{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,6]],"date-time":"2025-06-06T10:40:05Z","timestamp":1749206405356,"version":"3.41.0"},"reference-count":21,"publisher":"Springer Science and Business Media LLC","issue":"5","license":[{"start":{"date-parts":[[2000,10,1]],"date-time":"2000-10-01T00:00:00Z","timestamp":970358400000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2000,10,1]],"date-time":"2000-10-01T00:00:00Z","timestamp":970358400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Journal of Electronic Testing"],"published-print":{"date-parts":[[2000,10]]},"DOI":"10.1023\/a:1008324900917","type":"journal-article","created":{"date-parts":[[2002,12,22]],"date-time":"2002-12-22T14:41:38Z","timestamp":1040568098000},"page":"499-511","source":"Crossref","is-referenced-by-count":6,"title":["Dynamic Power Supply Current Testing of CMOS SRAMs"],"prefix":"10.1007","volume":"16","author":[{"given":"Jian","family":"Liu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rafic Z.","family":"Makki","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ayman","family":"Kayssi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","reference":[{"key":"270877_CR1","unstructured":"W.C. Rhines, \u201cEmerging Technologies Drive Domain-specific Solution,\u201d Proc. of International Conference, 1996, p. 10."},{"key":"270877_CR2","doi-asserted-by":"crossref","first-page":"265","DOI":"10.1007\/BF00134735","volume":"3","author":"S. Su","year":"1992","unstructured":"S. Su and R. Makki, \u201cTesting Random Access Memories by Monitoring Dynamic Power Supply Current,\u201d Journal of Electronic Testing, Vol. 3, pp. 265-278, 1992.","journal-title":"Journal of Electronic Testing"},{"key":"270877_CR3","volume-title":"Testing of Semiconductor Memories-Theory and Practice","author":"A.J. Van de Goor","year":"1998","unstructured":"A.J. Van de Goor, Testing of Semiconductor Memories-Theory and Practice, A.J. Van de Goor\/Verzijl, The Netherlands, 1998."},{"key":"270877_CR4","doi-asserted-by":"crossref","unstructured":"W. Maly and P. Nigh, \u201cBuilt-in Current Testing-A Feasibility Study,\u201d Proc. of International Conference on Computer-Aided Design, November 1988, pp. 340-343.","DOI":"10.1109\/ICCAD.1988.122524"},{"key":"270877_CR5","unstructured":"J. Sas, U. Swerts, and M. Darquennes, \u201cTowards an Effective IDDQ Vector Selection and Application Methodology,\u201d Proc. of International Test Conference, 1996, pp. 491-500."},{"key":"270877_CR6","doi-asserted-by":"crossref","unstructured":"T. Powell, J. Pair, and B. Garbajal III, \u201cCorrelating Defects to Functional and IDDQ Tests,\u201d Proc. of International Test Conference, 1996, pp. 501-510.","DOI":"10.1109\/TEST.1996.557075"},{"issue":"2","key":"270877_CR7","doi-asserted-by":"crossref","first-page":"211","DOI":"10.1109\/41.19071","volume":"36","author":"C. Hawkins","year":"1989","unstructured":"C. Hawkins, J. Soden, R. Fritzemeier, and L. Horing, \u201cQuiescent Power Supply Current Measurement for CMOS IC Defect Detection,\u201d IEEE Tran. on Industrial Electronics, Vol. 36, No. 2, pp. 211-218, 1989.","journal-title":"IEEE Tran. on Industrial Electronics"},{"key":"270877_CR8","unstructured":"Y. Okudo, I.Kubota, and M.Watanabe, \u201cDefect Level Prediction for IDDQTesting,\u201d Proc. of International Test Conference, 1998, p. 909."