{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,6]],"date-time":"2025-06-06T10:40:08Z","timestamp":1749206408501,"version":"3.41.0"},"reference-count":25,"publisher":"Springer Science and Business Media LLC","issue":"3","license":[{"start":{"date-parts":[[1997,6,1]],"date-time":"1997-06-01T00:00:00Z","timestamp":865123200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[1997,6,1]],"date-time":"1997-06-01T00:00:00Z","timestamp":865123200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Journal of Electronic Testing"],"published-print":{"date-parts":[[1997,6]]},"DOI":"10.1023\/a:1008263507929","type":"journal-article","created":{"date-parts":[[2002,12,22]],"date-time":"2002-12-22T13:47:34Z","timestamp":1040564854000},"page":"197-214","source":"Crossref","is-referenced-by-count":0,"title":["Testing for Bounded Faults in RAMs"],"prefix":"10.1007","volume":"10","author":[{"given":"R.","family":"David","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.A.","family":"Brzozowski","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"H.","family":"J\u00fcrgensen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","reference":[{"key":"134355_CR1","doi-asserted-by":"crossref","unstructured":"R. David, J.A. Brzozowski, and H. J\u00fcrgensen, \u201cRandom Test Length for Bounded Faults in RAMs,\u201d Proc. ETC\u201993, Third European Test Conference, Rotterdam, April 1993, pp. 149\u2013158.","DOI":"10.1109\/ETC.1993.246522"},{"key":"134355_CR2","doi-asserted-by":"crossref","first-page":"251","DOI":"10.1007\/BF00134734","volume":"3","author":"B.F. Cockburn","year":"1992","unstructured":"B.F. Cockburn and J.A. Brzozowski, \u201cNear-Optimal Tests for Classes of Write-Triggered Coupling Faults in RAMs,\u201d Journal of Electronic Testing: Theory and Applications, Vol. 3, pp. 251\u2013264, Aug. 1992.","journal-title":"Journal of Electronic Testing: Theory and Applications"},{"key":"134355_CR3","unstructured":"M. Marinescu, \u201cTest fonctionnel de m\u00e9moire vive \u00e0 grande couverture de pannes,\u201d Proc. Second International Conference on Reliability and Maintainability, Perros-Guirrec\u2014Tregastel, France, PUBLI TR\u00c9GOR, Lannion, Sept. 1980, pp. 31\u201337."},{"key":"134355_CR4","unstructured":"M. Marinescu, \u201cSimple and Efficient Algorithms for Functional RAM Testing,\u201d Proc. Internat. Test Conf., Philadelphia, Nov. 1982, pp. 236\u2013239."},{"key":"134355_CR5","doi-asserted-by":"crossref","first-page":"572","DOI":"10.1109\/TC.1978.1675150","volume":"C-27","author":"R. Nair","year":"1978","unstructured":"R. Nair, S.M. Thatte, and J.A. Abraham, \u201cEfficient Algorithms for Testing Semiconductor Random Access Memories,\u201d IEEE Trans. on Comput., Vol. C-27, pp. 572\u2013576, 1978.","journal-title":"IEEE Trans. on Comput."},{"key":"134355_CR6","doi-asserted-by":"crossref","first-page":"419","DOI":"10.1109\/TC.1980.1675601","volume":"C-29","author":"D.S. Suk","year":"1980","unstructured":"D.S. Suk and S.M. Reddy, \u201cTest Procedures for a Class of Pattern Sensitive Faults in Semiconductor Random Access Memories,\u201d IEEE Trans. on Comput., Vol. C-29, pp. 419\u2013429, 1980.","journal-title":"IEEE Trans. on Comput."},{"key":"134355_CR7","doi-asserted-by":"crossref","first-page":"982","DOI":"10.1109\/TC.1981.1675739","volume":"C-30","author":"D.S. Suk","year":"1981","unstructured":"D.S. Suk and S.M. Reddy, \u201cA March Test for Functional Faults in Semiconductor Random Access Memories,\u201d IEEE Trans. on Comput., Vol. C-30, pp. 982\u2013985, 1981.","journal-title":"IEEE Trans. on Comput."