{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,8,13]],"date-time":"2026-08-13T13:34:23Z","timestamp":1786628063384,"version":"build-2736575974"},"reference-count":60,"publisher":"American Chemical Society (ACS)","issue":"32","license":[{"start":{"date-parts":[[2026,7,30]],"date-time":"2026-07-30T00:00:00Z","timestamp":1785369600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,7,30]],"date-time":"2026-07-30T00:00:00Z","timestamp":1785369600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"},{"start":{"date-parts":[[2026,7,30]],"date-time":"2026-07-30T00:00:00Z","timestamp":1785369600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-045"}],"funder":[{"DOI":"10.13039\/100000183","name":"Army Research Office","doi-asserted-by":"publisher","award":["W911NF-22-2-0170"],"award-info":[{"award-number":["W911NF-22-2-0170"]}],"id":[{"id":"10.13039\/100000183","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2026,8,13]]},"abstract":"<jats:title>Abstract<\/jats:title>\n                  <jats:p>Accurate predictions of the Hamaker constants, A, of a broad range of solid materials can be obtained from both the distributions of the deflections at first contact, dc, and the pull-off deflections, dPO, determined via atomic force microscopy (AFM). Using a model that describes both the attractive van der Waals (vdW) forces and the repulsive steric interactions between a sphere (AFM probe) and a substrate with arbitrary surface roughness, the comparison of model-predicted and experimentally obtained deflection distributions yields unique pairs of A and the effective diameters, \u03c3, of the materials comprising the AFM probe and substrate. Four different AFM probes were contacted against five different substrates to determine the dc- and dPO-distributions from experimental AFM deflection-distance (DD) curves. AFM image scans were obtained along each substrate in the vicinity of where the DD curves were collected in order to generate the model-predicted dc- and dPO-distributions. The difference between the model-predicted and experimental distributions was quantified with the Wasserstein distance, which yielded best estimates of A and \u03c3, along with meaningful asymmetric error estimates of both parameters. The obtained values of the self-Hamaker constants for several solid materials are in good agreement with the Lifshitz theory predictions. The estimated values of \u03c3 are consistent with the corresponding atomic sizes appearing in the literature. The model that incorporates both the attractive vdW and repulsive steric interactions also indicates that dynamic effects are negligible for dPO and give rise to similar relative changes of dc that were observed in previous studies.<\/jats:p>","DOI":"10.1021\/acs.jpca.6c02285","type":"journal-article","created":{"date-parts":[[2026,8,4]],"date-time":"2026-08-04T13:20:58Z","timestamp":1785849658000},"page":"6452-6464","source":"Crossref","is-referenced-by-count":0,"title":["Experimental Validation of a New Method for Estimating\nthe Hamaker Constants of Solid Materials via Atomic Force Microscopy:\nUtilizing Both Approach-to-Contact and Pull-Off Deflections"],"prefix":"10.1021","volume":"130","author":[{"given":"Juan M.","family":"Vazquez","sequence":"first","affiliation":[{"name":"Purdue University , , , ,","place":["West Lafayette, Indiana, United States, 47907-2100"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Lucas G.","family":"Ellis","sequence":"additional","affiliation":[{"name":"Purdue University , , , ,","place":["West Lafayette, Indiana, United States, 47907-2100"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Stephen