultramic.2026.114408","type":"journal-article","created":{"date-parts":[[2026,6,16]],"date-time":"2026-06-16T23:16:24Z","timestamp":1781651784000},"page":"114408","update-policy":"https:\/\/doi.org\/10.1016\/elsevier_cm_policy","source":"Crossref","is-referenced-by-count":0,"special_numbering":"C","title":["Brightness optimization in a 200 keV DTEM source by geometry-driven aberration suppression"],"prefix":"10.1016","volume":"285","author":[{"ORCID":"https:\/\/orcid.org\/0009-0008-2654-6526","authenticated-orcid":false,"given":"Paul","family":"Denham","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Pietro","family":"Musumeci","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Daniel J.","family":"Masiel","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Bryan W.","family":"Reed","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"78","reference":[{"issue":"1","key":"10.1016\/j.ultramic.2026.114408_b1","doi-asserted-by":"crossref","first-page":"65","DOI":"10.1146\/annurev.physchem.57.032905.104748","article-title":"4D ultrafast electron diffraction, crystallography, and microscopy","volume":"57","author":"Zewail","year":"2006","journal-title":"Annu. Rev. Phys. Chem."},{"issue":"1840","key":"10.1016\/j.ultramic.2026.114408_b2","doi-asserted-by":"crossref","first-page":"741","DOI":"10.1098\/rsta.2005.1735","article-title":"Femtosecond electron diffraction: making the molecular movie","volume":"364","author":"Dwyer","year":"2006","journal-title":"Philos. Trans. R. Soc. A: Math. Phys. Eng. Sci."},{"issue":"11","key":"10.1016\/j.ultramic.2026.114408_b3","doi-asserted-by":"crossref","DOI":"10.1063\/1.1927699","article-title":"Ultrafast electron microscopy in materials science, biology, and chemistry","volume":"97","author":"King","year":"2005","journal-title":"J. Appl. Phys."},{"issue":"3","key":"10.1016\/j.ultramic.2026.114408_b4","doi-asserted-by":"crossref","first-page":"1643","DOI":"10.1063\/1.1487437","article-title":"Ultrafast electron optics: Propagation dynamics of femtosecond electron packets","volume":"92","author":"Siwick","year":"2002","journal-title":"J. Appl. Phys."},{"key":"10.1016\/j.ultramic.2026.114408_b5","doi-asserted-by":"crossref","first-page":"902","DOI":"10.1038\/nature08662","article-title":"Photon-induced near-field electron microscopy","volume":"462","author":"Barwick","year":"2009","journal-title":"Nature"},{"key":"10.1016\/j.ultramic.2026.114408_b6","doi-asserted-by":"crossref","DOI":"10.1103\/PhysRevLett.102.104801","article-title":"Maximum achievable beam brightness from photoinjectors","volume":"102","author":"Bazarov","year":"2009","journal-title":"Phys. Rev. Lett."},{"key":"10.1016\/j.ultramic.2026.114408_b7","doi-asserted-by":"crossref","DOI":"10.1103\/PhysRevSTAB.17.024201","article-title":"Maximum current density and beam brightness achievable by laser-driven electron sources","volume":"17","author":"Filippetto","year":"2014","journal-title":"Phys. Rev. ST Accel. Beams"},{"key":"10.1016\/j.ultramic.2026.114408_b8","series-title":"Experimental verification of space-charge saturation scaling laws in high-gradient photocathode RF guns","author":"Denham","year":"2025"},{"key":"10.1016\/j.ultramic.2026.114408_b9","series-title":"Transmission Electron Microscopy: Physics of Image Formation","author":"Reimer","year":"2008"},{"key":"10.1016\/j.ultramic.2026.114408_b10","series-title":"Transmission Electron Microscopy: A Textbook for Materials Science","author":"Williams","year":"2009"},{"key":"10.1016\/j.ultramic.2026.114408_b11","doi-asserted-by":"crossref","DOI":"10.1063\/1.2236263","article-title":"Single-shot dynamic transmission electron microscopy for materials science","volume":"89","author":"LaGrange","year":"2006","journal-title":"Appl. Phys. Lett."