{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,7]],"date-time":"2025-06-07T04:03:54Z","timestamp":1749269034043,"version":"3.41.0"},"reference-count":27,"publisher":"Springer Science and Business Media LLC","issue":"1-2","license":[{"start":{"date-parts":[[1998,2,1]],"date-time":"1998-02-01T00:00:00Z","timestamp":886291200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[1998,2,1]],"date-time":"1998-02-01T00:00:00Z","timestamp":886291200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Journal of Electronic Testing"],"published-print":{"date-parts":[[1998,2]]},"DOI":"10.1023\/a:1008233907036","type":"journal-article","created":{"date-parts":[[2002,12,22]],"date-time":"2002-12-22T13:47:34Z","timestamp":1040564854000},"page":"81-92","source":"Crossref","is-referenced-by-count":5,"title":["Thermal Monitoring of Self-Checking Systems"],"prefix":"10.1007","volume":"12","author":[{"given":"V.","family":"Sz\u00e9kely","sequence":"first","affiliation":[]},{"given":"M.","family":"Rencz","sequence":"additional","affiliation":[]},{"given":"J.M.","family":"Karam","sequence":"additional","affiliation":[]},{"given":"M.","family":"Lubaszewski","sequence":"additional","affiliation":[]},{"given":"B.","family":"Courtois","sequence":"additional","affiliation":[]}],"member":"297","reference":[{"key":"154693_CR1","unstructured":"H. Levendel, \u201cOn-line Testing and Diagnosis of Telecommunications Systems,\u201d Invited Talk at the 2nd On-line Testing Workshop, Biarritz, France, July 1996."},{"key":"154693_CR2","doi-asserted-by":"crossref","unstructured":"V. Sz\u00e9kely, Cs. M\u00e1rta, M. Rencz, Zs. Benedek, and B. Courtois, \u201cDesign for Thermal Testability (DFTT) and a CMOS Realization,\u201d 1st Therminic Workshop, Grenoble, France, Sept. 1995.","DOI":"10.1016\/S0924-4247(96)01246-0"},{"key":"154693_CR3","unstructured":"V. Sz\u00e9kely and M. Rencz, \u201cOn-Line Thermal Testing of Microstructures,\u201d 4th Annual Atlantic Test Workshop ATW 95, Durham, New Hampshire, USA, May\u2013June 1995, pp. 1\u20139."},{"key":"154693_CR4","doi-asserted-by":"crossref","unstructured":"M. Nicolaidis, \u201cA Unified Built-In Self-Test Scheme: UBIST,\u201d Proc. 18th International Symposium on Fault Tolerant Computing, Tokyo, Japan, June 1988, pp. 157\u2013163.","DOI":"10.1109\/FTCS.1988.5314"},{"key":"154693_CR5","doi-asserted-by":"crossref","unstructured":"M. Nicolaidis, \u201cEfficient UBIST Implementation for Microprocessor Sequencing Parts,\u201d Proc. 21st International Test Conference, Washington, USA, Sept. 1990, pp. 316\u2013326.","DOI":"10.1109\/TEST.1990.114038"},{"key":"154693_CR6","unstructured":"S. Mir, M. Lubaszewski, V. Kolarik, and B. Courtois, \u201cAnalogue On-line\/Off-line Test Unification for Fully Differential Circuits,\u201d 1st International Mixed-Signal Testing Workshop, Grenoble, France, June 1995."},{"key":"154693_CR7","unstructured":"J.-C. Lo, J. Daly, and M. Nicolaidis, \u201cStatic CMOS Self-Checking Circuits,\u201d Proc. 22nd International Symposium on Fault Tolerant Computing, Boston, USA, July 1992, pp. 104\u2013 111."},{"key":"154693_CR8","volume-title":"The Test Access Port and Boundary Scan Architecture","author":"C. Maunder","year":"1990","unstructured":"C. Maunder and R. Tulloss, The Test Access Port and Boundary Scan Architecture, IEEE Computer Society Press, Los Alamitos, USA, 1990."