{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,24]],"date-time":"2026-03-24T03:37:43Z","timestamp":1774323463418,"version":"3.50.1"},"reference-count":26,"publisher":"American Chemical Society (ACS)","issue":"47","license":[{"start":{"date-parts":[[2021,11,17]],"date-time":"2021-11-17T00:00:00Z","timestamp":1637107200000},"content-version":"unspecified","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"funder":[{"DOI":"10.13039\/100012818","name":"Comunidad de Madrid","doi-asserted-by":"publisher","award":["P2018\/NMT4349"],"award-info":[{"award-number":["P2018\/NMT4349"]}],"id":[{"id":"10.13039\/100012818","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100012818","name":"Comunidad de Madrid","doi-asserted-by":"publisher","award":["S2013\/ICE2822"],"award-info":[{"award-number":["S2013\/ICE2822"]}],"id":[{"id":"10.13039\/100012818","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003329","name":"Ministerio de Econom??a y Competitividad","doi-asserted-by":"publisher","award":["CTQ2017-84309-C2-2-R"],"award-info":[{"award-number":["CTQ2017-84309-C2-2-R"]}],"id":[{"id":"10.13039\/501100003329","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003329","name":"Ministerio de Econom??a y Competitividad","doi-asserted-by":"publisher","award":["RYC-2015-18047"],"award-info":[{"award-number":["RYC-2015-18047"]}],"id":[{"id":"10.13039\/501100003329","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004593","name":"Universidad Aut??noma de Madrid","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100004593","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["ACS Appl. Mater. Interfaces"],"published-print":{"date-parts":[[2021,12,1]]},"DOI":"10.1021\/acsami.1c17578","type":"journal-article","created":{"date-parts":[[2021,11,17]],"date-time":"2021-11-17T15:29:03Z","timestamp":1637162943000},"page":"56655-56662","source":"Crossref","is-referenced-by-count":9,"title":["Comprehensive Model for the Transformation of Zinc Nitride Metastable Layers"],"prefix":"10.1021","volume":"13","author":[{"given":"Andrea","family":"Ropero-Real","sequence":"first","affiliation":[{"name":"Electronics and Semiconductors Group, Departamento de F\u00edsica Aplicada, Universidad Aut\u00f3noma de Madrid, 28049 Madrid, Spain"}]},{"given":"Nuria","family":"Gordillo","sequence":"additional","affiliation":[{"name":"Electronics and Semiconductors Group, Departamento de F\u00edsica Aplicada, Universidad Aut\u00f3noma de Madrid, 28049 Madrid, Spain"},{"name":"Centro de Microan\u00e1lisis de Materiales, Universidad Aut\u00f3noma de Madrid, 28049 Madrid, Spain"},{"name":"Instituto Nicol\u00e1s Cabrera, Universidad Aut\u00f3noma de Madrid, 28049 Madrid, Spain"}]},{"given":"Jose Luis","family":"Pau","sequence":"additional","affiliation":[{"name":"Electronics and Semiconductors Group, Departamento de F\u00edsica Aplicada, Universidad Aut\u00f3noma de Madrid, 28049 Madrid, Spain"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9981-6645","authenticated-orcid":true,"given":"Andr\u00e9s","family":"Redondo-Cubero","sequence":"additional","affiliation":[{"name":"Electronics and Semiconductors Group, Departamento de F\u00edsica Aplicada, Universidad Aut\u00f3noma de Madrid, 28049 Madrid, Spain"},{"name":"Centro de Microan\u00e1lisis de Materiales, Universidad Aut\u00f3noma de Madrid, 28049 Madrid, Spain"},{"name":"Instituto Nicol\u00e1s Cabrera, Universidad Aut\u00f3noma de Madrid, 28049 