{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,14]],"date-time":"2026-05-14T00:00:51Z","timestamp":1778716851690,"version":"3.51.4"},"reference-count":22,"publisher":"Springer Science and Business Media LLC","issue":"6","license":[{"start":{"date-parts":[[2002,12,1]],"date-time":"2002-12-01T00:00:00Z","timestamp":1038700800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2002,12,1]],"date-time":"2002-12-01T00:00:00Z","timestamp":1038700800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Journal of Electronic Testing"],"published-print":{"date-parts":[[2002,12]]},"DOI":"10.1023\/a:1020805224219","type":"journal-article","created":{"date-parts":[[2003,3,18]],"date-time":"2003-03-18T20:57:25Z","timestamp":1048021045000},"page":"637-647","source":"Crossref","is-referenced-by-count":13,"title":["A Built-in Self-Test Scheme with Diagnostics Support for Embedded SRAM"],"prefix":"10.1007","volume":"18","author":[{"given":"Chih-Wea","family":"Wang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chi-Feng","family":"Wu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jin-Fu","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Cheng-Wen","family":"Wu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tony","family":"Teng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kevin","family":"Chiu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hsiao-Ping","family":"Lin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","reference":[{"key":"5100336_CR1","volume-title":"Digital Systems Testing and Testable Design","author":"M. Abramovici","year":"1990","unstructured":"M. Abramovici, M.A. Breuer, and A.D. Friedman, Digital Systems Testing and Testable Design, New York: Computer Science Press, 1990."},{"key":"5100336_CR2","doi-asserted-by":"crossref","unstructured":"T.J. Bergfeld, D. Niggemeyer, and E.M. Rudnick, \u201cDiagnostic Testing of Embedded Memories Using BIST,\u201d in Proc. Design, Automation and Test in Europe (DATE), Paris, 2000, pp. 305\u2013309.","DOI":"10.1109\/DATE.2000.840288"},{"issue":"3","key":"5100336_CR3","doi-asserted-by":"crossref","first-page":"86","DOI":"10.1109\/MDT.1995.466385","volume":"12","author":"P. Camurati","year":"1995","unstructured":"P. Camurati, P. Prinetto, M.S. Reorda, S. Barbagallo, A. Burri, and D. Medina, \u201cIndustrial BIST of Embedded RAMs,\u201d IEEE Design & Test of Computers, vol. 12, no. 3, pp. 86\u201395, 1995.","journal-title":"IEEE Design & Test of Computers"},{"key":"5100336_CR4","doi-asserted-by":"crossref","first-page":"321","DOI":"10.1007\/BF00972517","volume":"5","author":"B.F. Cockburn","year":"1994","unstructured":"B.F. Cockburn, \u201cTutorial on Semiconductor Memory Testing,\u201d J. Electronic Testing: Theory and Application, vol. 5, pp. 321\u2013336, 1994.","journal-title":"J. Electronic Testing: Theory and Application"},{"key":"5100336_CR5","doi-asserted-by":"crossref","unstructured":"R. Dekker, F. Beenker, and L. Thijssen, \u201cFault Modeling andTest Algorithm Development for Static Random Access Memories,\u201d in Proc. Int. Test Conf. (ITC), 1988, pp. 343\u2013352.","DOI":"10.1109\/TEST.1988.207820"},{"issue":"6","key":"5100336_CR6","doi-asserted-by":"crossref","first-page":"567","DOI":"10.1109\/43.55188","volume":"9","author":"R. Dekker","year":"1990","unstructured":"R. Dekker, F. Beenker, and L. Thijssen, \u201cA Realistic Fault Model and Test Algorithm for Static Random Access Memories,\u201d IEEE Trans. Computer-Aided Design of Integrated Circuits and Systems, vol. 9, no. 6, pp. 567\u2013572, 1990.","journal-title":"IEEE Trans. Computer-Aided Design of Integrated Circuits and Systems"},{"key":"5100336_CR7","unstructured":"S. Hamdioui and A. van de Goor, \u201cAn Experimental Analysis of Spot Defects in SRAMs: Realistic Fault Models and Tests,\u201d in: Proc. Ninth IEEE Asian Test Symp. (ATS), Taipei, 2000, pp. 131\u2013138."},{"issue":"1","key":"5100336_CR8","doi-asserted-by":"crossref","first-page":"59","DOI":"10.1109\/54.748806","volume":"16","author":"C.-T. Huang","year":"1999","unstructured":"C.-T. Huang, J.-R. Huang, C.-F. Wu, C.-W. Wu, and T.-Y. Chang, \u201cA Programmable BIST Core for Embedded DRAM,\u201d IEEE Design & Test of Computers, vol. 16, no. 1, pp. 59\u201370, 1999.","journal-title":"IEEE Design & Test of Computers"},{"key":"5100336_CR9","unstructured":"I. Kim, Y. Zorian, G. Komoriya, H. Pham, F.P. Higgins, and J.L. Lweandowski, \u201cBuilt in Self Repair for Embedded High Density SRAM,\u201d in Proc. Int. Test Conf. (ITC), 1998, pp. 1112\u20131119."},{"key":"5100336_CR10","unstructured":"J.