{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,26]],"date-time":"2026-02-26T16:23:50Z","timestamp":1772123030702,"version":"3.50.1"},"reference-count":77,"publisher":"American Chemical Society (ACS)","issue":"1","license":[{"start":{"date-parts":[[2023,12,19]],"date-time":"2023-12-19T00:00:00Z","timestamp":1702944000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,12,19]],"date-time":"2023-12-19T00:00:00Z","timestamp":1702944000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"},{"start":{"date-parts":[[2023,12,19]],"date-time":"2023-12-19T00:00:00Z","timestamp":1702944000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-045"}],"funder":[{"DOI":"10.13039\/501100008530","name":"European Regional Development Fund","doi-asserted-by":"publisher","award":["POCI-01-0247-FEDER-045939"],"award-info":[{"award-number":["POCI-01-0247-FEDER-045939"]}],"id":[{"id":"10.13039\/501100008530","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001871","name":"Funda??o para a Ci?ncia e a Tecnologia","doi-asserted-by":"publisher","award":["UIDB\/04650\/2020"],"award-info":[{"award-number":["UIDB\/04650\/2020"]}],"id":[{"id":"10.13039\/501100001871","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001871","name":"Funda??o para a Ci?ncia e a Tecnologia","doi-asserted-by":"publisher","award":["DRI\/India\/0664\/2020"],"award-info":[{"award-number":["DRI\/India\/0664\/2020"]}],"id":[{"id":"10.13039\/501100001871","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001871","name":"Funda??o para a Ci?ncia e a Tecnologia","doi-asserted-by":"publisher","award":["UIDB\/50022\/2020"],"award-info":[{"award-number":["UIDB\/50022\/2020"]}],"id":[{"id":"10.13039\/501100001871","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["ACS Appl. Mater. Interfaces"],"published-print":{"date-parts":[[2024,1,10]]},"DOI":"10.1021\/acsami.3c14215","type":"journal-article","created":{"date-parts":[[2023,12,19]],"date-time":"2023-12-19T16:06:16Z","timestamp":1703001976000},"page":"1767-1778","source":"Crossref","is-referenced-by-count":10,"title":["Bipolar Resistive Switching in 2D MoSe\n                    <sub>2<\/sub>\n                    Grown by Atmospheric Pressure Chemical Vapor Deposition"],"prefix":"10.1021","volume":"16","author":[{"given":"Jo\u00e3o","family":"Fernandes","sequence":"first","affiliation":[{"name":"International Iberian Nanotechnology Laboratory, 4715-330 Braga, Portugal"}]},{"given":"Justyna","family":"Grzonka","sequence":"additional","affiliation":[{"name":"International Iberian Nanotechnology Laboratory, 4715-330 Braga, Portugal"}]},{"given":"Guilherme","family":"Ara\u00fajo","sequence":"additional","affiliation":[{"name":"International Iberian Nanotechnology Laboratory, 4715-330 Braga, Portugal"}]},{"given":"Alejandro","family":"Schulman","sequence":"additional","affiliation":[{"name":"International Iberian Nanotechnology Laboratory, 4715-330 Braga, Portugal"},{"name":"Wihuri Physical Laboratory, Department of Physics and Astronomy, University of Turku, FI-20014 Turku, Finland"}]},{"given":"Vitor","family":"Silva","sequence":"additional","affiliation":[{"name":"International Iberian Nanotechnology Laboratory, 4715-330 Braga, Portugal"}]},{"given":"Jo\u00e3o","family":"Rodrigues","sequence":"additional","affiliation":[{"name":"International Iberian Nanotechnology Laboratory, 4715-330 