{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,26]],"date-time":"2026-05-26T14:10:49Z","timestamp":1779804649431,"version":"3.53.1"},"reference-count":33,"publisher":"American Chemical Society (ACS)","issue":"10","license":[{"start":{"date-parts":[[2026,5,6]],"date-time":"2026-05-06T00:00:00Z","timestamp":1778025600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100003625","name":"Ministry of Health and Welfare","doi-asserted-by":"publisher","award":["RS-2024-00468463"],"award-info":[{"award-number":["RS-2024-00468463"]}],"id":[{"id":"10.13039\/501100003625","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100014188","name":"Ministry of Science and ICT, South Korea","doi-asserted-by":"publisher","award":["RS-2024-00468463"],"award-info":[{"award-number":["RS-2024-00468463"]}],"id":[{"id":"10.13039\/501100014188","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003725","name":"National Research Foundation of Korea","doi-asserted-by":"publisher","award":["RS-2024-00346176"],"award-info":[{"award-number":["RS-2024-00346176"]}],"id":[{"id":"10.13039\/501100003725","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003725","name":"National Research Foundation of Korea","doi-asserted-by":"publisher","award":["RS-2025-02263336"],"award-info":[{"award-number":["RS-2025-02263336"]}],"id":[{"id":"10.13039\/501100003725","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J. Chem. Inf. Model."],"published-print":{"date-parts":[[2026,5,25]]},"DOI":"10.1021\/acs.jcim.6c00780","type":"journal-article","created":{"date-parts":[[2026,5,6]],"date-time":"2026-05-06T13:18:11Z","timestamp":1778073491000},"page":"5801-5810","source":"Crossref","is-referenced-by-count":0,"title":["Classifying Multistate DNA Origami: An Automated Approach with Minimal Labeling and Confidence-Based Filtering"],"prefix":"10.1021","volume":"66","author":[{"ORCID":"https:\/\/orcid.org\/0009-0007-4050-2573","authenticated-orcid":true,"given":"Hongchang","family":"Lee","sequence":"first","affiliation":[{"name":"Department of Mechanical Engineering","place":["Seoul, Republic of Korea"]},{"name":"Seoul National University","place":["Seoul, Republic of Korea"]},{"name":"Metrology & Inspection Technology Team","place":["Hwaseong-si, Republic of Korea"]},{"name":"Samsung Electronics","place":["Hwaseong-si, Republic of Korea"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0005-4735-8004","authenticated-orcid":true,"given":"Seo Hyun","family":"Kwon","sequence":"additional","affiliation":[{"name":"Department of Mechanical Engineering","place":["Seoul, Republic of Korea"]},{"name":"Seoul National University","place":["Seoul, Republic of Korea"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0896-4552","authenticated-orcid":true,"given":"Do-Nyun","family":"Kim","sequence":"additional","affiliation":[{"name":"Department of Mechanical Engineering","place":["Seoul, Republic of Korea"]},{"name":"Seoul National University","place":["Seoul, Republic of Korea"]},{"name":"Institute of Advanced Machines and Design","place":["Seoul, Republic of Korea"]},{"name":"Seoul National University","place":["Seoul, Republic of Korea"]},{"name":"Institute of Engineering Research","place":["Seoul, Republic of Korea"]},{"name":"Seoul National University","place":["Seoul, Republic of Korea"]}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"316","published-online":{"date-parts":[[2026,5,6]]},"reference":[{"key":"ref1\/cit1","doi-asserted-by":"publisher","DOI":"10.1038\/nature04586"},{"key":"ref2\/cit2","doi-asserted-by":"publisher","DOI":"10.1038\/nature08016"},{"key":"ref3\/cit3","doi-asserted-by":"publisher","DOI":"10.1021\/acsnano.9b03770"},{"key":"ref4\/cit4","doi-asserted-by":"publisher","DOI":"10.1038\/nature10262"},{"key":"ref5\/cit5","doi-asserted-by":"publisher","DOI":"10.1126\/science.1200520"},{"key":"ref6\/cit6","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2017.127"},{"key":"ref7\/cit7","doi-asserted-by":"publisher","DOI":"10.1126\/science.1214081"},{"key":"ref8\/cit8","doi-asserted-by":"publisher","DOI":"10.1038\/nbt.4071"},{"key":"ref9\/cit9","doi-asserted-by":"publisher","DOI":"10.1126\/sciadv.add0185"},{"key":"ref10\/cit10","doi-asserted-by":"publisher","DOI":"10.1002\/adma.202509727"},{"key":"ref11\/cit11","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2009.220"},{"key":"ref12\/cit12","doi-asserted-by":"publisher","DOI":"10.1038\/s41563-021-00930-7"},{"key":"ref13\/cit13","doi-asserted-by":"publisher","DOI":"10.1021\/acsnano.9b09348"},{"key":"ref14\/cit14","doi-asserted-by":"publisher","DOI":"10.1126\/science.1174251"},{"key":"ref15\/cit15","doi-asserted-by":"publisher","DOI":"10.1126\/sciadv.aav0655"},{"key":"ref16\/cit16","doi-asserted-by":"publisher","DOI":"10.1038\/s41586-023-06181-7"},{"key":"ref17\/cit17","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-021-25406-9"},{"key":"ref18\/cit18","doi-asserted-by":"publisher","DOI":"10.1021\/acsnano.4c09654"},{"key":"ref19\/cit19","doi-asserted-by":"publisher","DOI":"10.1021\/acsnano.3c10386"},{"key":"ref20\/cit20","doi-asserted-by":"crossref","unstructured":"Redmon, J.; Divvala, S.; Girshick, R.; Farhadi, A. In\n                      