{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,10,17]],"date-time":"2026-10-17T15:12:24Z","timestamp":1792249944033,"version":"4.4.0"},"reference-count":40,"publisher":"American Chemical Society (ACS)","issue":"8","license":[{"start":{"date-parts":[[2023,2,13]],"date-time":"2023-02-13T00:00:00Z","timestamp":1676246400000},"content-version":"unspecified","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100001659","name":"Deutsche Forschungsgemeinschaft","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001659","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["ACS Omega"],"published-print":{"date-parts":[[2023,2,28]]},"DOI":"10.1021\/acsomega.2c06869","type":"journal-article","created":{"date-parts":[[2023,2,14]],"date-time":"2023-02-14T02:22:16Z","timestamp":1676341336000},"page":"7555-7565","source":"Crossref","is-referenced-by-count":6,"title":["Increasing the Strain Resistance of Si\/SiO\n                    <sub>2<\/sub>\n                    Interfaces for Flexible Electronics"],"prefix":"10.1021","volume":"8","author":[{"given":"Tahereh","family":"Mohammadi Hafshejani","sequence":"first","affiliation":[{"name":"Institut f\u00fcr Funktionelle Grenzfl\u00e4chen, Karlsruher Institut f\u00fcr Technologie, Hermann-von Helmholtz-Platz 1, 76344Eggenstein-Leopoldshafen, Deutschland"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ammar","family":"Mahmood","sequence":"additional","affiliation":[{"name":"Institut f\u00fcr Massivbau und Baustofftechnologie, Abteilung Modellierung und Simulation, Karlsruher Institut f\u00fcr Technologie, Gotthard-Franz-Str. 3, 76131Karlsruhe, Deutschland"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jonas","family":"Wohlgemuth","sequence":"additional","affiliation":[{"name":"Institut f\u00fcr Funktionelle Grenzfl\u00e4chen, Karlsruher Institut f\u00fcr Technologie, Hermann-von Helmholtz-Platz 1, 76344Eggenstein-Leopoldshafen, Deutschland"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3150-8723","authenticated-orcid":true,"given":"Meike","family":"Koenig","sequence":"additional","affiliation":[{"name":"Institut f\u00fcr Funktionelle Grenzfl\u00e4chen, Karlsruher Institut f\u00fcr Technologie, Hermann-von Helmholtz-Platz 1, 76344Eggenstein-Leopoldshafen, Deutschland"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4353-841X","authenticated-orcid":true,"given":"Roberto C.","family":"Longo","sequence":"additional","affiliation":[{"name":"Tokyo Electron America, Inc., 2400 Grove Blvd., Austin, Texas78741, United States"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7072-4109","authenticated-orcid":true,"given":"Peter","family":"Thissen","sequence":"additional","affiliation":[{"name":"Institut f\u00fcr Funktionelle Grenzfl\u00e4chen, Karlsruher Institut f\u00fcr Technologie, Hermann-von Helmholtz-Platz 1, 76344Eggenstein-Leopoldshafen, Deutschland"},{"name":"Institut f\u00fcr Massivbau und Baustofftechnologie, Abteilung Modellierung und Simulation, Karlsruher Institut f\u00fcr Technologie, Gotthard-Franz-Str. 3, 76131Karlsruhe, Deutschland"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"316","published-online":{"date-parts":[[2023,2,14]]},"reference":[{"key":"ref1\/cit1","doi-asserted-by":"publisher","DOI":"10.1016\/j.progsurf.2012.10.003"},{"key":"ref2\/cit2","doi-asserted-by":"publisher","DOI":"10.1088\/0034-4885\/57\/8\/002"},{"key":"ref3\/cit3","doi-asserted-by":"publisher","DOI":"10.1038\/nmat2611"},{"key":"ref4\/cit4","doi-asserted-by":"publisher","DOI":"10.1021\/es303012r"},{"key":"ref5\/cit5","doi-asserted-by":"publisher","DOI":"10.1021\/acs.accounts.8b00500"},{"key":"ref6\/cit6","doi-asserted-by":"publisher","DOI":"10.1021\/acs.jpcc.8b08146"},{"key":"ref7\/cit7","doi-asserted-by":"publisher","DOI":"10.1021\/acs.langmuir.9b03037"},{"key":"ref8\/cit8","doi-asserted-by":"publisher","DOI":"10.1021\/acs.jpcc.8b02545"},{"key":"ref9\/cit9","doi-asserted-by":"crossref","unstructured":"Endler, S.; Hoang, T.; Angelopoulos, E. A.; Rempp, H.; Harendt, C.; Burghart, J. N.