},{"issue":"4\u20135","key":"10.1016\/j.ultramic.2026.114408_b12","doi-asserted-by":"crossref","first-page":"356","DOI":"10.1016\/j.ultramic.2006.09.005","article-title":"Practical considerations for high spatial and temporal resolution dynamic transmission electron microscopy","volume":"107","author":"Armstrong","year":"2007","journal-title":"Ultramicroscopy"},{"issue":"11","key":"10.1016\/j.ultramic.2026.114408_b13","doi-asserted-by":"crossref","first-page":"1441","DOI":"10.1016\/j.ultramic.2008.03.013","article-title":"Nanosecond time-resolved investigations using the in situ dynamic transmission electron microscope (DTEM)","volume":"108","author":"LaGrange","year":"2008","journal-title":"Ultramicroscopy"},{"issue":"5895","key":"10.1016\/j.ultramic.2026.114408_b14","doi-asserted-by":"crossref","first-page":"1472","DOI":"10.1126\/science.1161517","article-title":"Imaging of transient structures using nanosecond in situ TEM","volume":"321","author":"Kim","year":"2008","journal-title":"Science"},{"issue":"5","key":"10.1016\/j.ultramic.2026.114408_b15","doi-asserted-by":"crossref","DOI":"10.1063\/1.3427234","article-title":"Solving the accelerator\u2013condenser coupling problem in a nanosecond dynamic transmission electron microscope","volume":"81","author":"Reed","year":"2010","journal-title":"Rev. Sci. Instrum."},{"key":"10.1016\/j.ultramic.2026.114408_b16","article-title":"Quantum efficiency and thermal emittance of metal photocathodes","volume":"12","author":"Dowell","year":"2010","journal-title":"Phys. Rev. Spec. Top. - Accel. Beams"},{"issue":"6678","key":"10.1016\/j.ultramic.2026.114408_b17","doi-asserted-by":"crossref","first-page":"768","DOI":"10.1038\/33823","article-title":"Electron microscopy image enhanced","volume":"392","author":"Haider","year":"1998","journal-title":"Nature"},{"issue":"1\u20134","key":"10.1016\/j.ultramic.2026.114408_b18","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1016\/S0304-3991(99)00013-3","article-title":"Towards sub-aa electron beams","volume":"78","author":"Krivanek","year":"1999","journal-title":"Ultramicroscopy"},{"key":"10.1016\/j.ultramic.2026.114408_b19","series-title":"Proceedings of the 6th International Congress for Electron Microscopy, Kyoto","article-title":"Unpublished","author":"Butler","year":"1966"},{"issue":"3","key":"10.1016\/j.ultramic.2026.114408_b20","doi-asserted-by":"crossref","first-page":"1436","DOI":"10.1063\/1.1663425","article-title":"Analysis of accelerating lens system in field-emission scanning electron microscope","volume":"45","author":"Kuroda","year":"1974","journal-title":"J. Appl. Phys."},{"issue":"1","key":"10.1016\/j.ultramic.2026.114408_b21","doi-asserted-by":"crossref","first-page":"65","DOI":"10.1016\/0304-3991(81)90025-5","article-title":"Triode and tetrode guns for field emission electron microscopes","volume":"7","author":"Denizart","year":"1981","journal-title":"Ultramicroscopy"},{"issue":"4","key":"10.1016\/j.ultramic.2026.114408_b22","doi-asserted-by":"crossref","first-page":"576","DOI":"10.1063\/1.1683435","article-title":"Electron gun using a field emission source","volume":"39","author":"Crewe","year":"1968","journal-title":"Rev. Sci. Instrum."},{"key":"10.1016\/j.ultramic.2026.114408_b23","doi-asserted-by":"crossref","first-page":"63","DOI":"10.1016\/j.ultramic.2016.12.005","article-title":"Ultrafast transmission electron microscopy using a laser-driven field emitter: Femtosecond resolution with a high coherence electron beam","volume":"176","author":"Feist","year":"2017","journal-title":"Ultramicroscopy","ISSN":"https:\/\/id.crossref.org\/issn\/0304-3991","issn-type":"print"},{"issue":"1\u20134","key":"10.1016\/j.ultramic.2026.114408_b24","doi-asserted-by":"crossref","first-page":"98","DOI":"10.1016\/0304-3991(89)90279-9","article-title":"Magnetic field emission gun with zirconiated emitter: Performances at low voltage","volume":"28","author":"Troyon","year":"1989","journal-title":"Ultramicroscopy"},{"key":"10.1016\/j.ultramic.2026.114408_b25","doi-asserted-by":"crossref","first-page":"209","DOI":"10.1016\/j.nima.2018.03.019","article-title":"Advances in bright electron sources","volume":"907","author":"Musumeci","year":"2022","journal-title":"Nucl. Instruments Methods Phys. Res. Sect. A: Accel. Spectrometers, Detect. Assoc. Equip."