-F. Li, K.-L. Cheng, C.-T. Huang, and C.-W. Wu, \u201cMarch-Based RAM Diagnosis Algorithms for Stuck-at and Coupling Faults,\u201d in Proc. Int. Test Conf. (ITC), Baltmore, 2001, pp. 758\u2013767"},{"key":"5100336_CR11","unstructured":"J.-F. Li, R.-S. Tzeng, and C.-W. Wu, \u201cUsing Syndrome Compression for Memory Built-in Self-Diagnosis,\u201d in Proc. Int. Symp. VLSI Technology, Systems, and Applications (VLSI-TSA), Hsinchu, 2001, pp. 303\u2013306."},{"key":"5100336_CR12","unstructured":"J.-F. Li and C.-W. Wu, \u201cMemory Fault Diagnosis by Syndrome Compression,\u201d in Proc. Design, Automation and Test in Europe (DATE), Munich, 2001, pp. 97\u2013101."},{"key":"5100336_CR13","doi-asserted-by":"crossref","unstructured":"V.G. Mikitjuk, V.N. Yarmolik, and A.J. van de Goor, \u201cRAM Testing Algorithms for Detecting Multiple Linked Faults,\u201d in Proc. cnEuropean Design and Test Conf. (ED&TC), 1996, pp. 435\u2013439.","DOI":"10.1109\/EDTC.1996.494337"},{"key":"5100336_CR14","doi-asserted-by":"crossref","unstructured":"D. Niggemeyer and E. Rudnick, \u201cAutomatic Generation of Diagnostic March Tests,\u201d in Proc. IEEE VLSI Test Symp. (VTS), Marina Del Rey, California, 2001, pp. 299\u2013304.","DOI":"10.1109\/VTS.2001.923453"},{"issue":"2","key":"5100336_CR15","doi-asserted-by":"crossref","first-page":"24","DOI":"10.1109\/54.211525","volume":"10","author":"R.P. Treuer","year":"1993","unstructured":"R.P. Treuer and V.K. Agarwal, \u201cBuilt-in Self-Diagnosis for Repairable Embedded RAMs,\u201d IEEE Design & Test of Computers, vol. 10, no. 2, pp. 24\u201333, 1993.","journal-title":"IEEE Design & Test of Computers"},{"issue":"1","key":"5100336_CR16","doi-asserted-by":"crossref","first-page":"8","DOI":"10.1109\/54.199799","volume":"10","author":"A.J. van de Goor","year":"1993","unstructured":"A.J. van de Goor, \u201cUsing March Tests to Test SRAMs,\u201d IEEE Design & Test of Computers, vol. 10, no. 1, pp. 8\u201314, 1993.","journal-title":"IEEE Design & Test of Computers"},{"key":"5100336_CR17","volume-title":"Testing Semiconductor Memories: Theory and Practice","author":"A.J. van de Goor","year":"1998","unstructured":"A.J. van de Goor, Testing Semiconductor Memories: Theory and Practice, Gouda, The Netherlands: ComTex Publishing, 1998."},{"key":"5100336_CR18","doi-asserted-by":"crossref","unstructured":"A.J. van de Goor, G.N. Gaydadjiev, V.N. Yarmolik, and V.G. Mikitjuk, \u201cMarch LA: A Test for Linked Memory Faults,\u201d in tiProc. European Design and Test Conf. (ED&TC), 1997, p. 627.","DOI":"10.1049\/ip-cds:19971147"},{"key":"5100336_CR19","unstructured":"C.-F. Wu, C.-T. Huang, K.-L. Cheng, and C.-W. Wu, \u201cSimulation-based Test Algorithm Generation for Random Access Memories,\u201d inProc. IEEE VLSI Test Symp. (VTS), Montreal, 2000, pp. 291\u2013296."},{"key":"5100336_CR20","unstructured":"C.-F. Wu, C.-T. Huang, C.-W. Wang, K.-L. Cheng, and C.-W. Wu, \u201cError Catch and Analysis for Semiconductor Memories Using March Tests,\u201d in Proc. IEEE\/ACM Int. Conf. Computer-Aided Design (ICCAD), San Jose, 2000, pp. 468\u2013471."},{"key":"5100336_CR21","unstructured":"C.-F. Wu, C.-T. Huang, and C.-W. Wu, \u201cRAMSES:AFast Memory Fault Simulator,\u201d in Proc. IEEE Int. Symp. Defect and Fault Tolerance in VLSI Systems (DFT), Albuquerque, 1999, pp. 165\u2013173. A Built-in Self-Test Scheme 647"},{"issue":"6","key":"5100336_CR22","doi-asserted-by":"crossref","first-page":"52","DOI":"10.1109\/2.769444","volume":"32","author":"Y. Zorian","year":"1999","unstructured":"Y. Zorian, E.J. Marinissen, and S. Dey, \u201cTesting Embedded-Core-based System Chips,\u201d IEEE Computer, vol. 32, no. 6, pp. 52\u201360, 1999.","journal-title":"IEEE Computer"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1023\/A:1020805224219.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1023\/A:1020805224219\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1023\/A:1020805224219.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,6]],"date-time":"2025-06-06T10:03:42Z","timestamp":1749204222000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1023\/A:1020805224219"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2002,12]]},"references-count":22,"journal-issue":{"issue":"6","published-print":{"date-parts":[[2002,12]]}},"alternative-id":["5100336"],"URL":"https:\/\/doi.org\/10.1023\/a:1020805224219","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"value":"0923-8174","type":"print"},{"value":"1573-0727","type":"electronic"}],"subject":[],"published":{"date-parts":[[2002,12]]}}}