{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,6]],"date-time":"2025-06-06T10:40:05Z","timestamp":1749206405595,"version":"3.41.0"},"reference-count":24,"publisher":"Springer Science and Business Media LLC","issue":"3","license":[{"start":{"date-parts":[[2000,6,1]],"date-time":"2000-06-01T00:00:00Z","timestamp":959817600000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2000,6,1]],"date-time":"2000-06-01T00:00:00Z","timestamp":959817600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Journal of Electronic Testing"],"published-print":{"date-parts":[[2000,6]]},"DOI":"10.1023\/a:1008374811502","type":"journal-article","created":{"date-parts":[[2002,12,22]],"date-time":"2002-12-22T14:41:38Z","timestamp":1040568098000},"page":"169-177","source":"Crossref","is-referenced-by-count":0,"title":["Deterministic BIST with Partial Scan"],"prefix":"10.1007","volume":"16","author":[{"given":"Gundolf","family":"Kiefer","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hans-Joachim","family":"Wunderlich","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","reference":[{"key":"258855_CR1","doi-asserted-by":"crossref","unstructured":"S. Hellebrand, B. Reeb, S. Tarnick, and H.-J.Wunderlich, \u201cPattern Generation for a Deterministic BIST Scheme,\u201d Proc. Int. Conf. on Computer-Aided Design (ICCAD), 1995, pp. 88-94.","DOI":"10.1109\/ICCAD.1995.479997"},{"key":"258855_CR2","doi-asserted-by":"crossref","unstructured":"G. Kiefer and H.-J.Wunderlich, \u201cDeterministic BIST with Multiple Scan Chains,\u201d Proc. of International Test Conference (ITC), 1998, pp. 1057-1064.","DOI":"10.1109\/TEST.1998.743304"},{"key":"258855_CR3","doi-asserted-by":"crossref","unstructured":"G. Kiefer and H.-J.Wunderlich, \u201cUsing BIST Control for Pattern Generation,\u201d Proc. IEEE Int. Test Conf. (ITC), 1997, pp. 347-355.","DOI":"10.1109\/TEST.1997.639636"},{"key":"258855_CR4","unstructured":"B. Koenemann, \u201cLFSR-Coded Test Patterns for Scan Design,\u201d Proc. Europ. Test Conf. (ETC), Munich 1991, pp. 237-242."},{"key":"258855_CR5","doi-asserted-by":"crossref","unstructured":"N.A. Touba and E.J. McCluskey, \u201cAltering a Pseudo-Random Bit Sequence for Scan-Based BIST,\u201d Proc. Int. Test Conf. (ITC), 1996, pp. 167-175.","DOI":"10.1109\/TEST.1996.556959"},{"issue":"3","key":"258855_CR6","doi-asserted-by":"crossref","first-page":"265","DOI":"10.1147\/rd.273.0265","volume":"27","author":"E.B. Eichelberger","year":"1983","unstructured":"E.B. Eichelberger and E. Lindbloom, \u201cRandom Pattern Coverage Enhancement and Diagnosis for LSSD Logic Self-Test,\u201d IBM Journal of Research and Development, Vol. 27, No. 3, pp. 265-272, May 1983.","journal-title":"IBM Journal of Research and Development"},{"key":"258855_CR7","unstructured":"P.H. Bardell and W.H. McAnney, \u201cParallel Pseudo-Random Sequences for Built-In Test,\u201d Proc. Int. Test Conf. (ITC), 1984, pp. 302-308."},{"key":"258855_CR8","unstructured":"B. Koenemann, J. Mucha, and G. Zwiehoff, \u201cBuilt-In Logic Block Observation Techniques,\u201d Proc. of International Test Conference (ITC), 1979."},{"key":"258855_CR9","unstructured":"E. Trischler, \u201cIncomplete Scan Path with Automatic Test Generation Methodology,\u201d Proc. International Test Conference (ITC), 1980, pp. 153-162."},{"key":"258855_CR10","doi-asserted-by":"crossref","unstructured":"M. Abramovici, J.J. Kulikowski, and R.K. Roy, \u201cThe Best Flipflops to Scan,\u201d Proc. International Test Conference (ITC), 1991, pp. 166-173.","DOI":"10.1109\/TEST.1991.519507"},{"key":"258855_CR11","doi-asserted-by":"crossref","unstructured":"F. Corno, P. Prinetto, M. Sonza Reorda, and M. Violante, \u201cExploiting Symbolic Techniques for Partial Scan Flip Flop Selection,\u201d Design, Automation and Test in Europe (DATE), 1998, pp. 670-677.","DOI":"10.1109\/DATE.1998.655930"},{"key":"258855_CR12","doi-asserted-by":"crossref","unstructured":"V. Chickermane and J.H. Patel, \u201cA Fault Oriented Partial Scan Design Approach,\u201d Proc. of Intl. Conf. On Comp.