{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,3,15]],"date-time":"2024-03-15T22:32:23Z","timestamp":1710541943977},"reference-count":16,"publisher":"Elsevier BV","issue":"12","license":[{"start":{"date-parts":[[1994,12,1]],"date-time":"1994-12-01T00:00:00Z","timestamp":786240000000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Vacuum"],"published-print":{"date-parts":[[1994,12]]},"DOI":"10.1016\/0042-207x(94)90080-9","type":"journal-article","created":{"date-parts":[[2002,10,18]],"date-time":"2002-10-18T21:58:28Z","timestamp":1034978308000},"page":"1191-1195","source":"Crossref","is-referenced-by-count":17,"title":["The influence of oxygen partial pressure and total pressure (O2 + Ar) on the properties of tin oxide films prepared by dc sputtering"],"prefix":"10.1016","volume":"45","author":[{"given":"Li-jian","family":"Meng","sequence":"first","affiliation":[]},{"given":"MP","family":"dos Santos","sequence":"additional","affiliation":[]}],"member":"78","reference":[{"key":"10.1016\/0042-207X(94)90080-9_BIB1","doi-asserted-by":"crossref","first-page":"287","DOI":"10.1016\/0040-6090(89)90918-8","volume":"190","author":"Sanon","year":"1990","journal-title":"Thin Solid Films"},{"key":"10.1016\/0042-207X(94)90080-9_BIB2","doi-asserted-by":"crossref","first-page":"151","DOI":"10.1016\/0165-1633(81)90038-1","volume":"4","author":"Jain","year":"1981","journal-title":"Sol Energy Mater"},{"issue":"4","key":"10.1016\/0042-207X(94)90080-9_BIB3","doi-asserted-by":"crossref","first-page":"100","DOI":"10.1038\/scientificamerican0470-100","volume":"222","author":"Heilmier","year":"1970","journal-title":"Sci Am"},{"key":"10.1016\/0042-207X(94)90080-9_BIB4","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1016\/0040-6090(83)90256-0","volume":"102","author":"Chopra","year":"1983","journal-title":"Thin Solid Films"},{"key":"10.1016\/0042-207X(94)90080-9_BIB5","doi-asserted-by":"crossref","first-page":"217","DOI":"10.1016\/0040-6090(90)90450-R","volume":"189","author":"Vasu","year":"1990","journal-title":"Thin Solid Films"},{"key":"10.1016\/0042-207X(94)90080-9_BIB6","doi-asserted-by":"crossref","first-page":"15","DOI":"10.1016\/0040-6090(89)90239-3","volume":"182","author":"Czapla","year":"1989","journal-title":"Thin Solid Films"},{"key":"10.1016\/0042-207X(94)90080-9_BIB7","doi-asserted-by":"crossref","first-page":"321","DOI":"10.1016\/0040-6090(87)90028-9","volume":"147","author":"Oas","year":"1987","journal-title":"Thin Solid Films"},{"key":"10.1016\/0042-207X(94)90080-9_BIB8","doi-asserted-by":"crossref","first-page":"219","DOI":"10.1016\/0040-6090(89)90095-3","volume":"176","author":"Ramos","year":"1989","journal-title":"Thin Solid Films"},{"key":"10.1016\/0042-207X(94)90080-9_BIB9","doi-asserted-by":"crossref","first-page":"1214","DOI":"10.1088\/0022-3735\/16\/12\/023","volume":"16","author":"Swanepoel","year":"1983","journal-title":"J Phys E"},{"key":"10.1016\/0042-207X(94)90080-9_BIB10","series-title":"Optical Properties of Semiconductors","author":"Moss","year":"1959"},{"key":"10.1016\/0042-207X(94)90080-9_BIB11","series-title":"Powder Diffraction File","author":"Joint Committee on Powder Diffraction Standards","year":"1967"},{"key":"10.1016\/0042-207X(94)90080-9_BIB12","doi-asserted-by":"crossref","first-page":"704","DOI":"10.1016\/0040-6090(90)90222-Y","volume":"193\/194","author":"Stjerna","year":"1990","journal-title":"Thin Solid Films"},{"issue":"226","key":"10.1016\/0042-207X(94)90080-9_BIB13","volume":"22","author":"Meng","year":"1993","journal-title":"Thin Solid Films"},{"issue":"3","key":"10.1016\/0042-207X(94)90080-9_BIB14","doi-asserted-by":"crossref","first-page":"319","DOI":"10.1016\/0169-4332(93)90251-6","volume":"68","author":"Meng","year":"1993","journal-title":"Appl Surface Sci"},{"issue":"6","key":"10.1016\/0042-207X(94)90080-9_BIB15","doi-asserted-by":"crossref","first-page":"3059","DOI":"10.1116\/1.573628","volume":"A4","author":"Thornton","year":"1986","journal-title":"J Vac Sci Technol"},{"key":"10.1016\/0042-207X(94)90080-9_BIB16","doi-asserted-by":"crossref","first-page":"61","DOI":"10.1016\/0040-6090(70)90052-0","volume":"5","author":"Heitmann","year":"1970","journal-title":"Thin Solid Films"}],"container-title":["Vacuum"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:0042207X94900809?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:0042207X94900809?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2019,4,4]],"date-time":"2019-04-04T22:54:06Z","timestamp":1554418446000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/0042207X94900809"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1994,12]]},"references-count":16,"journal-issue":{"issue":"12","published-print":{"date-parts":[[1994,12]]}},"alternative-id":["0042207X94900809"],"URL":"https:\/\/doi.org\/10.1016\/0042-207x(94)90080-9","relation":{},"ISSN":["0042-207X"],"issn-type":[{"value":"0042-207X","type":"print"}],"subject":[],"published":{"date-parts":[[1994,12]]}}}