{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,7]],"date-time":"2025-06-07T04:03:54Z","timestamp":1749269034349,"version":"3.41.0"},"reference-count":14,"publisher":"Springer Science and Business Media LLC","issue":"2","license":[{"start":{"date-parts":[[2002,4,1]],"date-time":"2002-04-01T00:00:00Z","timestamp":1017619200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2002,4,1]],"date-time":"2002-04-01T00:00:00Z","timestamp":1017619200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Journal of Electronic Testing"],"published-print":{"date-parts":[[2002,4]]},"DOI":"10.1023\/a:1014941525735","type":"journal-article","created":{"date-parts":[[2002,12,28]],"date-time":"2002-12-28T21:55:50Z","timestamp":1041112550000},"page":"145-157","source":"Crossref","is-referenced-by-count":4,"title":["Hardware Generation of Random Single Input Change Test Sequences"],"prefix":"10.1007","volume":"18","author":[{"given":"R.","family":"David","sequence":"first","affiliation":[]},{"given":"P.","family":"Girard","sequence":"additional","affiliation":[]},{"given":"C.","family":"Landrault","sequence":"additional","affiliation":[]},{"given":"S.","family":"Pravossoudovitch","sequence":"additional","affiliation":[]},{"given":"A.","family":"Virazel","sequence":"additional","affiliation":[]}],"member":"297","reference":[{"key":"394991_CR1","volume-title":"Digital Systems Testing and Testable Design","author":"M. Abramovici","year":"1990","unstructured":"M. Abramovici, M.A. Breuer, and A.D. Friedman, Digital Systems Testing and Testable Design, New York: Comp. Sc. Press, 1990."},{"issue":"7","key":"394991_CR2","doi-asserted-by":"crossref","first-page":"653","DOI":"10.1109\/TC.1986.1676810","volume":"35","author":"P.H. Bardell","year":"1986","unstructured":"P.H. Bardell and W.H. McAnney, \u201cPseudorandom Arrays for Built-In Tests,\u201d IEEE Trans. on Comp., vol. 35, no. 7, pp. 653\u2013658, 1986.","journal-title":"IEEE Trans. on Comp."},{"key":"394991_CR3","doi-asserted-by":"crossref","unstructured":"F. Brglez, D. Bryant, and K. Kozminski, \u201cCombinational Pro-files of Sequential Benchmark Circuits,\u201d in IEEE Int. Symp. on Circuits and Systems, 1989, pp. 1929\u20131934.","DOI":"10.1109\/ISCAS.1989.100747"},{"key":"394991_CR4","doi-asserted-by":"crossref","unstructured":"S. Cr\u00e9paux-Motte, M. Jacomino, and R. David, \u201cAn Algebraic Method for Delay Fault Testing,\u201d in IEEE VLSI Test Symposium, 1996, pp. 308\u2013315.","DOI":"10.1109\/VTEST.1996.510873"},{"key":"394991_CR5","volume-title":"Random Testing of Digital Circuits: Theory and Applications","author":"R. David","year":"1998","unstructured":"R. David, Random Testing of Digital Circuits: Theory and Applications, New York: Marcel Dekker, 1998."},{"key":"394991_CR6","doi-asserted-by":"crossref","unstructured":"P. Girard, C. Landrault, V. Mor\u00e9da, and S. Pravossoudovitch, \u201cAn Optimized BIST Test Pattern Generator for Delay Testing,\u201d in IEEE VLSI Test Symposium, 1997, pp. 94\u201399.","DOI":"10.1109\/VTEST.1997.599448"},{"key":"394991_CR7","unstructured":"D.E. Knuth, The Art of Computer Programming, vol. 2: Seminumerical Algorithms, Reading, MA: Addison-Wesley, 1969."},{"key":"394991_CR8","doi-asserted-by":"crossref","unstructured":"J. Rajski, G. Mrugalski, and J. Tyszer, \u201cComparative Study of CA-based PRPGs and LFRSs with Phase Shifters,\u201d in IEEE VLSI Test Symposium, 1999, pp. 236\u2013245.","DOI":"10.1109\/VTEST.1999.766671"},{"key":"394991_CR9","unstructured":"G.L. Smith, \u201cModel for Delay Faults Based upon Paths,\u201d in Int. Test Conference, 1985, pp. 342\u2013349."},{"key":"394991_CR10","unstructured":"TestGen, version Tg4.1 User Guide, Synopsys Inc., 1999."},{"key":"394991_CR11","unstructured":"A. Virazel, \u201cTest Int\u00e9,gr\u00e9 des Circuits Digitaux: Analyse et G\u00e9n\u00e9ration de S\u00e9quences Al\u00e9eatoires Adjacentes,\u201d Ph.D. thesis, Univ. of Montpellier, November 2001."},{"issue":"3","key":"394991_CR12","doi-asserted-by":"crossref","first-page":"233","DOI":"10.1023\/A:1012259227622","volume":"17","author":"A. Virazel","year":"2001","unstructured":"A. Virazel, R. David, P. Girard, C. Landrault, and S. Pravossoudovitch, \u201cDelay Fault Testing: Effectiveness of Random SIC and Random MIC Test Sequences,\u201d Journal of Electronic Testing, vol. 17, no. 3\/4, pp. 233\u2013241, 2001.","journal-title":"Journal of Electronic Testing"},{"key":"394991_CR13","doi-asserted-by":"crossref","unstructured":"W. Wang and S.K. Gupta, \u201cWeighted Random Robust Path Delay Testing of Synthesized Multilevel Circuits,\u201d in IEEE VLSI Test Symposium, 1994, pp. 291\u2013297.","DOI":"10.1109\/VTEST.1994.292298"},{"key":"394991_CR14","volume-title":"Built-In Self Test (BIST): Synthesis of Self-Testable Systems","author":"H.J. Wunderlich","year":"1997","unstructured":"H.J. Wunderlich and Y. Zorian, Built-In Self Test (BIST): Synthesis of Self-Testable Systems, Boston, MA: Kluwer Acad. Pub., 1997."}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1023\/A:1014941525735.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1023\/A:1014941525735\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1023\/A:1014941525735.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,6]],"date-time":"2025-06-06T10:03:21Z","timestamp":1749204201000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1023\/A:1014941525735"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2002,4]]},"references-count":14,"journal-issue":{"issue":"2","published-print":{"date-parts":[[2002,4]]}},"alternative-id":["394991"],"URL":"https:\/\/doi.org\/10.1023\/a:1014941525735","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"type":"print","value":"0923-8174"},{"type":"electronic","value":"1573-0727"}],"subject":[],"published":{"date-parts":[[2002,4]]}}}