},{"key":"154693_CR9","doi-asserted-by":"crossref","unstructured":"M. Lubaszewski and B. Courtois, \u201cOn the Design of Self-Checking Boundary Scannable Boards,\u201d Proc. 23rd International Test Conference, Baltimore, USA, Sept. 1992, pp. 372\u2013 381.","DOI":"10.1109\/TEST.1992.527846"},{"key":"154693_CR10","volume-title":"Microsensors, Principles and Applications","author":"J.W. Gardner","year":"1994","unstructured":"J.W. Gardner, Microsensors, Principles and Applications, John Wiley & Sons, New York, USA, 1994."},{"key":"154693_CR11","doi-asserted-by":"crossref","first-page":"11","DOI":"10.1016\/0924-4247(94)80081-2","volume":"A41\u2013A42","author":"R. Wolffenbuttel","year":"1994","unstructured":"R. Wolffenbuttel, \u201cFabrication Compatibility of Integrated Silicon Smart Physical Sensors,\u201d Sensors and Actuators, Vol. A41\u2013 A42, pp. 11\u201328, 1994.","journal-title":"Sensors and Actuators"},{"key":"154693_CR12","doi-asserted-by":"crossref","first-page":"135","DOI":"10.1016\/0250-6874(88)87003-3","volume":"15","author":"B. van Oudheusden","year":"1988","unstructured":"B. van Oudheusden and J. Huijsing, \u201cIntegrated Flow Friction Sensor,\u201d Sensors and Actuators, Vol. 15, pp. 135\u2013144, 1988.","journal-title":"Sensors and Actuators"},{"issue":"15","key":"154693_CR13","doi-asserted-by":"crossref","first-page":"372","DOI":"10.1049\/el:19760285","volume":"12","author":"V. Sz\u00e9kely","year":"1976","unstructured":"V. Sz\u00e9kely, \u201cNewType of Thermal-Function IC: The 4-Quadrant Multiplier,\u201d Electronics Letters, Vol. 12, No. 15, pp. 372\u2013373, 1976.","journal-title":"Electronics Letters"},{"key":"154693_CR14","doi-asserted-by":"crossref","first-page":"103","DOI":"10.1016\/0250-6874(86)80037-3","volume":"10","author":"G. Meijer","year":"1986","unstructured":"G. Meijer, \u201cThermal Sensors Based on Transistors,\u201d Sensors and Actuators, Vol. 10, pp. 103\u2013125, 1986.","journal-title":"Sensors and Actuators"},{"key":"154693_CR15","unstructured":"K. Szajda, C. Sodini, and H. Bowman, \u201cA Low Noise High Resolution Silicon Temperature Sensor,\u201d Department of Electrical Engineering and Computer Science, Massachussetts Institute of Technology, Cambridge, USA."},{"key":"154693_CR16","doi-asserted-by":"crossref","first-page":"636","DOI":"10.1016\/0924-4247(89)80048-2","volume":"A21\u2013A23","author":"P. Krummenacher","year":"1990","unstructured":"P. Krummenacher and H. Oguey, \u201cSmart Temperature Sensor in CMOS Technology,\u201d Sensors and Actuators, Vol. A21\u2013A23, pp. 636\u2013638, 1990.","journal-title":"Sensors and Actuators"},{"key":"154693_CR17","volume-title":"Analysis and Design of Analog Integrated Circuits","author":"P. Gray","year":"1984","unstructured":"P. Gray and R. Meyer, Analysis and Design of Analog Integrated Circuits, Second edition, John Wiley & Sons, New York, USA, 1984.","edition":"Second edition"},{"key":"154693_CR18","doi-asserted-by":"crossref","first-page":"191","DOI":"10.1016\/0250-6874(84)80020-7","volume":"6","author":"B. Hosticka","year":"1984","unstructured":"B. Hosticka, J. Fichtel, and G. Zimmer, \u201cIntegrated Monolithic Temperature Sensors for Acquisition and Regulation,\u201d Sensors and Actuators, Vol. 6, pp. 191\u2013200, 1984.","journal-title":"Sensors and Actuators"},{"key":"154693_CR19","volume-title":"Silicon Sensors","author":"S. Middelhoek","year":"1989","unstructured":"S. Middelhoek and S.A. Audet, Silicon Sensors, Academic Press, London, U.K., 1989."