{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,6]],"date-time":"2025-06-06T10:40:04Z","timestamp":1749206404661,"version":"3.41.0"},"reference-count":16,"publisher":"Springer Science and Business Media LLC","issue":"3","license":[{"start":{"date-parts":[[1997,12,1]],"date-time":"1997-12-01T00:00:00Z","timestamp":880934400000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[1997,12,1]],"date-time":"1997-12-01T00:00:00Z","timestamp":880934400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Journal of Electronic Testing"],"published-print":{"date-parts":[[1997,12]]},"DOI":"10.1023\/a:1008218506450","type":"journal-article","created":{"date-parts":[[2002,12,22]],"date-time":"2002-12-22T13:47:34Z","timestamp":1040564854000},"page":"247-262","source":"Crossref","is-referenced-by-count":7,"title":["Multiple Experiment Environments for Testing"],"prefix":"10.1007","volume":"11","author":[{"given":"Karen","family":"Panetta Lentz","sequence":"first","affiliation":[]},{"given":"Elias S.","family":"Manolakos","sequence":"additional","affiliation":[]},{"given":"Edward","family":"Czeck","sequence":"additional","affiliation":[]},{"given":"Jamie","family":"Heller","sequence":"additional","affiliation":[]}],"member":"297","reference":[{"key":"146938_CR1","unstructured":"E. Ulrich and T. Baker, \u201cThe Concurrent Simulation of Nearly Identical Digital Networks,\u201d Proc. 1973 Design Automation Conference, pp. 145-150."},{"key":"146938_CR2","first-page":"1006","volume":"7","author":"S. Gai","year":"1988","unstructured":"S. Gai, P.L. Montessoro, and F. Somenzi, \u201cMOZART:AConcurrent Multi-Level Simulator,\u201d IEEE Transaction on CAD, Vol. 7, pp. 1006-1012, Nov. 1988.","journal-title":"IEEE Transaction on CAD"},{"key":"146938_CR3","doi-asserted-by":"crossref","unstructured":"K. Kubiak and W.K. Fuchs, \u201cMultiple-fault Simulation and Coverage of Deterministic Single-Fault Test Sets,\u201d Proc. IEEE International Test Conference, pp. 956-962, Nov. 1991.","DOI":"10.1109\/TEST.1991.519761"},{"key":"146938_CR4","doi-asserted-by":"crossref","unstructured":"Y. Kitamura, \u201cSequential Circuit Fault Simulation by Fault Information Tracing Algorithm: Fit,\u201d Proc. 28th ACM\/IEEE Design Automation Conference, 1991, pp. 151-154.","DOI":"10.1145\/127601.127649"},{"key":"146938_CR5","unstructured":"F. Brglez and H. Fujiwara, \u201cA Neutral Netlist of 10 Combinational Benchmark Circuits and a Target Translator in FORTRAN,\u201d Special Session on Recent Algorithms for Gate-level ATPG with Fault Simulation and their Performance Assessment, Proc. IEEE International Symposium on Circuits and Systems, June 1985."},{"key":"146938_CR6","doi-asserted-by":"crossref","unstructured":"F. Brglez, D. Bryan, and K. Koziminski, \u201cCombinational Profiles of Sequential Benchmarks for Sequential Test Generation,\u201d IEEE International Symposium on Circuits and Systems, May 1989, pp. 1929-1934.","DOI":"10.1109\/ISCAS.1989.100747"},{"key":"146938_CR7","doi-asserted-by":"crossref","unstructured":"D. Machlin, D. Gross, S. Kadkade, and E. Ulrich, \u201cSwitch-Level Concurrent Fault Simulation based on a General Purpose List Traversal Mechanism,\u201d Proc. IEEE International Test Conference (ITC), 1988, pp. 574-581.","DOI":"10.1109\/TEST.1988.207839"},{"key":"146938_CR8","doi-asserted-by":"crossref","unstructured":"P.L. Montessoro and S. Gai, \u201cCreator: General and Efficient Multilevel Concurrent Fault Simulation,\u201d Proc. First Great Lakes Symposium on VLSI, 1991, pp. 43-48.","DOI":"10.1109\/GLSV.1991.143940"},{"issue":"2","key":"146938_CR9","doi-asserted-by":"crossref","first-page":"198","DOI":"10.1109\/43.124398","volume":"11","author":"T. Niermann","year":"1992","unstructured":"T. Niermann, W. Cheng, and