{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,5,29]],"date-time":"2024-05-29T08:29:21Z","timestamp":1716971361781},"reference-count":30,"publisher":"Oxford University Press (OUP)","issue":"5","license":[{"start":{"date-parts":[[2014,8,26]],"date-time":"2014-08-26T00:00:00Z","timestamp":1409011200000},"content-version":"unspecified","delay-in-days":0,"URL":"https:\/\/www.cambridge.org\/core\/terms"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Microsc Microanal"],"published-print":{"date-parts":[[2014,10]]},"abstract":"<jats:title>Abstract<\/jats:title><jats:p>We discuss observations of InN nanowires (NWs) by plan-view high-resolution transmission electron microscopy (TEM). The main difficulties arise from suitable methods available for plan-view specimen preparation. We explore different approaches and find that the best results are obtained using a refined preparation method based on the conventional procedure for plan-view TEM of thin films, specifically modified for the NW morphology. The fundamental aspects of such a preparation are the initial mechanical stabilization of the NWs and the minimization of the ion-milling process after dimpling the samples until perforation. The combined analysis by plan-view and cross-sectional TEM of the NWs allows determination of the degree of strain relaxation and reveals the formation of an unintentional shell layer (2\u20133-nm thick) around the InN NWs. The shell layer is composed of bcc In<jats:sub>2<\/jats:sub>O<jats:sub>3<\/jats:sub> nanocrystals with a preferred orientation with respect to the wurtzite InN: In<jats:sub>2<\/jats:sub>O<jats:sub>3<\/jats:sub> [111] || InN [0001] and In<jats:sub>2<\/jats:sub>O<jats:sub>3<\/jats:sub> &lt;110&gt; || InN&lt;<jats:inline-formula><jats:alternatives><jats:graphic xmlns:xlink=\"http:\/\/www.w3.org\/1999\/xlink\" orientation=\"portrait\" mime-subtype=\"gif\" mimetype=\"image\" position=\"float\" xlink:type=\"simple\" xlink:href=\"S1431927614013038_eqnU1\" \/><jats:tex-math>\n$$ 11\\bar 20 $$\n<\/jats:tex-math><\/jats:alternatives><\/jats:inline-formula>&gt;.<\/jats:p>","DOI":"10.1017\/s1431927614013038","type":"journal-article","created":{"date-parts":[[2014,8,26]],"date-time":"2014-08-26T07:38:58Z","timestamp":1409038738000},"page":"1471-1478","source":"Crossref","is-referenced-by-count":6,"title":["Investigation of III\u2013V Nanowires by Plan-View Transmission Electron Microscopy: InN Case 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