{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,26]],"date-time":"2025-10-26T22:33:52Z","timestamp":1761518032934},"reference-count":26,"publisher":"Oxford University Press (OUP)","issue":"6","license":[{"start":{"date-parts":[[2010,10,1]],"date-time":"2010-10-01T00:00:00Z","timestamp":1285891200000},"content-version":"unspecified","delay-in-days":0,"URL":"https:\/\/www.cambridge.org\/core\/terms"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Microsc Microanal"],"published-print":{"date-parts":[[2010,12]]},"abstract":"<jats:title>Abstract<\/jats:title><jats:p>Reactive multilayer thin films that undergo highly exothermic reactions are attractive choices for applications in ignition, propulsion, and joining systems. Ni\/Al reactive multilayer thin films were deposited by dc magnetron sputtering with a period of 14 nm. The microstructure of the as-deposited and heat-treated Ni\/Al multilayers was studied by transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) in plan view and in cross section. The cross-section samples for TEM and STEM were prepared by focused ion beam lift-out technique. TEM analysis indicates that the as-deposited samples were composed of Ni and Al. High-resolution TEM images reveal the presence of NiAl in small localized regions. Microstructural characterization shows that heat treating at 450 and 700\u00b0C transforms the Ni\/Al multilayered structure into equiaxed NiAl fine grains.<\/jats:p>","DOI":"10.1017\/s143192761009392x","type":"journal-article","created":{"date-parts":[[2010,10,1]],"date-time":"2010-10-01T10:48:14Z","timestamp":1285930094000},"page":"662-669","source":"Crossref","is-referenced-by-count":10,"title":["TEM Characterization of As-Deposited and Annealed Ni\/Al Multilayer Thin Film"],"prefix":"10.1093","volume":"16","author":[{"given":"S.","family":"Sim\u00f5es","sequence":"first","affiliation":[]},{"given":"F.","family":"Viana","sequence":"additional","affiliation":[]},{"given":"A.S.","family":"Ramos","sequence":"additional","affiliation":[]},{"given":"M.T.","family":"Vieira","sequence":"additional","affiliation":[]},{"given":"M.F.","family":"Vieira","sequence":"additional","affiliation":[]}],"member":"286","published-online":{"date-parts":[[2010,10,1]]},"reference":[{"key":"S143192761009392X_ref019","doi-asserted-by":"publisher","DOI":"10.1016\/j.scriptamat.2007.02.032"},{"key":"S143192761009392X_ref003","doi-asserted-by":"publisher","DOI":"10.1016\/S1359-6454(03)00211-8"},{"key":"S143192761009392X_ref007","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmmm.2004.09.098"},{"key":"S143192761009392X_ref004","doi-asserted-by":"publisher","DOI":"10.1063\/1.357893"},{"key":"S143192761009392X_ref017","doi-asserted-by":"publisher","DOI":"10.1016\/S0966-9795(99)00080-1"},{"key":"S143192761009392X_ref008","doi-asserted-by":"publisher","DOI":"10.1051\/epjap\/2008189"},{"key":"S143192761009392X_ref026","doi-asserted-by":"publisher","DOI":"10.1023\/A:1025956906085"},{"key":"S143192761009392X_ref001","doi-asserted-by":"publisher","DOI":"10.1557\/JMR.1997.0021"},{"key":"S143192761009392X_ref020","doi-asserted-by":"publisher","DOI":"10.1016\/j.jallcom.2009.04.098"},{"key":"S143192761009392X_ref005","doi-asserted-by":"publisher","DOI":"10.1063\/1.372005"},{"key":"S143192761009392X_ref006","doi-asserted-by":"publisher","DOI":"10.1007\/s10853-005-6918-0"},{"key":"S143192761009392X_ref009","doi-asserted-by":"publisher","DOI":"10.1063\/1.342756"},{"key":"S143192761009392X_ref023","doi-asserted-by":"publisher","DOI":"10.1007\/s10853-010-4303-0"},{"key":"S143192761009392X_ref010","doi-asserted-by":"publisher","DOI":"10.1063\/1.348722"},{"key":"S143192761009392X_ref011","first-page":"2211","article-title":"Self-propagating explosive reactions in Al\/Ni multilayer thin film","volume":"57","author":"Ma","year":"1990","journal-title":"J Appl Phys"},{"key":"S143192761009392X_ref012","doi-asserted-by":"publisher","DOI":"10.1002\/1527-2648(200105)3:5<311::AID-ADEM311>3.0.CO;2-N"},{"key":"S143192761009392X_ref013","doi-asserted-by":"publisher","DOI":"10.1557\/mrs2007.63"},{"key":"S143192761009392X_ref014","first-page":"3167","article-title":"Investigating the thermodynamics and kinetics of thin film reactions by differential scanning calorimetry","volume":"30","author":"Michaelsen","year":"1997","journal-title":"J Appl Phys"},{"key":"S143192761009392X_ref015","doi-asserted-by":"publisher","DOI":"10.1063\/1.363794"},{"key":"S143192761009392X_ref016","doi-asserted-by":"publisher","DOI":"10.1017\/S1431927606062015"},{"key":"S143192761009392X_ref018","doi-asserted-by":"publisher","DOI":"10.1016\/j.intermet.2008.06.002"},{"key":"S143192761009392X_ref022","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-85226-1_244"},{"key":"S143192761009392X_ref024","doi-asserted-by":"publisher","DOI":"10.1016\/j.scriptamat.2005.07.030"},{"key":"S143192761009392X_ref025","doi-asserted-by":"publisher","DOI":"10.1063\/1.1629390"},{"key":"S143192761009392X_ref021","doi-asserted-by":"publisher","DOI":"10.1002\/sia.2896"},{"key":"S143192761009392X_ref002","doi-asserted-by":"publisher","DOI":"10.1016\/S1359-6462(97)00078-X"}],"container-title":["Microscopy and Microanalysis"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.cambridge.org\/core\/services\/aop-cambridge-core\/content\/view\/S143192761009392X","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,2,14]],"date-time":"2023-02-14T20:42:42Z","timestamp":1676407362000},"score":1,"resource":{"primary":{"URL":"https:\/\/academic.oup.com\/mam\/article\/16\/6\/662\/6920268"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,10,1]]},"references-count":26,"journal-issue":{"issue":"6","published-print":{"date-parts":[[2010,12]]}},"alternative-id":["S143192761009392X"],"URL":"https:\/\/doi.org\/10.1017\/s143192761009392x","relation":{},"ISSN":["1431-9276","1435-8115"],"issn-type":[{"value":"1431-9276","type":"print"},{"value":"1435-8115","type":"electronic"}],"subject":[],"published":{"date-parts":[[2010,10,1]]}}}