J. Patel, \u201cPROOFS: A Fast, Memory Efficient Sequential Circuit Fault Simulator,\u201d IEEE Transactions on Computer Aided Design, Vol. 11, No.2, pp. 198-206, Feb. 1992.","journal-title":"IEEE Transactions on Computer Aided Design"},{"key":"146938_CR10","unstructured":"K.P. Lentz, Multiple Domain Concurrent Simulation of Interacting Experiments and Its application to Multiple Stuck-at Fault Simulation, Ph.D. thesis, Northeastern University, 1994."},{"key":"146938_CR11","doi-asserted-by":"crossref","first-page":"131","DOI":"10.1109\/43.21831","volume":"8","author":"V.D. Agrawal","year":"1989","unstructured":"V.D. Agrawal, K.T. Cheng, and P. Agrawal, \u201cA Directed Search Method for Test Generation Using a Concurrent Simulator,\u201d IEEE Trans. CAD, Vol. 8, pp. 131-138, Feb. 1989.","journal-title":"IEEE Trans. CAD"},{"key":"146938_CR12","unstructured":"D. Schuler and R. Cleghorn, \u201cAn Efficient Method of Fault Simulation for Digital Circuits Modeled from Boolean Gates and Memories,\u201d Proc. 14th Design Automation Conference, June 1977, pp. 230-238."},{"issue":"6","key":"146938_CR13","first-page":"786","volume":"13","author":"S. Gai","year":"1994","unstructured":"S. Gai and P. Montessoro, \u201cCreator: New Advanced Concepts in Concurrent Simulation,\u201d IEEE Trans. on CAD\/ICAS, Vol. 13, No.6, pp. 786-795, June 1994.","journal-title":"IEEE Trans. on CAD\/ICAS"},{"issue":"3","key":"146938_CR14","doi-asserted-by":"crossref","first-page":"242","DOI":"10.1145\/217853.217857","volume":"5","author":"J. Cremer","year":"1995","unstructured":"J. Cremer, J. Kearney, and Y. Papelis, \u201cHCSM: A framework for Behavior and Scenario Control in Virtual Environments,\u201d ACM Transactions on Modeling and Simulation. Vol. 5, No.3, pp. 242-267, July 1995.","journal-title":"ACM Transactions on Modeling and Simulation"},{"issue":"3","key":"146938_CR15","doi-asserted-by":"crossref","first-page":"293","DOI":"10.1145\/136035.136043","volume":"24","author":"R.E. Bryant","year":"1992","unstructured":"R.E. Bryant, \u201cSymbolic Boolean Manipulation with Ordered Binary Decision Diagrams,\u201d ACM Computing Surveys, Vol. 24, No.3, pp. 293-318, 1992.","journal-title":"ACM Computing Surveys"},{"issue":"2","key":"146938_CR16","doi-asserted-by":"crossref","first-page":"279","DOI":"10.1007\/BF00137248","volume":"3","author":"E. Ulrich","year":"1992","unstructured":"E. Ulrich, K.P. Lentz, J. Arabian, V. Agrawal, and P.L. Montessoro, \u201cThe Comparative and Concurrent Simulation of Discrete-Event Experiments,\u201d Journal of Electronic Testing: Theory and Applications, Vol. 3, No.2, pp. 279-291, May 1992.","journal-title":"Journal of Electronic Testing: Theory and Applications"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1023\/A:1008218506450.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1023\/A:1008218506450\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1023\/A:1008218506450.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,6]],"date-time":"2025-06-06T10:13:33Z","timestamp":1749204813000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1023\/A:1008218506450"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1997,12]]},"references-count":16,"journal-issue":{"issue":"3","published-print":{"date-parts":[[1997,12]]}},"alternative-id":["146938"],"URL":"https:\/\/doi.org\/10.1023\/a:1008218506450","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"type":"print","value":"0923-8174"},{"type":"electronic","value":"1573-0727"}],"subject":[],"published":{"date-parts":[[1997,12]]}}}