{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,3]],"date-time":"2024-08-03T19:39:51Z","timestamp":1722713991269},"reference-count":0,"publisher":"Oxford University Press (OUP)","issue":"S3","license":[{"start":{"date-parts":[[2009,8,21]],"date-time":"2009-08-21T00:00:00Z","timestamp":1250812800000},"content-version":"unspecified","delay-in-days":51,"URL":"https:\/\/www.cambridge.org\/core\/terms"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Microsc Microanal"],"published-print":{"date-parts":[[2009,7]]},"abstract":"<jats:title>Abstract<\/jats:title><jats:p>CVD diamond coated cutting tools are used for machining of abrasive and hard materials such as Al-Si alloys and tungsten carbide. The knowledge of the mechanisms governing the diamond\/substrate interfacial strength is crucial in cutting tools design. The most adequate substrate material for maximizing the adhesion of diamond films is the silicon nitride (Si3N4) ceramic that possesses a thermal expansion coefficient similar to that of diamond. Buchkremer-Hermanns and co-workers consider the formation of a SiC interlayer between diamond and Si3N4, which may favour chemical bonding to diamond, although they could not detect it by glazing incidence X-Ray diffraction. They believed that insufficient detection sensitivity for very thin films, texture effects or presence of amorphous layers are possible reasons. In the case of TiN substrates, a graded interlayer of amorphous TiCN of only 8 \u00c5 was suggested by Contreras, as observed by HRTEM images and EDS measurements. Due to the difficulty in the detection of such layers, which can be in the order of a few angstrons, a definite evidence of their nature is yet to be demonstrated.<\/jats:p>","DOI":"10.1017\/s1431927609990742","type":"journal-article","created":{"date-parts":[[2009,8,21]],"date-time":"2009-08-21T07:39:11Z","timestamp":1250840351000},"page":"57-58","source":"Crossref","is-referenced-by-count":4,"title":["CVD diamond\/substrate interface FIB preparation of cutting tools"],"prefix":"10.1093","volume":"15","author":[{"given":"S. B.","family":"Peripolli","sequence":"first","affiliation":[]},{"given":"F. A.","family":"Almeida","sequence":"additional","affiliation":[]},{"given":"L. S.","family":"Gomes","sequence":"additional","affiliation":[]},{"given":"F. J.","family":"Oliveira","sequence":"additional","affiliation":[]},{"given":"R. F.","family":"Silva","sequence":"additional","affiliation":[]},{"given":"C. A.","family":"Achete","sequence":"additional","affiliation":[]}],"member":"286","published-online":{"date-parts":[[2009,8,21]]},"container-title":["Microscopy and Microanalysis"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.cambridge.org\/core\/services\/aop-cambridge-core\/content\/view\/S1431927609990742","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,2,14]],"date-time":"2023-02-14T21:05:37Z","timestamp":1676408737000},"score":1,"resource":{"primary":{"URL":"https:\/\/academic.oup.com\/mam\/article\/15\/S3\/57\/6920024"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,7]]},"references-count":0,"journal-issue":{"issue":"S3","published-print":{"date-parts":[[2009,7]]}},"alternative-id":["S1431927609990742"],"URL":"https:\/\/doi.org\/10.1017\/s1431927609990742","relation":{},"ISSN":["1431-9276","1435-8115"],"issn-type":[{"value":"1431-9276","type":"print"},{"value":"1435-8115","type":"electronic"}],"subject":[],"published":{"date-parts":[[2009,7]]}}}