{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,5,4]],"date-time":"2024-05-04T03:34:37Z","timestamp":1714793677077},"reference-count":4,"publisher":"Elsevier","isbn-type":[{"value":"9780444827623","type":"print"}],"license":[{"start":{"date-parts":[[1997,1,1]],"date-time":"1997-01-01T00:00:00Z","timestamp":852076800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[1997]]},"DOI":"10.1016\/b978-0-444-82762-3.50189-0","type":"book-chapter","created":{"date-parts":[[2014,1,17]],"date-time":"2014-01-17T22:04:35Z","timestamp":1389996275000},"page":"881-884","source":"Crossref","is-referenced-by-count":0,"title":["Time resolved energy dispersive X-ray diagnostic for the TCV tokamak"],"prefix":"10.1016","author":[{"given":"J.","family":"Sousa","sequence":"first","affiliation":[]},{"given":"P.","family":"Amaro","sequence":"additional","affiliation":[]},{"given":"P.","family":"Amorim","sequence":"additional","affiliation":[]},{"given":"B.","family":"Duval","sequence":"additional","affiliation":[]},{"given":"C.A.F.","family":"Varandas","sequence":"additional","affiliation":[]}],"member":"78","reference":[{"key":"10.1016\/B978-0-444-82762-3.50189-0_bib1","series-title":"\u201cPrinciples of Plasma Diagnostics\u201d","author":"Hutchinson","year":"1987"},{"key":"10.1016\/B978-0-444-82762-3.50189-0_bib2","doi-asserted-by":"crossref","first-page":"277","DOI":"10.1088\/0741-3335\/36\/12B\/023","volume":"B36","author":"Hoffman","year":"1994","journal-title":"Plasma Physics Controlled Fusion"},{"key":"10.1016\/B978-0-444-82762-3.50189-0_bib3","author":"Weisen","year":"1996","journal-title":"Plasma Physics Controlled Fusion"},{"key":"10.1016\/B978-0-444-82762-3.50189-0_bib4","unstructured":"B. P. Duval et al. Proceedings of the X-Ray spectroscopy conference, Lisbon 1996."}],"container-title":["Fusion Technology 1996"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:B9780444827623501890?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:B9780444827623501890?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2018,10,7]],"date-time":"2018-10-07T07:57:35Z","timestamp":1538899055000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/B9780444827623501890"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1997]]},"ISBN":["9780444827623"],"references-count":4,"URL":"https:\/\/doi.org\/10.1016\/b978-0-444-82762-3.50189-0","relation":{},"subject":[],"published":{"date-parts":[[1997]]}}}