},{"key":"270877_CR9","doi-asserted-by":"crossref","unstructured":"R. Rodriguez-Montanes, J. Segura,V. Champac, J. Figueras, and J. Rubio, \u201cCurrent vs. Logic Testing of Gate Oxide Short, Floating Gate and Bridging Failures in CMOS,\u201d Proc. of International Test Conference, 1991, pp. 510-519.","DOI":"10.1109\/TEST.1991.519713"},{"key":"270877_CR10","doi-asserted-by":"crossref","unstructured":"P. Nigh, and W. Maly, \u201cTest Generation for Current Testing,\u201d IEEE Design and Testing of Computers, pp. 26-38, Feb. 1990.","DOI":"10.1109\/54.46891"},{"key":"270877_CR11","doi-asserted-by":"crossref","unstructured":"R. Fritzemeier, J. Soden, R. Treece, and C. Hawkins, \u201cIncreased Stuck-at Fault Coverage with Reduced IDDQ Test Sets,\u201d Proc. of International Test Conference, 1990, pp. 427-433.","DOI":"10.1109\/TEST.1990.114051"},{"key":"270877_CR12","doi-asserted-by":"crossref","unstructured":"C. Thibeault and L. Boisvert, \u201cDiagnosis Method Based on 1Iddq Probabilistic Signatures: Experimental Results,\u201d Proc. of International Test Conference, 1998, pp. 1019-1026.","DOI":"10.1109\/TEST.1998.743299"},{"key":"270877_CR13","unstructured":"J. Liu, R. Makki, A. Kayssi, and S. Su, \u201cAn Economical Method For Detecting Disturb Faults in CMOS SRAMs,\u201d IEEE Proceedings of the Economics of Design, Test and Manufacture, Oct. 1996, pp. 39-47."},{"key":"270877_CR14","doi-asserted-by":"crossref","unstructured":"Bram Kruseman, Peter Janssen, and Victor Zieren,\u201cTransient Current Testing of 0.25 mm CMOS Devices,\u201d Proc. of International Test Conference, 1999, pp. 47-56.","DOI":"10.1109\/TEST.1999.805613"},{"key":"270877_CR15","doi-asserted-by":"crossref","unstructured":"Wanli Jiang, Bapiraju Vinnakota, \u201cStatistical Threshold Formulation For Dynamic Idd Test,\u201d IEEE Proc. of International Test Conference, 1999, pp. 57-66.","DOI":"10.1109\/TEST.1999.805614"},{"key":"270877_CR16","doi-asserted-by":"crossref","unstructured":"Amy Germida, Zheng Yan, James F. Plusquellic, and Fidel Muradali, \u201cDefect Detection Using Power Supply Transient Signal Analysis,\u201d Proc. of International Test Conference, 1999, pp. 67-76.","DOI":"10.1109\/TEST.1999.805615"},{"key":"270877_CR17","doi-asserted-by":"crossref","first-page":"51","DOI":"10.1023\/A:1008337200506","volume":"13","author":"Y. Min","year":"1998","unstructured":"Y. Min and Z. Li, \u201cIDDT Testing versus IDDQ Testing,\u201d Journal of Electronic Testing, Vol. 13, pp. 51-55, 1998.","journal-title":"Journal of Electronic Testing"},{"key":"270877_CR18","unstructured":"J. Rius and J. Figueras, \u201cExploring the Combination of IDDQ and iDDT Testing: Energy Testing,\u201d IEEE Proceedings of the European Design Automation Copnference, 1999, pp. 538-542."},{"key":"270877_CR19","doi-asserted-by":"crossref","unstructured":"R. Makki, S. Su, and T. Nagle, \u201cTransient Power Supply Current Testing of Digital CMOS Circuits,\u201d Proc. of International Test Conference, 1995, pp. 892-901.","DOI":"10.1109\/TEST.1995.529922"},{"key":"270877_CR20","volume-title":"CMOS Analog Circuit Design","author":"P.E. Allen","year":"1987","unstructured":"P.E. Allen, CMOS Analog Circuit Design, Harcourt Brace Jovanovich, Inc. Orlando, Florida, 1987."},{"issue":"3","key":"270877_CR21","first-page":"231","volume":"SC-12","author":"E. Vittoz","year":"1977","unstructured":"E. Vittoz and J. Fellrath, \u201cCMOS Analog Integrated Circuits Based on Weak Inversion Operation,\u201d IEEE Journal of Solid-State Circuits, Vol. SC-12, No. 3, pp. 231-244, 1977.","journal-title":"IEEE Journal of Solid-State Circuits"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1023\/A:1008324900917.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1023\/A:1008324900917\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1023\/A:1008324900917.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,6]],"date-time":"2025-06-06T10:12:06Z","timestamp":1749204726000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1023\/A:1008324900917"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2000,10]]},"references-count":21,"journal-issue":{"issue":"5","published-print":{"date-parts":[[2000,10]]}},"alternative-id":["270877"],"URL":"https:\/\/doi.org\/10.1023\/a:1008324900917","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"type":"print","value":"0923-8174"},{"type":"electronic","value":"1573-0727"}],"subject":[],"published":{"date-parts":[[2000,10]]}}}