},{"key":"154693_CR20","unstructured":"W. W\u00f3jciak and A. Napieralski, \u201cAn Analogue Temperature Sensor Integrated in The CMOS Technology,\u201d 1st THERMINIC Workshop, Grenoble, France, Sept. 1995, pp. 15\u201320."},{"issue":"3","key":"154693_CR21","doi-asserted-by":"crossref","first-page":"821","DOI":"10.1109\/4.324","volume":"23","author":"W.M. Sansen","year":"1988","unstructured":"W.M. Sansen, F. Op't Eynde, and M. Steyaert, \u201cA CMOS Temperature Compensated Current Reference,\u201d IEEE Journal of Solid-State Circuits, Vol. 23, No. 3, pp. 821\u2013824, 1988.","journal-title":"IEEE Journal of Solid-State Circuits"},{"key":"154693_CR22","doi-asserted-by":"crossref","unstructured":"G.M. Qu\u00e9not, N. Paris, and B. Zavidovique, \u201cA Temperature and Voltage Measurement Cell for VLSI Circuits,\u201d EURO-ASIC'91, Paris, France, pp. 334\u2013338, May 1991.","DOI":"10.1109\/EUASIC.1991.212842"},{"key":"154693_CR23","unstructured":"K. Arabi and B. Kaminska, \u201cOscillation Built-in Self-Test of Mixed-Signal IC With Temperature and Current Monitoring,\u201d 2nd IEEE Int. On-Line Testing Workshop, Biarritz, France, July 1996."},{"key":"154693_CR24","unstructured":"E. Montan\u00e9, S.A. Bota, and J. Samitier, \u201cA Compact Temperature Sensor of a 1.0 \u03bcm CMOS Technology Using Lateral PNP Transistors,\u201d Thermanic'96 Workshop, Budapest, Hungary, Sept. 1996, pp. 45\u201348."},{"key":"154693_CR25","unstructured":"A. Bakker and J.H. Huijsing, \u201cMicropower CMOS Smart Temperature Sensor,\u201d ESSCIRC'95, Lille, France, pp. 238\u2013241, Sept. 1995."},{"issue":"3","key":"154693_CR26","doi-asserted-by":"crossref","first-page":"270","DOI":"10.1109\/92.609869","volume":"5","author":"V. Sz\u00e9kely","year":"1997","unstructured":"V. Sz\u00e9kely, Cs. Mr\u00e1ta, Zs. Koh\u00e1ri, and M. Rencz, \u201cCMOS Sensors for On-Line Thermal Monitoring of VLSI Circuits,\u201d IEEE Trans. on VLSI Systems, Vol. 5, No. 3, pp. 270\u2013276, 1997","journal-title":"IEEE Trans. on VLSI Systems"},{"key":"154693_CR27","doi-asserted-by":"crossref","unstructured":"V. Sz\u00e9kely and M. Rencz, \u201cA New Monolithic Temperature Sensor: The Thermal-Feedback Oscillator,\u201d Proc. Transducers '95 and Eurosensors IX, Stockholm, Sweden, June 1995, pp. 124\u2013 127. _","DOI":"10.1109\/SENSOR.1995.721760"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1023\/A:1008233907036.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1023\/A:1008233907036\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1023\/A:1008233907036.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,6]],"date-time":"2025-06-06T10:03:01Z","timestamp":1749204181000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1023\/A:1008233907036"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1998,2]]},"references-count":27,"journal-issue":{"issue":"1-2","published-print":{"date-parts":[[1998,2]]}},"alternative-id":["154693"],"URL":"https:\/\/doi.org\/10.1023\/a:1008233907036","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"type":"print","value":"0923-8174"},{"type":"electronic","value":"1573-0727"}],"subject":[],"published":{"date-parts":[[1998,2]]}}}