P.","family":"Beaudoin","sequence":"additional","affiliation":[{"name":"Purdue University , , , ,","place":["West Lafayette, Indiana, United States, 47907-2100"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3289-3926","authenticated-orcid":true,"given":"David S.","family":"Corti","sequence":"additional","affiliation":[{"name":"Purdue University , , , ,","place":["West Lafayette, Indiana, United States, 47907-2100"]}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"316","published-online":{"date-parts":[[2026,7,30]]},"reference":[{"issue":"9","key":"2026081308270695700_cit1","doi-asserted-by":"publisher","first-page":"2208","DOI":"10.1149\/1.2114320","article-title":"An Analysis\nof Particle Adhesion on Semiconductor Surfaces","volume":"132","author":"Bowling","year":"1985","journal-title":"J. Electrochem. Soc."},{"key":"2026081308270695700_cit2","first-page":"1","article-title":"Force Measurements with the\nAtomic Force Microscope: Technique, Interpretation and Applications","volume-title":"Surface Science Reports","author":"Butt","year":"2005"},{"issue":"4","key":"2026081308270695700_cit3","doi-asserted-by":"publisher","first-page":"331","DOI":"10.1016\/0001-8686(72)85001-2","article-title":"On Hamaker\nConstants: A Comparison between Hamaker Constants and Lifshitz-van\nDer Waals Constants","volume":"3","author":"Visser","year":"1972","journal-title":"Adv. Colloid Interface\nSci."},{"issue":"1\u20132","key":"2026081308270695700_cit4","doi-asserted-by":"publisher","first-page":"77","DOI":"10.1016\/j.ijpharm.2004.05.001","article-title":"Interparticle van Der\nWaals Force in Powder Flowability and Compactibility","volume":"280","author":"Li","year":"2004","journal-title":"Int. J. Pharm."},{"issue":"2","key":"2026081308270695700_cit5","doi-asserted-by":"publisher","first-page":"111","DOI":"10.1016\/0001-8686(67)80004-6","article-title":"Particle Adhesion\nTheory and Experiment","volume":"1","author":"Krupp","year":"1967","journal-title":"Adv. Colloid Interface\nSci."},{"key":"2026081308270695700_cit6","doi-asserted-by":"crossref","DOI":"10.1017\/CBO9780511614606","volume-title":"Van Der Waals Forces","author":"Parsegian","year":"2005"},{"issue":"2","key":"2026081308270695700_cit7","doi-asserted-by":"publisher","first-page":"209","DOI":"10.1016\/j.cep.2004.03.014","article-title":"Food Powder Handling and Processing: Industry Problems,\nKnowledge Barriers and Research Opportunities","volume":"44","author":"Fitzpatrick","year":"2005","journal-title":"Chemical Engineering and Processing: Process Intensification"},{"key":"2026081308270695700_cit8","doi-asserted-by":"crossref","DOI":"10.1007\/978-94-017-0546-2","volume-title":"The Science and Engineering of Granulation\nProcesses","author":"Litster","year":"2004"},{"key":"2026081308270695700_cit9","doi-asserted-by":"crossref","DOI":"10.1533\/9780857098672","volume-title":"Handbook of Food Powders","author":"Bhandari","year":"2013"},{"issue":"10","key":"2026081308270695700_cit10","doi-asserted-by":"publisher","first-page":"1058","DOI":"10.1016\/S0031-8914(37)80203-7","article-title":"The London\u2500van\nDer Waals Attraction between Spherical Particles","volume":"4","author":"Hamaker","year":"1937","journal-title":"Physica"},{"issue":"10","key":"2026081308270695700_cit11","doi-asserted-by":"publisher","first-page":"12773","DOI":"10.3390\/ijms131012773","article-title":"Theoretical\nModels for Surface Forces and Adhesion and Their Measurement Using\nAtomic Force Microscopy","volume":"13","author":"Leite","year":"2012","journal-title":"Int. J. Mol. Sci."