{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,6]],"date-time":"2025-06-06T10:40:07Z","timestamp":1749206407886,"version":"3.41.0"},"reference-count":14,"publisher":"Springer Science and Business Media LLC","issue":"2","license":[{"start":{"date-parts":[[2001,4,1]],"date-time":"2001-04-01T00:00:00Z","timestamp":986083200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2001,4,1]],"date-time":"2001-04-01T00:00:00Z","timestamp":986083200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Journal of Electronic Testing"],"published-print":{"date-parts":[[2001,4]]},"DOI":"10.1023\/a:1011117625500","type":"journal-article","created":{"date-parts":[[2002,12,23]],"date-time":"2002-12-23T08:43:03Z","timestamp":1040632983000},"page":"109-119","source":"Crossref","is-referenced-by-count":1,"title":["Cost\/Quality Trade-off in Synthesis for BIST"],"prefix":"10.1007","volume":"17","author":[{"given":"P.","family":"Bukovjan","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"L.","family":"Ducerf-Bourbon","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Marzouki","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","reference":[{"key":"338731_CR1","volume-title":"Digital System Testing and Testable Design, Revised Printing","author":"M. Abramovici","year":"1995","unstructured":"M. Abramovici, M. Breuer, and A. Friedman, Digital System Testing and Testable Design, Revised Printing. New Jersey, USA: IEEE Press, 1995."},{"key":"338731_CR2","unstructured":"D. Berthelot, M. Flottes, and B. Rouzeyre, \u201cOptiBIST: A Tool for BISTing Datapaths,\u201d Proc. of IEEE European Test Workshop, Barcelona, Spain, 1998, pp. 123-127."},{"key":"338731_CR3","unstructured":"D. Berthelot, M. Flottes, and B. Rouzeyre, \u201cDatapath BIST Scheme for Full Testing,\u201d Compendium of Papers from IEEE European Test Workshop, Constance, Germany, 1999."},{"key":"338731_CR4","volume-title":"Allocation for Testability in High-Level Synthesis","author":"P. Bukovjan","year":"2000","unstructured":"P. Bukovjan, \u201cAllocation for Testability in High-Level Synthesis,\u201d Ph.D. thesis, INP, Grenoble, France, 2000. http:\/\/www-asim.lip6.fr\/publications\/2000\/index.gb.html."},{"key":"338731_CR5","unstructured":"P. Bukovjan, L.D. Bourbon, and M. Marzouki, \u201cCost\/Quality Trade-Off in Synthesis for BIST,\u201d 1st IEEE Latin America Test Workshop, Rio de Janeiro, Brazil, 2000, pp. 110-115."},{"key":"338731_CR6","unstructured":"P. Bukovjan, L.D. Bourbon, and M. Marzouki, \u201cCost\/Quality Trade-Off in Synthesis for Scan,\u201d Proc. Design and Diagnostics of Electronic Circuits and Systems Workshop, Smolenica, Slovakia, 2000, pp. 30-33."},{"key":"338731_CR7","doi-asserted-by":"crossref","unstructured":"P. Bukovjan, M. Marzouki, and W. Maroufi, \u201cDesign for Testability Reuse in Synthesis for Testability,\u201d Proc. XII Symposium on Integrated Circuits and System Design, Natal, Brazil, 1999, pp. 206-209.","DOI":"10.1109\/SBCCI.1999.803123"},{"key":"338731_CR8","unstructured":"P. Bukovjan, M. Marzouki, and W. Maroufi, \u201cTestability Analysis in High-Level Synthesis for Testability,\u201d Proc. 10th European Workshop on Dependable Computing, Wien, Austria, 1999. pp. 71-75."},{"key":"338731_CR9","doi-asserted-by":"crossref","unstructured":"P.S. Cardoso, M. Strum, J. De. A. Amazonas, and W. Chau, \u201cComparison between Quasi-Uniform Linear Cellular Automata and Linear Feedback Shift Registers as Test Pattern Generators for Built-In Self-Test Applications,\u201d Proc. XII Symposium on Integrated Circuits and System Design, Natal, Brazil, 1999, pp. 198-200.","DOI":"10.1109\/SBCCI.1999.803121"},{"key":"338731_CR10","unstructured":"F. Dromard, Y. Body, M. Paget, A. Greiner, P. Bazargan-Sabet, and F. P\u00e9trot, \u201cInteractive Learning of Processor Architecture,\u201d Proc 5th International Conference on Computer Aided Engineering Education, Sofia, Bulgaria, 1999, pp. 123-129."},{"key":"338731_CR11","unstructured":"L. Ducerf-Bourbon, P. Bukovjan, and M. Marzouki, \u201cTACOS: A Testability Allocation and Control System. Compendium of Papers from IEEE European Test Workshop, Cascais, Portugal, 2000."},{"key":"338731_CR12","doi-asserted-by":"crossref","unstructured":"H. Harmanani and C. Papachriston, \u201cAn Improved Method for RTL Synthesis with Testability TradeOffs,\u201d Proc. IEEE\/ACM International Conference on Computer-Aided Design, 1993, pp. 30-35.","DOI":"10.1109\/ICCAD.1993.580027"},{"key":"338731_CR13","doi-asserted-by":"crossref","unstructured":"I. Parulkar, S. Gupta, and M. Breuer, \u201cData Path Allocation for Synthesizing RTL Design with Low BIST Area Overhead,\u201d Proc. Design Automation Conference, San Francisco, 1995, pp. 395-401.","DOI":"10.1145\/217474.217561"},{"key":"338731_CR14","doi-asserted-by":"crossref","unstructured":"P. Paulin, J. Knight, and E. Girezyc, \u201cHAL: A Multi-Paradigm Approach to Automation Data Path Snthesis,\u201d Proc. Design Automation Conference, 1986, pp. 263-270.","DOI":"10.1109\/DAC.1986.1586099"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1023\/A:1011117625500.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1023\/A:1011117625500\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1023\/A:1011117625500.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,6]],"date-time":"2025-06-06T10:18:56Z","timestamp":1749205136000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1023\/A:1011117625500"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2001,4]]},"references-count":14,"journal-issue":{"issue":"2","published-print":{"date-parts":[[2001,4]]}},"alternative-id":["338731"],"URL":"https:\/\/doi.org\/10.1023\/a:1011117625500","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"type":"print","value":"0923-8174"},{"type":"electronic","value":"1573-0727"}],"subject":[],"published":{"date-parts":[[2001,4]]}}}