},{"key":"134355_CR8","doi-asserted-by":"crossref","first-page":"151","DOI":"10.1007\/BF00137391","volume":"1","author":"J.A. Brzozowski","year":"1990","unstructured":"J.A. Brzozowski and B.F. Cockburn, \u201cDetection of Coupling Faults in RAMs,\u201d Journal of Electronic Testing: Theory and Applications, Vol. 1, pp. 151\u2013162, May 1990.","journal-title":"Journal of Electronic Testing: Theory and Applications"},{"key":"134355_CR9","first-page":"553","volume":"19","author":"R. David","year":"1985","unstructured":"R. David and X. Fedi, \u201cR\u00e9sultats am\u00e9lior\u00e9s sur le test al\u00e9atoire des m\u00e9moires,\u201d RAIRO APII(Revue d\u2019Automatique, d\u2019Informatique et de Recherche Operationelle),Vol. 19, pp. 553\u2013560, 1985.","journal-title":"RAIRO APII(Revue d\u2019Automatique, d\u2019Informatique et de Recherche Operationelle)"},{"key":"134355_CR10","doi-asserted-by":"crossref","first-page":"637","DOI":"10.1109\/12.24267","volume":"C-38","author":"R. David","year":"1989","unstructured":"R. David, A. Fuentes, and B. Courtois, \u201cRandom Pattern Testing Versus Deterministic Testing of RAMs,\u201d IEEE Trans. on Comput., Vol. C-38, pp. 637\u2013650, May 1989.","journal-title":"IEEE Trans. on Comput."},{"key":"134355_CR11","unstructured":"A. Fuentes, R. David, and B. Courtois, \u201cRandom Testing versus Deterministic Testing of RAMs,\u201d Proc.16th International Symposium on Fault Tolerant Computing Systems, 1986, pp. 266\u2013271."},{"key":"134355_CR12","doi-asserted-by":"crossref","unstructured":"J. Savir, W.H. McAnney, and S.R. Vecchio, \u201cTesting for Coupled Cells in Random-Access Memories,\u201d Proc. Internat. Test Conf., Washington, D.C., Aug. 1989, pp. 439\u2013451.","DOI":"10.1109\/TEST.1989.82327"},{"key":"134355_CR13","doi-asserted-by":"crossref","first-page":"1177","DOI":"10.1109\/12.93752","volume":"C-40","author":"J. Savir","year":"1991","unstructured":"J. Savir, W.H. McAnney, and S.R. Vecchio, \u201cTesting for Coupled Cells in Random-Access Memories,\u201d IEEE Trans. on Comput., Vol. C-40, pp. 1177\u20131180, 1991.","journal-title":"IEEE Trans. on Comput."},{"key":"134355_CR14","series-title":"Research Report","volume-title":"Testing for Bounded Faults in RAMs","author":"R. David","year":"1992","unstructured":"R. David, J.A. Brzozowski, and H. J\u00fcrgensen, \u201cTesting for Bounded Faults in RAMs,\u201d Research Report CS-92-30, Department of Computer Science, University of Waterloo, Waterloo, Ontario, Canada, June 1992."},{"key":"134355_CR15","first-page":"35","volume-title":"Proc. 2nd Conf. on Automata, Languages, and Programming Systems, Salg\u00f3tarj\u00e1n, Hungary","author":"J.A. Brzozowski","year":"1988","unstructured":"J.A. Brzozowski and H. J\u00fcrgensen, \u201cDeterministic Diagnosis of Sequential Machines,\u201d Proc. 2nd Conf. on Automata, Languages, and Programming Systems, Salg\u00f3tarj\u00e1n, Hungary, F. G\u00e9cseg and I. P\u00e9ak (Eds.), Dep. of Mathematics, Karl Marx University of Economics, Budapest, 1988, Vol. 1988-4, pp. 35\u201349."},{"key":"134355_CR16","first-page":"51","volume-title":"Proc. 2nd Conf. on Automata, Languages, and Programming Systems, Salg\u00f3tarj\u00e1n, Hungary","author":"J.A. Brzozowski","year":"1998","unstructured":"J.A. Brzozowski and H. J\u00fcrgensen, \u201cProbabilistic Diagnosis of Sequential Machines,\u201d Proc. 2nd Conf. on Automata, Languages, and Programming Systems, Salg\u00f3tarj\u00e1n, Hungary, F. G\u00e9cseg and I. Pe\u00e1k (Eds.), Dep. of Mathematics, Karl Marx University of Economics, Budapest, 1998, Vol. 1988-4, pp. 51\u201366."