},{"key":"2026081308270695700_cit12","doi-asserted-by":"crossref","first-page":"329","DOI":"10.1016\/B978-0-08-036364-6.50031-4","article-title":"The Theory of\nMolecular Attractive Forces between Solids","volume-title":"Perspectives in Theoretical Physics","author":"Lifshitz","year":"1992"},{"key":"2026081308270695700_cit13","volume-title":"Intermolecular\nand Surface Forces","author":"Israelachvili","year":"1995","edition":"2"},{"issue":"4","key":"2026081308270695700_cit14","doi-asserted-by":"publisher","first-page":"251","DOI":"10.1071\/CH06222","article-title":"Optical Properties\nand van Der Waals - London Dispersion Interactions of Polystyrene\nDetermined by Vacuum Ultraviolet Spectroscopy and Spectroscopic Ellipsometry","volume":"60","author":"French","year":"2007","journal-title":"Aust. J. Chem."},{"issue":"4","key":"2026081308270695700_cit15","doi-asserted-by":"publisher","first-page":"470","DOI":"10.1080\/01932691003756738","article-title":"Hamaker 2: A Toolkit\nfor the Calculation of Particle Interactions and Suspension Stability\nand Its Application to Mullite Synthesis by Colloidal Methods","volume":"32","author":"Aschauer","year":"2011","journal-title":"J. Dispers. Sci. Technol."},{"key":"2026081308270695700_cit16","doi-asserted-by":"publisher","first-page":"13","DOI":"10.1016\/0167-2738(94)00217-G","article-title":"Full Spectral\nCalculation\nof Non-Retarded Hamaker Constants for Ceramic Systems from Interband\nTransition Strengths","volume":"75","author":"French","year":"1995","journal-title":"Solid State Ion"},{"issue":"1\u20133","key":"2026081308270695700_cit17","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1016\/S0167-5729(99)00003-5","article-title":"Force-Distance Curves\nby Atomic Force Microscopy","volume":"34","author":"Cappella","year":"1999","journal-title":"Surf. Sci. Rep."},{"issue":"7","key":"2026081308270695700_cit18","doi-asserted-by":"publisher","first-page":"1831","DOI":"10.1021\/la00043a024","article-title":"Measurement\nof Forces in Liquids\nUsing a Force Microscope","volume":"8","author":"Ducker","year":"1992","journal-title":"Langmuir"},{"issue":"12","key":"2026081308270695700_cit19","doi-asserted-by":"publisher","first-page":"8065","DOI":"10.1103\/PhysRevB.53.8065","article-title":"Identification\nof Electrostatic and van Der Waals Interaction Forces between a Micrometer-Size\nSphere and a Flat Substrate","volume":"53","author":"Gady","year":"1996","journal-title":"Phys. Rev. B"},{"issue":"19","key":"2026081308270695700_cit20","doi-asserted-by":"publisher","first-page":"9371","DOI":"10.1021\/acs.jpcc.3c01623","article-title":"Toward\nan Improved Method for Determining\nthe Hamaker Constant of Solid Materials Using Atomic Force Microscopy.\nIII: Experimental Validation of a New Approach-to-Contact Method","volume":"127","author":"Stevenson","year":"2023","journal-title":"The Journal of Physical Chemistry C"},{"issue":"3","key":"2026081308270695700_cit21","doi-asserted-by":"publisher","first-page":"714","DOI":"10.1021\/acs.langmuir.6b04063","article-title":"A New \u201cQuasi-Dynamic\u201d\nMethod for Determining the Hamaker Constant of Solids Using an Atomic\nForce Microscope","volume":"33","author":"Fronczak","year":"2017","journal-title":"Langmuir"},{"key":"2026081308270695700_cit22","doi-asserted-by":"publisher","first-page":"118877","DOI":"10.1016\/j.powtec.2023.118877","article-title":"Numerical\nModeling of Van Der Waals Interaction between a Spherical\nParticle and Rough Surfaces with Different Planar Asperity Distributions","volume":"428","author":"Zhang","year":"2023","journal-title":"Powder Technol."},{"issue":"2","key":"2026081308270695700_cit23","doi-asserted-by":"publisher","first-page":"284","DOI":"10.1006\/jcis.2000.7276","article-title":"Simulation\nof the Adhesion of Particles\nto Surfaces","volume":"234","author":"Cooper","year":"2001","journal-title":"J. Colloid Interface Sci."