Braga, Portugal"}]},{"given":"Jo\u00e3o","family":"Santos","sequence":"additional","affiliation":[{"name":"International Iberian Nanotechnology Laboratory, 4715-330 Braga, Portugal"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7380-8930","authenticated-orcid":true,"given":"Oleksandr","family":"Bondarchuk","sequence":"additional","affiliation":[{"name":"International Iberian Nanotechnology Laboratory, 4715-330 Braga, Portugal"}]},{"given":"Paulo","family":"Ferreira","sequence":"additional","affiliation":[{"name":"International Iberian Nanotechnology Laboratory, 4715-330 Braga, Portugal"},{"name":"Mechanical Engineering Department and IDMEC, Instituto Superior T\u00e9cnico, University of Lisbon, Av. Rovisco Pais, 1049-001 Lisboa, Portugal"},{"name":"Materials Science and Engineering Program, University of Texas at Austin, Austin, Texas 78712, United States"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9875-6188","authenticated-orcid":true,"given":"Pedro","family":"Alpuim","sequence":"additional","affiliation":[{"name":"International Iberian Nanotechnology Laboratory, 4715-330 Braga, Portugal"},{"name":"Centro de F\u00edsica das Universidades do Minho e do Porto, Universidade do Minho, 4710-057 Braga, Portugal"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0299-6764","authenticated-orcid":true,"given":"Andrea","family":"Capasso","sequence":"additional","affiliation":[{"name":"International Iberian Nanotechnology Laboratory, 4715-330 Braga, Portugal"}]}],"member":"316","published-online":{"date-parts":[[2023,12,19]]},"reference":[{"key":"ref1\/cit1","doi-asserted-by":"publisher","DOI":"10.1002\/adma.201704729"},{"key":"ref2\/cit2","doi-asserted-by":"publisher","DOI":"10.1002\/pssr.201900073"},{"key":"ref3\/cit3","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6463\/ab2e9e"},{"key":"ref4\/cit4","doi-asserted-by":"publisher","DOI":"10.1002\/adma.202002092"},{"key":"ref5\/cit5","doi-asserted-by":"publisher","DOI":"10.1039\/D2NH00031H"},{"key":"ref6\/cit6","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.202005443"},{"key":"ref7\/cit7","doi-asserted-by":"publisher","DOI":"10.1002\/aelm.201900740"},{"key":"ref8\/cit8","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-018-0021-4"},{"key":"ref9\/cit9","doi-asserted-by":"publisher","DOI":"10.1021\/acsnano.7b00113"},{"key":"ref10\/cit10","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2012.240"},{"key":"ref11\/cit11","doi-asserted-by":"publisher","DOI":"10.1038\/nchem.1589"},{"key":"ref12\/cit12","doi-asserted-by":"crossref","DOI":"10.1201\/b19623","volume-title":"2D Materials for Nanoelectronics","author":"Houssa M.","year":"2016"},{"key":"ref13\/cit13","doi-asserted-by":"publisher","DOI":"10.1088\/2053-1583\/ab6267"},{"key":"ref14\/cit14","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.201803807"},{"key":"ref15\/cit15","doi-asserted-by":"publisher","DOI":"10.1039\/D2TC00964A"},{"key":"ref16\/cit16","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.84.153402"},{"key":"ref17\/cit17","doi-asserted-by":"publisher","DOI":"10.1038\/ncomms1882"},{"key":"ref18\/cit18","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-018-04934-x"},{"key":"ref19\/cit19","doi-asserted-by":"publisher","DOI":"10.1002\/adma.201602391"},{"key":"ref20\/cit20","doi-asserted-by":"publisher","DOI":"10.1021\/acs.nanolett.7b04342"},{"key":"ref21\/cit21","