{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,6]],"date-time":"2025-06-06T10:40:05Z","timestamp":1749206405185,"version":"3.41.0"},"reference-count":13,"publisher":"Springer Science and Business Media LLC","issue":"3","license":[{"start":{"date-parts":[[2000,6,1]],"date-time":"2000-06-01T00:00:00Z","timestamp":959817600000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2000,6,1]],"date-time":"2000-06-01T00:00:00Z","timestamp":959817600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Journal of Electronic Testing"],"published-print":{"date-parts":[[2000,6]]},"DOI":"10.1023\/a:1008331029249","type":"journal-article","created":{"date-parts":[[2002,12,22]],"date-time":"2002-12-22T14:41:38Z","timestamp":1040568098000},"page":"193-202","source":"Crossref","is-referenced-by-count":21,"title":["Low Power BIST by Filtering Non-Detecting Vectors"],"prefix":"10.1007","volume":"16","author":[{"given":"S.","family":"Manich","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Gabarr\u00f3","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Lopez","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.","family":"Figueras","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"P.","family":"Girard","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"L.","family":"Guiller","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"C.","family":"Landrault","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Pravossoudovitch","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"P.","family":"Teixeira","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Santos","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","reference":[{"key":"258858_CR1","unstructured":"W.H. Debany, \u201cQuiescent Scan Design For Testing Digital Logic Circuits,\u201d Proc. Dual-Use Tech. & App., May1994, pp. 142-151."},{"key":"258858_CR2","unstructured":"Y. Zorian, \u201cA Distributed BIST Control Scheme for Complex VLSI Devices,\u201d VLSI Test Symp., April 1993, pp. 4-9."},{"key":"258858_CR3","doi-asserted-by":"crossref","unstructured":"R.M. Chou, K.K. Saluja, and V.D. Agrawal, \u201cPower Constraint Scheduling of Tests,\u201d Proc. 7th International Conf. VLSI Des., Jan. 1994, pp. 271-274.","DOI":"10.1109\/ICVD.1994.282700"},{"key":"258858_CR4","doi-asserted-by":"crossref","unstructured":"H. Cheung and S.K. Gupta, \u201cA Bist Methodology for Comprehensive Testing of RAM with Reduced Heat Dissipation,\u201d Int. Test Conf., Oct. 1996, pp. 386-395.","DOI":"10.1109\/TEST.1996.557026"},{"key":"258858_CR5","unstructured":"S. Wang and S.K. Gupta, \u201cDS-LFSR: A New BIST TPG for Low Heat Dissipation,\u201d Int. Test Conf., Oct. 1997, pp. 848-857."},{"key":"258858_CR6","unstructured":"Al Hertwig and H.-J. Wunderlich, \u201cLow Power Serial Built-In Self-Test,\u201d Eur. Test Work, May 1998, pp. 49-53."},{"key":"258858_CR7","doi-asserted-by":"crossref","unstructured":"X. Zhang, K. Roy, and S. Bawmik, \u201cPOWERTEST: A Tool for Energy Conscious Weighted Random Pattern Testing,\u201d Proc. 12th International Conf. VLSI Design, Jan. 1999, pp. 416-422.","DOI":"10.1109\/ICVD.1999.745191"},{"key":"258858_CR8","doi-asserted-by":"crossref","unstructured":"P. Girard, L. Guiller, C. Landrault, and S. Pravossoudovitch, \u201cA Test Vector Inhibiting Technique for LowEnergy BIST Design,\u201d VLSI Test Sym., April 1999, pp. 407-412.","DOI":"10.1109\/VTEST.1999.766696"},{"key":"258858_CR9","doi-asserted-by":"crossref","unstructured":"S. Hellebrand, S. Tarnick, J. Rajski, and B. Courtois, \u201cGeneration of Vector Patterns Through Reseeding of Multiple-Polynomial Linear Feedback Shift Register,\u201d Proc. Int. Test Conf., Oct. 1992, pp. 120-129.","DOI":"10.1109\/TEST.1992.527812"},{"key":"258858_CR10","unstructured":"P. Girard, L. Guiller, J. Figueras, S. Manich, P. Teixeira, and M. Santos, \u201cLow Power Pseudo-random BIST: On Selecting the LFSR Seed,\u201d Dis. Cir. Int. Sist., Nov. 1998, pp. 166-172."},{"key":"258858_CR11","doi-asserted-by":"crossref","unstructured":"W. Nebel and J. Mermet, \u201cLow Power Design in Deep Submicron Electronics,\u201d NATO ASI Series, Vol. 337, Kluwer, 1996.","DOI":"10.1007\/978-1-4615-5685-5"},{"key":"258858_CR12","unstructured":"S. Manich and J. Figueras, \u201cSensitivity of the Worst Case Dynamic Power Estimation on Delay and Filtering Models,\u201d Pow. Tim. Mod. Opt. Sim., Sept. 1997, pp. 141-150."},{"key":"258858_CR13","unstructured":"E.M. Sentovich, K.J. Singh, L. Lavagno, C. Moon, R. Murgai, A. Saldanha, H. Savoj, P.R. Stephan, R.K. Brayton, and A.S.-Vincentelli, \u201cSIS: A System for Sequential Circuit Synthesis,\u201d Elec. Res. Lab. Memo. UCB\/ERL M92\/41, May 1992."}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1023\/A:1008331029249.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1023\/A:1008331029249\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1023\/A:1008331029249.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,6]],"date-time":"2025-06-06T10:16:33Z","timestamp":1749204993000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1023\/A:1008331029249"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2000,6]]},"references-count":13,"journal-issue":{"issue":"3","published-print":{"date-parts":[[2000,6]]}},"alternative-id":["258858"],"URL":"https:\/\/doi.org\/10.1023\/a:1008331029249","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"type":"print","value":"0923-8174"},{"type":"electronic","value":"1573-0727"}],"subject":[],"published":{"date-parts":[[2000,6]]}}}