},{"issue":"47","key":"2026081308270695700_cit24","doi-asserted-by":"publisher","first-page":"24808","DOI":"10.1021\/acs.langmuir.4c02516","article-title":"The Effects of Short-Range\nIntermolecular Repulsive Forces on Hamaker Constant Estimation Using\nAtomic Force Microscopy","volume":"40","author":"Vazquez","year":"2024","journal-title":"Langmuir"},{"issue":"5","key":"2026081308270695700_cit25","doi-asserted-by":"publisher","first-page":"3014","DOI":"10.1021\/acs.jpcc.9b09669","article-title":"Toward\nan Improved Method for Determining\nthe Hamaker Constant of Solid Materials Using Atomic Force Microscopy.\nI. Quasi-Static Analysis for Arbitrary Surface Roughness","volume":"124","author":"Stevenson","year":"2020","journal-title":"The Journal of Physical Chemistry C"},{"issue":"1","key":"2026081308270695700_cit26","doi-asserted-by":"publisher","first-page":"2200411","DOI":"10.1002\/admt.202200411","article-title":"AFM-Based Hamaker Constant Determination\nwith Blind\nTip Reconstruction","volume":"8","author":"Ku","year":"2023","journal-title":"Adv. Mater. Technol."},{"key":"2026081308270695700_cit27","unstructured":"MacKay, D. J. C.\n          \n          Information\nTheory, Inference and Learning Algorithms, Version 7.2; Cambridge University Press, 2005."},{"issue":"1","key":"2026081308270695700_cit28","doi-asserted-by":"publisher","first-page":"2252","DOI":"10.1214\/22-EJS2001","article-title":"Minimax Confidence\nIntervals for\nthe Sliced Wasserstein Distance","volume":"16","author":"Manole","year":"2022","journal-title":"Electron. J.\nStat."},{"issue":"9","key":"2026081308270695700_cit29","doi-asserted-by":"publisher","first-page":"871","DOI":"10.1023\/A:1011625728803","article-title":"Van Der\nWaals Radii of Elements","volume":"37","author":"Batsanov","year":"2001","journal-title":"Inorg. Mater."},{"key":"2026081308270695700_cit30","doi-asserted-by":"publisher","first-page":"88","DOI":"10.1016\/j.powtec.2015.11.057","article-title":"Modeling Adhesive\nForce Distributions on Highly Rough\nSurfaces","volume":"289","author":"Fritzsche","year":"2016","journal-title":"Powder Technol."},{"issue":"1","key":"2026081308270695700_cit31","doi-asserted-by":"publisher","first-page":"63","DOI":"10.1006\/jcis.1999.6561","article-title":"Analysis of\nContact\nInteractions between a Rough Deformable Colloid and a Smooth Substrate","volume":"222","author":"Cooper","year":"2000","journal-title":"J. Colloid Interface Sci."},{"key":"2026081308270695700_cit32","doi-asserted-by":"publisher","first-page":"113876","DOI":"10.1016\/j.fluid.2023.113876","article-title":"On the History of Key Empirical Intermolecular Potentials","volume":"573","author":"Fischer","year":"2023","journal-title":"Fluid Phase Equilib."},{"issue":"30","key":"2026081308270695700_cit33","doi-asserted-by":"publisher","first-page":"20041","DOI":"10.1021\/acs.langmuir.5c02182","article-title":"The Effects of Sample\nTilt on Atomic Force Microscopy Deflections","volume":"41","author":"Vazquez","year":"2025","journal-title":"Langmuir"},{"issue":"36","key":"2026081308270695700_cit34","doi-asserted-by":"publisher","first-page":"20003","DOI":"10.1021\/acs.jpcc.1c05052","article-title":"Toward an Improved Method for Determining\nthe Hamaker Constant of Solid Materials Using Atomic Force Microscopy.\nII. Dynamic Analysis and Preliminary Validation","volume":"125","author":"Stevenson","year":"2021","journal-title":"The Journal of Physical Chemistry C"},{"issue":"11","key":"2026081308270695700_cit35","doi-asserted-by":"publisher","first-page":"P488","DOI":"10.1149\/2.025311jss","article-title":"Effects of Coating\nThickness on Particle\nAdhesion in Microelectronics-Based Systems","volume":"2","author":"Smith","year":"2013","journal-title":"ECS J. Solid State Sci. Technol."