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2015.56"},{"key":"ref22\/cit22","doi-asserted-by":"publisher","DOI":"10.1021\/acsnano.8b03977"},{"key":"ref23\/cit23","doi-asserted-by":"publisher","DOI":"10.1002\/adma.201703232"},{"key":"ref24\/cit24","doi-asserted-by":"publisher","DOI":"10.1021\/acs.nanolett.8b05140"},{"key":"ref25\/cit25","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2011.2167513"},{"key":"ref26\/cit26","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/22\/28\/289502"},{"key":"ref27\/cit27","doi-asserted-by":"publisher","DOI":"10.1038\/nature25747"},{"key":"ref28\/cit28","doi-asserted-by":"publisher","DOI":"10.1016\/j.physe.2020.114451"},{"key":"ref29\/cit29","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.202214250"},{"key":"ref30\/cit30","doi-asserted-by":"publisher","DOI":"10.7567\/1882-0786\/ab548e"},{"key":"ref31\/cit31","doi-asserted-by":"publisher","DOI":"10.1088\/2053-1583\/3\/3\/034002"},{"key":"ref32\/cit32","doi-asserted-by":"publisher","DOI":"10.1021\/acsnano.6b08315"},{"key":"ref33\/cit33","doi-asserted-by":"publisher","DOI":"10.1038\/nature23905"},{"key":"ref34\/cit34","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-020-20051-0"},{"key":"ref35\/cit35","doi-asserted-by":"publisher","DOI":"10.1016\/j.apmt.2017.01.006"},{"key":"ref36\/cit36","doi-asserted-by":"publisher","DOI":"10.1088\/1367-2630\/17\/5\/053023"},{"key":"ref37\/cit37","doi-asserted-by":"publisher","DOI":"10.1039\/C4NR02451F"},{"key":"ref38\/cit38","doi-asserted-by":"publisher","DOI":"10.4191\/kcers.2019.56.1.12"},{"key":"ref39\/cit39","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.201504633"},{"key":"ref40\/cit40","doi-asserted-by":"publisher","DOI":"10.1021\/acsnano.6b00961"},{"key":"ref41\/cit41","doi-asserted-by":"publisher","DOI":"10.1107\/S0021889811038970"},{"key":"ref42\/cit42","unstructured":"Koch, C. Determination of Core Structure Periodicity and Point Defect Density Along Dislocations. Dissertation, 2002."},{"key":"ref43\/cit43","doi-asserted-by":"publisher","DOI":"10.1039\/C7RA03642F"},{"key":"ref44\/cit44","doi-asserted-by":"publisher","DOI":"10.1364\/oe.21.004908"},{"key":"ref45\/cit45","doi-asserted-by":"publisher","DOI":"10.1038\/srep04215"},{"key":"ref46\/cit46","doi-asserted-by":"publisher","DOI":"10.1007\/s10853-018-2142-6"},{"key":"ref47\/cit47","doi-asserted-by":"publisher","DOI":"10.1016\/0169-4332(95)00317-7"},{"key":"ref48\/cit48","doi-asserted-by":"publisher","DOI":"10.1016\/j.matchemphys.2018.11.069"},{"key":"ref49\/cit49","doi-asserted-by":"publisher","DOI":"10.1021\/nn501175k"},{"key":"ref50\/cit50","doi-asserted-by":"publisher","DOI":"10.1021\/nn503287m"},{"key":"ref51\/cit51","doi-asserted-by":"publisher","DOI":"10.1021\/acs.jpcc.9b05921"},{"key":"ref52\/cit52","doi-asserted-by":"publisher","DOI":"10.1007\/s12274-020-3037-9"},{"key":"ref53\/cit53","doi-asserted-by":"publisher","DOI":"10.1039\/C5CS00275C"},{"key":"ref54\/cit54","doi-asserted-by":"publisher","DOI":"10.1038\/nmat3633"},{"key":"ref55\/cit55","doi-asserted-by":"publisher","DOI":"10.1021\/acs.nanolett.7b02600"},{"key":"ref56\/cit56","doi-asserted-by":"publisher","DOI":"10.1021\/acsnano.7b09029"},{"key":"ref57\/cit57","doi-asserted-by":"publisher","DOI":"10.1002\/adma.201900237"},{"key":"ref58\/cit58","doi-asserted-by":"publisher","DOI":"10.1021\/nl5000906"},{"key":"ref59\/cit59","doi-asserted-by":"publisher","DOI":"10