},{"issue":"2","key":"10.1016\/j.ultramic.2026.114408_b26","doi-asserted-by":"crossref","DOI":"10.1103\/PhysRevApplied.2.024003","article-title":"Single-shot MeV transmission electron microscopy with picosecond temporal resolution","volume":"2","author":"Li","year":"2014","journal-title":"Phys. Rev. Appl."},{"key":"10.1016\/j.ultramic.2026.114408_b27","article-title":"Quantum efficiency and thermal emittance of metal photocathodes","volume":"12","author":"Dowell","year":"2009","journal-title":"Phys. Rev. ST Accel. Beams"},{"issue":"20","key":"10.1016\/j.ultramic.2026.114408_b28","doi-asserted-by":"crossref","DOI":"10.1063\/1.5063888","article-title":"Child-langmuir law for photoinjectors","volume":"113","author":"Shamuilov","year":"2018","journal-title":"Appl. Phys. Lett.","ISSN":"https:\/\/id.crossref.org\/issn\/0003-6951","issn-type":"print"},{"key":"10.1016\/j.ultramic.2026.114408_b29","doi-asserted-by":"crossref","DOI":"10.1103\/PhysRevApplied.15.024050","article-title":"Space-charge aberrations in single-shot time-resolved transmission electron microscopy","volume":"15","author":"Denham","year":"2021","journal-title":"Phys. Rev. Appl."},{"key":"10.1016\/j.ultramic.2026.114408_b30","series-title":"Ion optics with electrostatic lenses","author":"Hinterberger","year":"2006"},{"key":"10.1016\/j.ultramic.2026.114408_b31","article-title":"The physics of charged-particle beams","volume":"vol. 75","author":"Lawson","year":"1988"},{"key":"10.1016\/j.ultramic.2026.114408_b32","doi-asserted-by":"crossref","DOI":"10.1103\/PhysRevSTAB.15.024002","article-title":"New method for generating linear transfer matrices through combined rf and solenoid fields","volume":"15","author":"Gulliford","year":"2012","journal-title":"Phys. Rev. ST Accel. Beams"},{"key":"10.1016\/j.ultramic.2026.114408_b33","series-title":"Particle Accelerator Physics","author":"Wiedemann","year":"2015"}],"container-title":["Ultramicroscopy"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0304399126001002?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0304399126001002?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2026,8,5]],"date-time":"2026-08-05T04:30:39Z","timestamp":1785904239000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/S0304399126001002"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,8]]},"references-count":33,"alternative-id":["S0304399126001002"],"URL":"https:\/\/doi.org\/10.1016\/j.ultramic.2026.114408","relation":{},"ISSN":["0304-3991"],"issn-type":[{"value":"0304-3991","type":"print"}],"subject":[],"published":{"date-parts":[[2026,8]]},"assertion":[{"value":"Elsevier","name":"publisher","label":"This article is maintained by"},{"value":"Brightness optimization in a 200 keV DTEM source by geometry-driven aberration suppression","name":"articletitle","label":"Article Title"},{"value":"Ultramicroscopy","name":"journaltitle","label":"Journal Title"},{"value":"https:\/\/doi.org\/10.1016\/j.ultramic.2026.114408","name":"articlelink","label":"CrossRef DOI link to publisher maintained version"},{"value":"article","name":"content_type","label":"Content Type"},{"value":"\u00a9 2026 Published by Elsevier B.V.","name":"copyright","label":"Copyright"}],"article-number":"114408"}}