},{"issue":"4","key":"2026081308270695700_cit36","doi-asserted-by":"publisher","first-page":"201","DOI":"10.1016\/j.surfrep.2006.04.001","article-title":"Contact\nMechanics for Randomly Rough Surfaces","volume":"61","author":"Persson","year":"2006","journal-title":"Surf.\nSci. Rep."},{"issue":"7","key":"2026081308270695700_cit37","doi-asserted-by":"publisher","first-page":"2157","DOI":"10.1088\/0034-4885\/69\/7\/R03","article-title":"Physics of Adhesion","volume":"69","author":"Gerberich","year":"2006","journal-title":"Rep. Prog.\nPhys."},{"issue":"14","key":"2026081308270695700_cit38","doi-asserted-by":"publisher","first-page":"4322","DOI":"10.1021\/la010086p","article-title":"Interaction\nand Deformation of Viscoelastic Particles. 2. Adhesive Particles","volume":"17","author":"Attard","year":"2001","journal-title":"Langmuir"},{"issue":"1","key":"2026081308270695700_cit39","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1088\/0957-4484\/6\/1\/001","article-title":"Calculation of Thermal Noise in Atomic Force Microscopy","volume":"6","author":"Butt","year":"1995","journal-title":"Nanotechnology"},{"issue":"10","key":"2026081308270695700_cit40","doi-asserted-by":"publisher","first-page":"103705","DOI":"10.1063\/1.4757398","article-title":"Spring Constant Calibration of Atomic Force Microscope\nCantilevers of Arbitrary Shape","volume":"83","author":"Sader","year":"2012","journal-title":"Rev. Sci. Instrum."},{"issue":"7","key":"2026081308270695700_cit41","doi-asserted-by":"publisher","first-page":"676","DOI":"10.1038\/nmeth.2019","article-title":"Fiji: An Open-Source\nPlatform for Biological-Image Analysis","volume":"9","author":"Schindelin","year":"2012","journal-title":"Nat.\nMethods"},{"issue":"4","key":"2026081308270695700_cit42","doi-asserted-by":"publisher","first-page":"22","DOI":"10.1093\/mictod\/qaad055","article-title":"How to Choose the Right AFM Probe\nfor Your Experiment","volume":"31","author":"Ted Limpoco","year":"2023","journal-title":"Microsc. Today"},{"issue":"6\u20138","key":"2026081308270695700_cit43","doi-asserted-by":"publisher","first-page":"197","DOI":"10.1016\/S0167-5729(02)00077-8","article-title":"Dynamic Atomic\nForce Microscopy Methods","volume":"47","author":"Garci\u0301a","year":"2002","journal-title":"Surf. Sci. Rep."},{"key":"2026081308270695700_cit44","doi-asserted-by":"publisher","first-page":"131","DOI":"10.1016\/j.colsurfb.2015.06.044","article-title":"Application of the\nJohnson\u2013Kendall\u2013Roberts Model in AFM-Based Mechanical\nMeasurements on Cells and Gel","volume":"134","author":"Efremov","year":"2015","journal-title":"Colloids Surf.\nB Biointerfaces"},{"issue":"9","key":"2026081308270695700_cit45","doi-asserted-by":"publisher","first-page":"094507","DOI":"10.1115\/1.3194752","article-title":"Measuring Viscoelasticity\nof Soft Samples Using Atomic\nForce Microscopy","volume":"131","author":"Tripathy","year":"2009","journal-title":"J. Biomech. Eng."},{"key":"2026081308270695700_cit46","doi-asserted-by":"publisher","first-page":"213","DOI":"10.1016\/j.jcis.2018.01.108","article-title":"Non-Contact\nAFM Measurement of the Hamaker Constants of Solids: Calibrating Cantilever\nGeometries","volume":"517","author":"Fronczak","year":"2018","journal-title":"J. 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Colloid Interface Sci."