.1021\/acsami.7b05475"},{"key":"ref60\/cit60","doi-asserted-by":"publisher","DOI":"10.1039\/C8NR04486D"},{"key":"ref61\/cit61","doi-asserted-by":"publisher","DOI":"10.1002\/adma.201802397"},{"key":"ref62\/cit62","doi-asserted-by":"publisher","DOI":"10.1002\/adma.201501086"},{"key":"ref63\/cit63","doi-asserted-by":"publisher","DOI":"10.1039\/C6CC09952A"},{"key":"ref64\/cit64","doi-asserted-by":"publisher","DOI":"10.1038\/s41699-022-00325-5"},{"key":"ref65\/cit65","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2020.2988247"},{"key":"ref66\/cit66","doi-asserted-by":"publisher","DOI":"10.1002\/aelm.201800933"},{"key":"ref67\/cit67","doi-asserted-by":"publisher","DOI":"10.1016\/0038-1101(95)00149-2"},{"key":"ref68\/cit68","doi-asserted-by":"crossref","unstructured":"Park, J.; Lee, W.; Choe, M.; Jung, S.; Son, M.; Kim, S.; Park, S.; Shin, J.; Lee, D.; Siddik, M.; Woo, J.; Choi, G.; Cha, E.; Lee, T.; Hwang, H. Quantized Conductive Filament Formed by Limited Cu Source in Sub-5nm Era. In\n                      2011 International Electron Devices Meeting\n                      ; IEEE: 2011; pp 3.7.1\u20133.7.4.","DOI":"10.1109\/IEDM.2011.6131484"},{"key":"ref69\/cit69","doi-asserted-by":"publisher","DOI":"10.1002\/aelm.202100905"},{"key":"ref70\/cit70","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/22\/27\/275204"},{"key":"ref71\/cit71","doi-asserted-by":"publisher","DOI":"10.1016\/j.jallcom.2015.10.020"},{"key":"ref72\/cit72","doi-asserted-by":"publisher","DOI":"10.1021\/acsnano.6b07159"},{"key":"ref73\/cit73","doi-asserted-by":"publisher","DOI":"10.1021\/acsmaterialslett.3c00013"},{"key":"ref74\/cit74","doi-asserted-by":"publisher","DOI":"10.1016\/j.mtcomm.2022.103957"},{"key":"ref75\/cit75","doi-asserted-by":"publisher","DOI":"10.1063\/1.5037139"},{"key":"ref76\/cit76","doi-asserted-by":"publisher","DOI":"10.1016\/j.ceramint.2022.11.122"},{"key":"ref77\/cit77","doi-asserted-by":"crossref","unstructured":"Thool, A. S.; Roy, S.; Misra, A.; Chakrabarti, B. Controllable Defect Engineering in 2D-MoS\n                      2\n                      for High-Performance, Threshold Switching Memristive Devices. In\n                      2022 Device Research Conference (DRC)\n                      ; IEEE: 2022; pp 1\u20132.","DOI":"10.1109\/DRC55272.2022.9855777"}],"container-title":["ACS Applied Materials &amp; Interfaces"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/pubs.acs.org\/doi\/pdf\/10.1021\/acsami.3c14215","content-type":"application\/pdf","content-version":"vor","intended-application":"unspecified"},{"URL":"https:\/\/pubs.acs.org\/doi\/pdf\/10.1021\/acsami.3c14215","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,10]],"date-time":"2024-01-10T05:29:26Z","timestamp":1704864566000},"score":1,"resource":{"primary":{"URL":"https:\/\/pubs.acs.org\/doi\/10.1021\/acsami.3c14215"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,12,19]]},"references-count":77,"journal-issue":{"issue":"1","published-print":{"date-parts":[[2024,1,10]]}},"alternative-id":["10.1021\/acsami.3c14215"],"URL":"https:\/\/doi.org\/10.1021\/acsami.3c14215","relation":{"has-preprint":[{"id-type":"doi","id":"10.21203\/rs.3.rs-1646934\/v1","asserted-by":"object"}]},"ISSN":["1944-8244","1944-8252"],"issn-type":[{"value":"1944-8244","type":"print"},{"value":"1944-8252","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,12,19]]}}}