},{"key":"134355_CR17","doi-asserted-by":"crossref","first-page":"219","DOI":"10.1007\/BF00134732","volume":"3","author":"J.A. Brzozowski","year":"1992","unstructured":"J.A. Brzozowski and H. J\u00fcrgensen, \u201cA Model for Sequential Machine Testing and Diagnosis,\u201d Journal of Electronic Testing: Theory and Applications, Vol. 3, pp. 219\u2013234, Aug. 1992.","journal-title":"Journal of Electronic Testing: Theory and Applications"},{"key":"134355_CR18","first-page":"139","volume-title":"GI\u2014 7. Jahrestagung, N\u00fcrnberg, Informatik-Fachberichte","author":"P. Fosse","year":"1977","unstructured":"P. Fosse and R. David, \u201cRandom Testing of Memories,\u201d GI\u2014 7. Jahrestagung, N\u00fcrnberg, Informatik-Fachberichte, Springer-Verlag, Berlin, 1977, Vol. 10, pp. 139\u2013153."},{"issue":"2","key":"134355_CR19","doi-asserted-by":"crossref","first-page":"129","DOI":"10.1007\/BF02341819","volume":"8","author":"J.A. Brzozowski","year":"1996","unstructured":"J.A. Brzozowski and H. J\u00fcrgensen, \u201cAn Algebra of Multiple Faults in RAMs,\u201d J. Electronic Testing: Theory and Applications, Vol. 8, No.2, pp. 129\u2013142, April 1996.","journal-title":"J. Electronic Testing: Theory and Applications"},{"key":"134355_CR20","volume-title":"Switching Theory, Vol. II: Sequential Circuits and Machines","author":"R.E. Miller","year":"1965","unstructured":"R.E. Miller, Switching Theory, Vol. II: Sequential Circuits and Machines, John Wiley and Sons, Inc., New York, 1965."},{"key":"134355_CR21","volume-title":"Theory of Computation","author":"D. Wood","year":"1987","unstructured":"D. Wood, Theory of Computation, Harper & Row, New York, 1987."},{"key":"134355_CR22","volume-title":"An Introduction to Probability Theory and Its Applications","author":"W. Feller","year":"1968","unstructured":"W. Feller, An Introduction to Probability Theory and Its Applications, 3rd edition, John Wiley & Sons, Inc., New York, 1968.","edition":"3rd edition"},{"key":"134355_CR23","doi-asserted-by":"crossref","first-page":"655","DOI":"10.1109\/TC.1976.1674668","volume":"C-25","author":"J.J. Shedletsky","year":"1976","unstructured":"J.J. Shedletsky and E.J. McCluskey, \u201cThe Error Latency of a Fault in a Sequential Digital Circuit,\u201d IEEE Trans. on Comput., Vol. C-25, pp. 655\u2013659, 1976.","journal-title":"IEEE Trans. on Comput."},{"key":"134355_CR24","unstructured":"P. Caspi, personal communication, 1988."},{"key":"134355_CR25","doi-asserted-by":"crossref","unstructured":"A. Kra\u015bniewski and K. Gaj, \u201cIs There Any Future for Deterministic Self-Test of Embedded RAMs?\u201d Proc. ETC \u201993, Third European Test Conference, Rotterdam, April 1993, pp. 159\u2013168.","DOI":"10.1109\/ETC.1993.246521"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1023\/A:1008263507929.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1023\/A:1008263507929\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1023\/A:1008263507929.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,6]],"date-time":"2025-06-06T10:03:40Z","timestamp":1749204220000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1023\/A:1008263507929"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1997,6]]},"references-count":25,"journal-issue":{"issue":"3","published-print":{"date-parts":[[1997,6]]}},"alternative-id":["134355"],"URL":"https:\/\/doi.org\/10.1023\/a:1008263507929","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"type":"print","value":"0923-8174"},{"type":"electronic","value":"1573-0727"}],"subject":[],"published":{"date-parts":[[1997,6]]}}}