You Only Look Once: Unified, Real-Time Object Detection\n                      , Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition; IEEE, 2016; pp 779\u2013788.","DOI":"10.1109\/CVPR.2016.91"},{"key":"ref21\/cit21","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-023-41459-w"},{"key":"ref22\/cit22","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-022-07759-3"},{"key":"ref23\/cit23","doi-asserted-by":"publisher","DOI":"10.1002\/sstr.202500274"},{"key":"ref24\/cit24","series-title":"Lecture Notes in Computer Science","volume-title":"Computer Vision \u2013 ACCV 2020","author":"Techapanurak E.","year":"2020"},{"key":"ref25\/cit25","unstructured":"Snell, J.; Swersky, K.; Zemel, R. In\n                      Prototypical Networks for Few-Shot Learning\n                      , Advances in Neural Information Processing Systems 30 (NIPS 2017); NeurIPS, 2017."},{"key":"ref26\/cit26","unstructured":"Khosla, P.; Teterwak, P.; Wang, C.; Sarna, A.; Tian, Y.; Isola, P.; Maschinot, A.; Liu, C.; Krishnan, D. In\n                      Supervised Contrastive Learning\n                      , Advances in Neural Information Processing Systems 33 (NeurIPS 2020); NeurIPS, 2020; pp 18661\u201318673."},{"key":"ref27\/cit27","unstructured":"Chen, T.; Kornblith, S.; Norouzi, M.; Hinton, G. In\n                      A Simple Framework for Contrastive Learning of Visual Representations\n                      ,\n                      International Conference on Machine Learning\n                      ; MLR Press, 2020; pp 1597\u20131607."},{"key":"ref28\/cit28","doi-asserted-by":"publisher","DOI":"10.7717\/peerj.453"},{"key":"ref29\/cit29","doi-asserted-by":"crossref","unstructured":"He, K.; Zhang, X.; Ren, S.; Sun, J. In\n                      Deep Residual Learning for Image Recognition\n                      ,\n                      Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition\n                      ; IEEE, 2016; pp 770\u2013778.","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref30\/cit30","doi-asserted-by":"crossref","unstructured":"He, K.; Chen, X.; Xie, S.; Li, Y.; Doll\u00e1r, P.; Girshick, R. In\n                      Masked Autoencoders are Scalable Vision Learners\n                      , IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR); IEEE, 2022; pp 16000\u201316009.","DOI":"10.1109\/CVPR52688.2022.01553"},{"key":"ref31\/cit31","unstructured":"Loshchilov, I.; Hutter, F. Decoupled Weight Decay Regularization, 2017. arXiv:1711.05101. arXiv.org e-Print archive. https:\/\/arxiv.org\/abs\/1711.05101."},{"key":"ref32\/cit32","unstructured":"Hendrycks, D.; Gimpel, K. A Baseline for Detecting Misclassified and Out-Of-Distribution Examples in Neural Networks, 2016. arXiv:1610.02136. arXiv.org e-Print archive. https:\/\/arxiv.org\/abs\/1610.02136."},{"key":"ref33\/cit33","doi-asserted-by":"publisher","DOI":"10.48550\/arXiv.2010.03759"}],"container-title":["Journal of Chemical Information and Modeling"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/pubs.acs.org\/doi\/pdf\/10.1021\/acs.jcim.6c00780","content-type":"application\/pdf","content-version":"vor","intended-application":"unspecified"},{"URL":"https:\/\/pubs.acs.org\/doi\/pdf\/10.1021\/acs.jcim.6c00780","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,5,26]],"date-time":"2026-05-26T13:23:08Z","timestamp":1779801788000},"score":1,"resource":{"primary":{"URL":"https:\/\/pubs.acs.org\/doi\/10.1021\/acs.jcim.6c00780"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,5,6]]},"references-count":33,"journal-issue":{"issue":"10","published-print":{"date-parts":[[2026,5,25]]}},"alternative-id":["10.1021\/acs.jcim.6c00780"],"URL":"https:\/\/doi.org\/10.1021\/acs.jcim.6c00780","relation":{},"ISSN":["1549-9596","1549-960X"],"issn-type":[{"value":"1549-9596","type":"print"},{"value":"1549-960X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,5,6]]}}}