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In this paper, a method for recording transient images using ASOPS is presented based on time-gated integration of the transient signal. This technique allows diffraction-limited pump-probe microscopy images to be rapidly collected at precise, user-specified time delays, with approximately 15 picoseconds time resolution. Results are presented for the excited-state dynamics in multilayered WSe2 flakes, charge-carrier diffusion in a silicon wafer, and images of Au nanoparticle arrays that demonstrate the spatial\/temporal resolution and sensitivity of the technique. 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