Madrid, Spain"}]}],"member":"316","published-online":{"date-parts":[[2021,11,17]]},"reference":[{"key":"ref1\/cit1","doi-asserted-by":"publisher","DOI":"10.1126\/sciadv.1600225"},{"key":"ref2\/cit2","doi-asserted-by":"publisher","DOI":"10.1021\/acs.chemmater.7b03980"},{"key":"ref3\/cit3","doi-asserted-by":"publisher","DOI":"10.1016\/S0040-6090(97)00910-3"},{"key":"ref4\/cit4","doi-asserted-by":"crossref","unstructured":"Redondo-Cubero, A.; G\u00f3mez-Casta\u00f1o, M.; Garc\u00eda N\u00fa\u00f1ez, C.; Dom\u00ednguez, M.; V\u00e1zquez, L.; Pau, J. L. In  Zinc Nitride Thin Films: Basic Properties and Applications, Proceedings of SPIE-The International Society for Optical Engineering. Society of Photo-optical Instrumentation Engineers (SPIE), 2017; pp 10105\u201310106.","DOI":"10.1117\/12.2253044"},{"key":"ref5\/cit5","doi-asserted-by":"publisher","DOI":"10.1088\/0022-3727\/45\/13\/135101"},{"key":"ref6\/cit6","doi-asserted-by":"publisher","DOI":"10.1063\/1.4968545"},{"key":"ref7\/cit7","doi-asserted-by":"publisher","DOI":"10.1088\/0022-3727\/45\/4\/045402"},{"key":"ref8\/cit8","doi-asserted-by":"publisher","DOI":"10.1016\/j.spmi.2007.04.038"},{"key":"ref9\/cit9","doi-asserted-by":"publisher","DOI":"10.1021\/acsami.6b09805"},{"key":"ref10\/cit10","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2018.2797254"},{"key":"ref11\/cit11","doi-asserted-by":"publisher","DOI":"10.1063\/1.4767131"},{"key":"ref12\/cit12","doi-asserted-by":"publisher","DOI":"10.1186\/1556-276X-8-221"},{"key":"ref13\/cit13","doi-asserted-by":"publisher","DOI":"10.1039\/C4TC00403E"},{"key":"ref14\/cit14","doi-asserted-by":"publisher","DOI":"10.1038\/srep23940"},{"key":"ref15\/cit15","doi-asserted-by":"publisher","DOI":"10.1039\/C8CE00390D"},{"key":"ref16\/cit16","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6528\/aa57b1"},{"key":"ref17\/cit17","doi-asserted-by":"publisher","DOI":"10.1063\/1.5144054"},{"key":"ref18\/cit18","doi-asserted-by":"publisher","DOI":"10.1063\/1.3663859"},{"key":"ref19\/cit19","doi-asserted-by":"publisher","DOI":"10.1140\/epjp\/s13360-021-01085-9"},{"key":"ref20\/cit20","doi-asserted-by":"crossref","DOI":"10.1002\/9780470060193","volume-title":"Spectroscopic Ellipsometry: Principles and Applications","author":"Fujiwara H.","year":"2007"},{"key":"ref21\/cit21","doi-asserted-by":"publisher","DOI":"10.1063\/1.367101"},{"key":"ref22\/cit22","doi-asserted-by":"publisher","DOI":"10.1039\/C004532B"},{"key":"ref23\/cit23","doi-asserted-by":"publisher","DOI":"10.1249\/MSS.0b013e31821ece12"},{"key":"ref24\/cit24","doi-asserted-by":"publisher","DOI":"10.1109\/TITB.2009.2038484"},{"key":"ref25\/cit25","doi-asserted-by":"publisher","DOI":"10.1126\/scitranslmed.aaf2593"},{"key":"ref26\/cit26","doi-asserted-by":"publisher","DOI":"10.1038\/nature16521"}],"container-title":["ACS Applied Materials & Interfaces"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/pubs.acs.org\/doi\/pdf\/10.1021\/acsami.1c17578","content-type":"application\/pdf","content-version":"vor","intended-application":"unspecified"},{"URL":"https:\/\/pubs.acs.org\/doi\/pdf\/10.1021\/acsami.1c17578","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,4,25]],"date-time":"2023-04-25T15:32:12Z","timestamp":1682436732000},"score":1,"resource":{"primary":{"URL":"https:\/\/pubs.acs.org\/doi\/10.1021\/acsami.1c17578"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,11,17]]},"references-count":26,"journal-issue":{"issue":"47","published-print":{"date-parts":[[2021,12,1]]}},"alternative-id":["10.1021\/acsami.1c17578"],"URL":"https:\/\/doi.org\/10.1021\/acsami.1c17578","relation":{},"ISSN":["1944-8244","1944-8252"],"issn-type":[{"value":"1944-8244","type":"print"},{"value":"1944-8252","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021,11,17]]}}}