{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,9,24]],"date-time":"2023-09-24T13:20:59Z","timestamp":1695561659264},"reference-count":0,"publisher":"Oxford University Press (OUP)","issue":"S3","license":[{"start":{"date-parts":[[2008,10,3]],"date-time":"2008-10-03T00:00:00Z","timestamp":1222992000000},"content-version":"unspecified","delay-in-days":32,"URL":"https:\/\/www.cambridge.org\/core\/terms"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Microsc Microanal"],"published-print":{"date-parts":[[2008,9]]},"abstract":"<jats:p>Ge NCs have attracted considerable attention because of their potential applications in nonvolatile memory and integrated optoelectronics. A number of groups have already proposed integrate flash memories based on Ge NCs embedded SiO<jats:sub>2<\/jats:sub> matrix. Since Al<jats:sub>2<\/jats:sub>O<jats:sub>3<\/jats:sub> presents a high dielectric constant comparatively to SiO<jats:sub>2<\/jats:sub>, it is a good candidate to replace silica in flash memory systems, and therefore improve their performances. Moreover, Al<jats:sub>2<\/jats:sub>O<jats:sub>3<\/jats:sub> presents good mechanical properties, and supports high temperature, which leads it to be an ideal material for Si processing conditions. However, a few studies have been reported on Ge NCs embedded in Al<jats:sub>2<\/jats:sub>O<jats:sub>3<\/jats:sub> matrix.<\/jats:p>","DOI":"10.1017\/s1431927608089393","type":"journal-article","created":{"date-parts":[[2008,10,3]],"date-time":"2008-10-03T11:24:08Z","timestamp":1223033048000},"page":"61-64","source":"Crossref","is-referenced-by-count":5,"title":["Estimation of Ge nanocrystals size by Raman, X-rays, and HRTEM techniques"],"prefix":"10.1093","volume":"14","author":[{"given":"S.R.C.","family":"Pinto","sequence":"first","affiliation":[]},{"given":"P.","family":"Caldelas","sequence":"additional","affiliation":[]},{"given":"A.G.","family":"Rolo","sequence":"additional","affiliation":[]},{"given":"A.","family":"Chahboun","sequence":"additional","affiliation":[]},{"given":"M.J.M.","family":"Gomes","sequence":"additional","affiliation":[]}],"member":"286","published-online":{"date-parts":[[2008,10,3]]},"container-title":["Microscopy and Microanalysis"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.cambridge.org\/core\/services\/aop-cambridge-core\/content\/view\/S1431927608089393","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,2,14]],"date-time":"2023-02-14T20:59:04Z","timestamp":1676408344000},"score":1,"resource":{"primary":{"URL":"https:\/\/academic.oup.com\/mam\/article\/14\/S3\/61\/6919814"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,9]]},"references-count":0,"journal-issue":{"issue":"S3","published-print":{"date-parts":[[2008,9]]}},"alternative-id":["S1431927608089393"],"URL":"https:\/\/doi.org\/10.1017\/s1431927608089393","relation":{},"ISSN":["1431-9276","1435-8115"],"issn-type":[{"value":"1431-9276","type":"print"},{"value":"1435-8115","type":"electronic"}],"subject":[],"published":{"date-parts":[[2008,9]]}}}