\n                      In Mechanical Characterisation of Ultra-Thin Chips\n                      , 2011 Semiconductor Conference Dresden, 27\u201328 Sept. 2011; 2011; pp. 1\u20134.","DOI":"10.1109\/SCD.2011.6068727"},{"key":"ref10\/cit10","doi-asserted-by":"publisher","DOI":"10.1016\/j.optmat.2013.12.049"},{"key":"ref11\/cit11","doi-asserted-by":"publisher","DOI":"10.1021\/acsaelm.0c00856"},{"key":"ref12\/cit12","doi-asserted-by":"publisher","DOI":"10.1002\/chem.201705974"},{"key":"ref13\/cit13","doi-asserted-by":"publisher","DOI":"10.1021\/ja300270w"},{"key":"ref14\/cit14","doi-asserted-by":"publisher","DOI":"10.1016\/j.apsusc.2013.06.113"},{"key":"ref15\/cit15","doi-asserted-by":"publisher","DOI":"10.1021\/acs.jpcc.8b11920"},{"key":"ref16\/cit16","doi-asserted-by":"publisher","DOI":"10.1021\/acs.jpcc.1c06309"},{"key":"ref17\/cit17","doi-asserted-by":"publisher","DOI":"10.1177\/002199832095215"},{"key":"ref18\/cit18","doi-asserted-by":"publisher","DOI":"10.1016\/j.electacta.2008.05.070"},{"key":"ref19\/cit19","doi-asserted-by":"publisher","DOI":"10.1021\/la063488b"},{"key":"ref20\/cit20","first-page":"440","volume":"105","author":"Theron C.","year":"2009","journal-title":"S. Afr. J. Sci."},{"key":"ref21\/cit21","doi-asserted-by":"publisher","DOI":"10.1149\/1.2425806"},{"key":"ref22\/cit22","doi-asserted-by":"publisher","DOI":"10.1002\/cphc.201800214"},{"key":"ref23\/cit23","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.54.11169"},{"key":"ref24\/cit24","doi-asserted-by":"publisher","DOI":"10.1002\/jcc.23096"},{"key":"ref25\/cit25","doi-asserted-by":"publisher","DOI":"10.1016\/j.cpc.2012.02.017"},{"key":"ref26\/cit26","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.59.1758"},{"key":"ref27\/cit27","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.13.5188"},{"key":"ref28\/cit28","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.77.3865"},{"key":"ref29\/cit29","doi-asserted-by":"publisher","DOI":"10.1063\/1.3382344"},{"key":"ref30\/cit30","doi-asserted-by":"publisher","DOI":"10.1002\/jcc.21759"},{"key":"ref31\/cit31","doi-asserted-by":"publisher","DOI":"10.1063\/1.1713945"},{"key":"ref32\/cit32","doi-asserted-by":"publisher","DOI":"10.1063\/1.1644030"},{"key":"ref33\/cit33","doi-asserted-by":"publisher","DOI":"10.1039\/C6CP00602G"},{"key":"ref34\/cit34","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-018-28925-6"},{"key":"ref35\/cit35","doi-asserted-by":"publisher","DOI":"10.1016\/S0921-4526(00)00475-0"},{"key":"ref36\/cit36","doi-asserted-by":"publisher","DOI":"10.1021\/la903212c"},{"key":"ref37\/cit37","doi-asserted-by":"publisher","DOI":"10.1021\/la904597c"},{"key":"ref38\/cit38","doi-asserted-by":"publisher","DOI":"10.1021\/acsami.6b13276"},{"key":"ref39\/cit39","first-page":"86","volume":"2000","author":"Coletti G.","year":"2006","journal-title":"a, a"},{"key":"ref40\/cit40","doi-asserted-by":"publisher","DOI":"10.1016\/0921-5093(93)90337-E"}],"container-title":["ACS Omega"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/pubs.acs.org\/doi\/pdf\/10.1021\/acsomega.2c06869","content-type":"application\/pdf","content-version":"vor","intended-application":"unspecified"},{"URL":"https:\/\/pubs.acs.org\/doi\/pdf\/10.1021\/acsomega.2c06869","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,3,5]],"date-time":"2023-03-05T04:02:30Z","timestamp":1677988950000},"score":1,"resource":{"primary":{"URL":"https:\/\/pubs.acs.org\/doi\/10.1021\/acsomega.2c06869"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,2,14]]},"references-count":40,"journal-issue":{"issue":"8","published-print":{"date-parts":[[2023,2,28]]}},"alternative-id":["10.1021\/acsomega.2c06869"],"URL":"https:\/\/doi.org\/10.1021\/acsomega.2c06869","relation":{},"ISSN":["2470-1343","2470-1343"],"issn-type":[{"value":"2470-1343","type":"print"},{"value":"2470-1343","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,2,14]]}}}