-Aided Design (ICCAD), 1991, pp. 400-403.","DOI":"10.1109\/ICCAD.1991.185287"},{"key":"258855_CR13","unstructured":"D. Xiang and J.H. Patel, \u201cA Global Algorithm for the Partial Scan Design Problem Using Circuit State Information,\u201d Proc. International Test Conference (ITC), 1996."},{"key":"258855_CR14","doi-asserted-by":"crossref","unstructured":"S.T. Chakradhar, A. Balakrishnan, and V.D. Agrawal, \u201cAn Exact Algorithm for Selecting Partial Scan Flipflops,\u201d Proc. of Design Automation Conference (DAC), 1994, pp. 81-86.","DOI":"10.1145\/196244.196285"},{"key":"258855_CR15","doi-asserted-by":"crossref","unstructured":"K.T. Cheng and V.D. Agrawal, \u201cA Partial Scan Method for Sequential Circuits with Feedback,\u201d IEEE Trans. on Comp., 1990, pp. 544-548.","DOI":"10.1109\/12.54847"},{"issue":"4","key":"258855_CR16","doi-asserted-by":"crossref","first-page":"8","DOI":"10.1109\/12.54846","volume":"39","author":"R. Gupta","year":"1990","unstructured":"R. Gupta, R. Gupta, and M.A. Breuer, \u201cThe BALLAST Methodology for Structured Partial Scan Design,\u201d IEEE Trans. on Comp., Vol. 39, No. 4, pp. 8-15, 1990.","journal-title":"IEEE Trans. on Comp."},{"key":"258855_CR17","doi-asserted-by":"crossref","first-page":"163","DOI":"10.1007\/BF00137392","volume":"1","author":"A. Kunzmann","year":"1990","unstructured":"A. Kunzmann and H.-J. Wunderlich, \u201cAn Analytical Approach to the Partial Scan Problem,\u201d Journal of Electronic Testing: Theory and Application (JETTA), Vol. 1, pp. 163-174, 1990.","journal-title":"Journal of Electronic Testing: Theory and Application (JETTA)"},{"key":"258855_CR18","unstructured":"E.J. Marinissen and M. Muijen, \u201cSmartScan: Partial Scan with Full Scan Benefits,\u201d 4th IEEE International Test Synthesis Workshop, Santa Barbara, CA, 1997."},{"key":"258855_CR19","unstructured":"H.-J. Wunderlich, \u201cThe Design of Random-Testable Sequential Circuits,\u201d 19th Int. Symp. On Fault-Tolerant Computing (FTCS), 1989."},{"key":"258855_CR20","doi-asserted-by":"crossref","unstructured":"Journal of Electronic Testing: Theory and Applications (JETTA): Special Issue on Partial Scan Methods, Vol. 7, Aug.\/Oct. 1995.","DOI":"10.1007\/BF00993310"},{"key":"258855_CR21","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4613-2821-6","volume-title":"Logic Minimization Algorithms for VLSI Synthesis","author":"R.K. Brayton","year":"1984","unstructured":"R.K. Brayton, G.D. Hachtel, C. McMullen, and A. Sangiovanni-Vincentelli, \u201cLogic Minimization Algorithms for VLSI Synthesis,\u201d Kluwer Academic Publishers, Boston, 1984."},{"key":"258855_CR22","doi-asserted-by":"crossref","unstructured":"H.-J.Wunderlich and G. Kiefer, \u201cBit-Flipping BIST,\u201d Proc. Int. Conf.On Computer-Aided Design (ICCAD), 1996, pp. 337-343.","DOI":"10.1109\/ICCAD.1996.569803"},{"key":"258855_CR23","doi-asserted-by":"crossref","unstructured":"R.M. Karp, \u201cReducibility among combinatorial problems,\u201d R.E. Miller and J.W. Thatcher (eds.), Complexity of Computer, Computations, Plenum Press, New York, pp. 85-103.","DOI":"10.1007\/978-1-4684-2001-2_9"},{"key":"258855_CR24","doi-asserted-by":"crossref","unstructured":"F. Brglez, D. Bryan, and K. Komzminski, \u201cCombinational Pro-files of Sequential Benchmark Circuits,\u201d Proc. Int. Symp. On Circuits and Systems (ISCAS), 1989, pp. 1929-1934.","DOI":"10.1109\/ISCAS.1989.100747"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1023\/A:1008374811502.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1023\/A:1008374811502\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1023\/A:1008374811502.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,6]],"date-time":"2025-06-06T10:13:08Z","timestamp":1749204788000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1023\/A:1008374811502"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2000,6]]},"references-count":24,"journal-issue":{"issue":"3","published-print":{"date-parts":[[2000,6]]}},"alternative-id":["258855"],"URL":"https:\/\/doi.org\/10.1023\/a:1008374811502","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"type":"print","value":"0923-8174"},{"type":"electronic","value":"1573-0727"}],"subject":[],"published":{"date-parts":[[2000,6]]}}}