{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,6]],"date-time":"2025-06-06T10:25:53Z","timestamp":1749205553711},"reference-count":21,"publisher":"Cambridge University Press (CUP)","issue":"1","license":[{"start":{"date-parts":[[2009,2,27]],"date-time":"2009-02-27T00:00:00Z","timestamp":1235692800000},"content-version":"unspecified","delay-in-days":5870,"URL":"https:\/\/www.cambridge.org\/core\/terms"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["AIEDAM"],"published-print":{"date-parts":[[1993,2]]},"abstract":"<jats:p>We describe ACDS, an automatic diagnostic system. ACDS is capable of diagnosing faults on analog circuits in dynamic conditions. The circuit's dynamic behavior is studied by means of a series of intrastate simulations during which the qualitative state of the circuit does not change. An acquistion board collects the value of a set of quantities corresponding to accessible test points. These measurements are converted into qualitative values and are used for two purposes: first, to determine the state of the circuit components; second, to trigger the diagnostic procedure whenever a discrepancy between observed and predicted behavior is found. The main difficulty in this phase of measurement interpretation is in obtaining meaningful numerical-qualitative data conversion for values of quantities approaching a boundary between two different qualitative intervals. System performance has been verified through a number of simulations, which have shown the proposed approach to be efficient both in terms of localized faults and of flexibility in adapting to different circuits.<\/jats:p>","DOI":"10.1017\/s0890060400000068","type":"journal-article","created":{"date-parts":[[2010,3,31]],"date-time":"2010-03-31T09:47:51Z","timestamp":1270028871000},"page":"53-64","source":"Crossref","is-referenced-by-count":6,"title":["Qualitative dynamic diagnosis of circuits"],"prefix":"10.1017","volume":"7","author":[{"given":"Alessandra","family":"Fanni","sequence":"first","affiliation":[]},{"given":"Paolo","family":"Diana","sequence":"additional","affiliation":[]},{"given":"Alessandro","family":"Giua","sequence":"additional","affiliation":[]},{"given":"Marco","family":"Perezzani","sequence":"additional","affiliation":[]}],"member":"56","published-online":{"date-parts":[[2009,2,27]]},"reference":[{"key":"S0890060400000068_ref021","doi-asserted-by":"publisher","DOI":"10.1016\/0004-3702(87)90062-2"},{"key":"S0890060400000068_ref020","doi-asserted-by":"publisher","DOI":"10.1016\/0004-3702(91)90107-U"},{"key":"S0890060400000068_ref019","doi-asserted-by":"publisher","DOI":"10.1016\/0004-3702(86)90073-1"},{"key":"S0890060400000068_ref018","volume-title":"Advances in Circuits and Systems","author":"Ruey-Wen","year":"1987"},{"key":"S0890060400000068_ref017","volume":"26","year":"1979","journal-title":"IEEE Transactions on Circuits and Systems"},{"key":"S0890060400000068_ref016","doi-asserted-by":"publisher","DOI":"10.1109\/TCS.1979.1084665"},{"key":"S0890060400000068_ref015","unstructured":"Giovannini F. and Malabocchia F. 1985. A model based expert system for HW troubleshooting driven by compiled control knowledge. Expert Systems '85, pp. 65\u201367."},{"key":"S0890060400000068_ref014","doi-asserted-by":"publisher","DOI":"10.1016\/0004-3702(84)90038-9"},{"key":"S0890060400000068_ref010","first-page":"372","volume-title":"Proceeding of the 10th IASTED International Symposium on Modeling, Identification and Control","author":"Diana","year":"1991"},{"key":"S0890060400000068_ref009","doi-asserted-by":"publisher","DOI":"10.1016\/0004-3702(87)90063-4"},{"key":"S0890060400000068_ref008","doi-asserted-by":"publisher","DOI":"10.1016\/0004-3702(84)90037-7"},{"key":"S0890060400000068_ref006","doi-asserted-by":"publisher","DOI":"10.1016\/0004-3702(91)90113-X"},{"key":"S0890060400000068_ref005","first-page":"1109","volume-title":"Proceedings of the 12th International Joint Conference on Artificial Intelligence","author":"Dague","year":"1991"},{"key":"S0890060400000068_ref002","first-page":"531","volume-title":"Proceedings of the IEEE International Symposium on Intelligent Control","author":"Cois","year":"1989"},{"key":"S0890060400000068_ref013","unstructured":"Fanni A. , Diana P. and Perezzani M. 1992. Intelligent data acquisition for qualitative fault diagnosis of analog circuits. Proceedings of the Singapore International Conference on Intelligent Control and Instrumentation, pp. 75\u201380."},{"key":"S0890060400000068_ref003","first-page":"443","volume-title":"Proceedings of the 10th International Joint Conference on Artificial Intelligence","author":"Cunningham","year":"1987"},{"key":"S0890060400000068_ref011","first-page":"1238","volume-title":"Proceedings of the 11th International Joint Conference on Artificial Intelligence","author":"Dvorak","year":"1989"},{"key":"S0890060400000068_ref001","doi-asserted-by":"publisher","DOI":"10.1109\/PROC.1985.13281"},{"key":"S0890060400000068_ref004","first-page":"600","volume-title":"Proceedings of the AAAI 87 Conference","author":"Dague","year":"1987"},{"key":"S0890060400000068_ref007","doi-asserted-by":"publisher","DOI":"10.1016\/0004-3702(84)90040-7"},{"key":"S0890060400000068_ref012","first-page":"373","volume-title":"Artificial Intelligence III: Methodology, Systems, Applications","author":"Fanni","year":"1988"}],"container-title":["Artificial Intelligence for Engineering Design, Analysis and Manufacturing"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.cambridge.org\/core\/services\/aop-cambridge-core\/content\/view\/S0890060400000068","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,16]],"date-time":"2019-05-16T15:16:39Z","timestamp":1558019799000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.cambridge.org\/core\/product\/identifier\/S0890060400000068\/type\/journal_article"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1993,2]]},"references-count":21,"journal-issue":{"issue":"1","published-print":{"date-parts":[[1993,2]]}},"alternative-id":["S0890060400000068"],"URL":"https:\/\/doi.org\/10.1017\/s0890060400000068","relation":{},"ISSN":["0890-0604","1469-1760"],"issn-type":[{"value":"0890-0604","type":"print"},{"value":"1469-1760","type":"electronic"}],"subject":[],"published":{"date-parts":[[1993,2]]}}}