{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,3,29]],"date-time":"2022-03-29T07:16:54Z","timestamp":1648538214976},"reference-count":10,"publisher":"Elsevier BV","issue":"1-3","license":[{"start":{"date-parts":[[2003,9,1]],"date-time":"2003-09-01T00:00:00Z","timestamp":1062374400000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Materials Science and Engineering: B"],"published-print":{"date-parts":[[2003,9]]},"DOI":"10.1016\/s0921-5107(02)00638-4","type":"journal-article","created":{"date-parts":[[2003,3,4]],"date-time":"2003-03-04T11:29:22Z","timestamp":1046777362000},"page":"156-160","source":"Crossref","is-referenced-by-count":0,"title":["Non-invasive electrical characterization of semiconductor interfaces"],"prefix":"10.1016","volume":"102","author":[{"given":"Regis","family":"Vanderhaghen","sequence":"first","affiliation":[]},{"given":"Samir","family":"Kasouit","sequence":"additional","affiliation":[]},{"given":"Jo\u00e3o Pedro","family":"Conde","sequence":"additional","affiliation":[]},{"given":"Hyun Mo","family":"Cho","sequence":"additional","affiliation":[]},{"given":"Virginia","family":"Chu","sequence":"additional","affiliation":[]},{"given":"Yun Woo","family":"Lee","sequence":"additional","affiliation":[]},{"given":"Hyun Jong","family":"Kim","sequence":"additional","affiliation":[]},{"given":"Sang Youl","family":"Kim","sequence":"additional","affiliation":[]},{"given":"Jean Paul","family":"Kleider","sequence":"additional","affiliation":[]}],"member":"78","reference":[{"key":"10.1016\/S0921-5107(02)00638-4_BIB1","doi-asserted-by":"crossref","first-page":"2484","DOI":"10.1063\/1.357606","volume":"76","author":"Uchikoga","year":"1994","journal-title":"J. Appl. Phys."},{"key":"10.1016\/S0921-5107(02)00638-4_BIB2","doi-asserted-by":"crossref","first-page":"6927","DOI":"10.1063\/1.458280","volume":"92","author":"Wang","year":"1990","journal-title":"J. Chem. Phys."},{"key":"10.1016\/S0921-5107(02)00638-4_BIB3","doi-asserted-by":"crossref","first-page":"1872","DOI":"10.1063\/1.121211","volume":"72","author":"Narasimha","year":"1998","journal-title":"Appl. Phys. Lett."},{"key":"10.1016\/S0921-5107(02)00638-4_BIB4","doi-asserted-by":"crossref","first-page":"2418","DOI":"10.1116\/1.580757","volume":"15","author":"Elmiger","year":"1997","journal-title":"J. Vac. Sci. Technol. A"},{"key":"10.1016\/S0921-5107(02)00638-4_BIB5","doi-asserted-by":"crossref","first-page":"6186","DOI":"10.1063\/1.364403","volume":"81","author":"Schmidt","year":"1997","journal-title":"J. Appl. Phys."},{"key":"10.1016\/S0921-5107(02)00638-4_BIB6","doi-asserted-by":"crossref","first-page":"3558","DOI":"10.1063\/1.337612","volume":"60","author":"Kunst","year":"1986","journal-title":"J. Appl. Phys."},{"key":"10.1016\/S0921-5107(02)00638-4_BIB7","doi-asserted-by":"crossref","first-page":"7741","DOI":"10.1063\/1.370579","volume":"85","author":"Hahneiser","year":"1999","journal-title":"J. Appl. Phys."},{"key":"10.1016\/S0921-5107(02)00638-4_BIB8","doi-asserted-by":"crossref","first-page":"1232","DOI":"10.1063\/1.115936","volume":"68","author":"Lauinger","year":"1996","journal-title":"Appl. Phys. Lett."},{"key":"10.1016\/S0921-5107(02)00638-4_BIB9","doi-asserted-by":"crossref","first-page":"53","DOI":"10.1016\/S0040-6090(00)01791-0","volume":"383","author":"Brenot","year":"2001","journal-title":"Thin Solid Films"},{"key":"10.1016\/S0921-5107(02)00638-4_BIB10","unstructured":"S. Kasouit, P. Bulkin, P. Roca i Cabarrocas, R. Vanderhaghen, in: Proceedings of the Conference K\/PII.35."}],"container-title":["Materials Science and Engineering: B"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0921510702006384?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0921510702006384?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2019,3,27]],"date-time":"2019-03-27T01:25:27Z","timestamp":1553649927000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/S0921510702006384"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2003,9]]},"references-count":10,"journal-issue":{"issue":"1-3","published-print":{"date-parts":[[2003,9]]}},"alternative-id":["S0921510702006384"],"URL":"https:\/\/doi.org\/10.1016\/s0921-5107(02)00638-4","relation":{},"ISSN":["0921-5107"],"issn-type":[{"value":"0921-5107","type":"print"}],"subject":[],"published":{"date-parts":[[2003,9]]}}}