{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,1]],"date-time":"2025-04-01T12:43:07Z","timestamp":1743511387173},"reference-count":11,"publisher":"Cambridge University Press (CUP)","issue":"1","license":[{"start":{"date-parts":[[2009,2,27]],"date-time":"2009-02-27T00:00:00Z","timestamp":1235692800000},"content-version":"unspecified","delay-in-days":5171,"URL":"https:\/\/www.cambridge.org\/core\/terms"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["AIEDAM"],"published-print":{"date-parts":[[1995,1]]},"abstract":"<jats:title>Abstract<\/jats:title><jats:p>Research efforts to implement a Bayesian belief-network-based expert system to solve a real-world diagnostic problem \u2013 the diagnosis of integrated circuit (IC) testing machines \u2013 are described. The development of several models of the IC tester diagnostic problem in belief networks also is described, the implementation of one of these models using symbolic probabilistic inference (SPI) is outlined, and the difficulties and advantages encountered are discussed. It was observed that modeling with interdependencies in belief networks simplifies the knowledge engineering task for the IC tester diagnosis problem, by avoiding procedural knowledge and focusing on the diagnostic component\u2019s interdependencies. Several general model frameworks evolved through knowledge engineering to capture diagnostic expertise that facilitated expanding and modifying the networks. However, model implementation was restricted to a small portion of the modeling, that of contact resistance failures, which were due to time limitations and inefficiencies in the prototype inference software we used. Further research is recommended to refine existing methods, in order to speed evaluation of the models created in this research. With this accomplished, a more complete diagnosis can be achieved.<\/jats:p>","DOI":"10.1017\/s0890060400002080","type":"journal-article","created":{"date-parts":[[2010,3,31]],"date-time":"2010-03-31T09:46:58Z","timestamp":1270028818000},"page":"51-65","source":"Crossref","is-referenced-by-count":4,"title":["Application of a Bayesian network to integrated circuit tester diagnosis"],"prefix":"10.1017","volume":"9","author":[{"given":"Daniel","family":"Mittelstadt","sequence":"first","affiliation":[]},{"given":"Robert","family":"Paasch","sequence":"additional","affiliation":[]},{"given":"Bruce","family":"D\u2019Ambrosio","sequence":"additional","affiliation":[]}],"member":"56","published-online":{"date-parts":[[2009,2,27]]},"reference":[{"key":"S0890060400002080_ref009","doi-asserted-by":"publisher","DOI":"10.1016\/B978-1-4832-8287-9.50033-5"},{"key":"S0890060400002080_ref007","first-page":"64","article-title":"Decision analysis and expert systems","volume":"12","author":"Henrion","year":"1991","journal-title":"AI Magazine"},{"key":"S0890060400002080_ref006","volume-title":"Probabilistic Similarity Networks","author":"Heckerman","year":"1991"},{"key":"S0890060400002080_ref003","first-page":"301","volume-title":"Ninth Ann. Conf. on Uncertainty on AI","author":"D\u2019Ambrosio","year":"1993"},{"key":"S0890060400002080_ref002","unstructured":"D\u2019Ambrosio B. (1992). Real-time value-driven diagnosis and repair. In Proc. Third Int. Workshop on the Principles of Diagnosis, 86\u201396."},{"key":"S0890060400002080_ref011","unstructured":"Provan G. (1992). Modelling the dynamics of diagnosis and treatment using temporal influence diagrams. In Third Int. Workshop on the Principles of Diagnosis, 97\u2013106."},{"key":"S0890060400002080_ref008","article-title":"Efficient inference in Bayes nets as a combinatorial optimization problem","volume":"10","author":"Li","year":"1994","journal-title":"Int. J. Approx. Reasoning"},{"key":"S0890060400002080_ref004","doi-asserted-by":"publisher","DOI":"10.1016\/0004-3702(87)90063-4"},{"key":"S0890060400002080_ref010","volume-title":"Probabilistic Reasoning in Intelligent Systems","author":"Pearl","year":"1988"},{"key":"S0890060400002080_ref001","doi-asserted-by":"publisher","DOI":"10.1016\/B978-1-4832-8287-9.50010-4"},{"key":"S0890060400002080_ref005","volume-title":"Proc. Third Int. Conf. on Knowledge Representation and Reasoning","author":"Friedrich","year":"1992"}],"container-title":["Artificial Intelligence for Engineering Design, Analysis and Manufacturing"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.cambridge.org\/core\/services\/aop-cambridge-core\/content\/view\/S0890060400002080","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,14]],"date-time":"2019-05-14T15:50:33Z","timestamp":1557849033000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.cambridge.org\/core\/product\/identifier\/S0890060400002080\/type\/journal_article"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1995,1]]},"references-count":11,"journal-issue":{"issue":"1","published-print":{"date-parts":[[1995,1]]}},"alternative-id":["S0890060400002080"],"URL":"https:\/\/doi.org\/10.1017\/s0890060400002080","relation":{},"ISSN":["0890-0604","1469-1760"],"issn-type":[{"value":"0890-0604","type":"print"},{"value":"1469-1760","type":"electronic"}],"subject":[],"published":{"date-parts":[[1995,1]]}}}