},{"issue":"1","key":"2026081308270695700_cit52","doi-asserted-by":"publisher","first-page":"285","DOI":"10.1016\/0021-9797(81)90325-8","article-title":"Spectroscopic Parameters for Computation\nof van Der\nWaals Forces","volume":"81","author":"Parsegian","year":"1981","journal-title":"J. Colloid Interface Sci."},{"issue":"2","key":"2026081308270695700_cit53","doi-asserted-by":"publisher","first-page":"177","DOI":"10.1006\/jcis.1997.5216","article-title":"Direct Measurement\nof the Effect of Surface Roughness\non the Colloidal Forces between a Particle and Flat Plate","volume":"196","author":"Suresh","year":"1997","journal-title":"J. Colloid Interface Sci."},{"issue":"1","key":"2026081308270695700_cit54","doi-asserted-by":"publisher","first-page":"25","DOI":"10.1016\/0021-9797(80)90491-9","article-title":"Attenuation of the van Der Waals Attraction Energy\nin the Medium System Due to the Roughness of the Particle Surface","volume":"78","author":"Czarnecki","year":"1980","journal-title":"J. Colloid Interface Sci."},{"key":"2026081308270695700_cit55","unstructured":"The Engineering Toolbox.\n          . Young\u2019s Modulus\nof Elasticity\n\u2013 Values for Common Materials. https:\/\/www.engineeringtoolbox.com\/young-modulus-d_417.html (accessed Feb 4, 2025)."},{"key":"2026081308270695700_cit56","unstructured":"Ted Pella Inc.\n          . Properties & Chemical Composition of Mica Grade\nV1 Grade Classification of Muscovite Mica. https:\/\/www.tedpella.com\/vacuum_html\/Mica_Grade_V1_Properties.aspx (accessed Feb 4, 2025)."},{"issue":"11","key":"2026081308270695700_cit57","doi-asserted-by":"publisher","first-page":"1333","DOI":"10.1163\/156856194X00645","article-title":"Mechanics\nof Particle Adhesion","volume":"8","author":"Rimai","year":"1994","journal-title":"J. Adhes. Sci. Technol."},{"key":"2026081308270695700_cit58","volume-title":"Advanced Engineering\nMathematics","author":"Zill","year":"2018"},{"issue":"9","key":"2026081308270695700_cit59","doi-asserted-by":"publisher","first-page":"1077","DOI":"10.1002\/jcc.540140909","article-title":"New Combining Rules\nfor Rare Gas van Der Waals Parameters","volume":"14","author":"Waldman","year":"1993","journal-title":"J. Comput.\nChem."},{"issue":"1","key":"2026081308270695700_cit60","doi-asserted-by":"publisher","first-page":"17","DOI":"10.1006\/jcis.2000.7168","article-title":"Adhesion\nbetween Nanoscale Rough Surfaces: II. Measurement and Comparison with\nTheory","volume":"232","author":"Rabinovich","year":"2000","journal-title":"J. Colloid Interface Sci."}],"container-title":["The Journal\nof Physical Chemistry A"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/pubs.acs.org\/doi\/pdf\/10.1021\/acs.jpca.6c02285","content-type":"application\/pdf","content-version":"vor","intended-application":"unspecified"},{"URL":"https:\/\/pubs.acs.org\/jpcafh\/article-pdf\/130\/32\/6452\/66335677\/acs.jpca.6c02285.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"syndication"},{"URL":"https:\/\/pubs.acs.org\/jpcafh\/article-pdf\/130\/32\/6452\/66335677\/acs.jpca.6c02285.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,8,13]],"date-time":"2026-08-13T12:53:41Z","timestamp":1786625621000},"score":1,"resource":{"primary":{"URL":"https:\/\/pubs.acs.org\/jpcafh\/article\/130\/32\/6452\/5237083\/Experimental-Validation-of-a-New-Method-for"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,7,30]]},"references-count":60,"journal-issue":{"issue":"32","published-online":{"date-parts":[[2026,7,30]]},"published-print":{"date-parts":[[2026,8,13]]}},"URL":"https:\/\/doi.org\/10.1021\/acs.jpca.6c02285","relation":{},"ISSN":["1089-5639","1520-5215"],"issn-type":[{"value":"1089-5639","type":"print"},{"value":"1520-5215","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,7,30]]}}}