{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,6]],"date-time":"2025-06-06T10:40:06Z","timestamp":1749206406584,"version":"3.41.0"},"reference-count":12,"publisher":"Springer Science and Business Media LLC","issue":"6","license":[{"start":{"date-parts":[[2003,12,1]],"date-time":"2003-12-01T00:00:00Z","timestamp":1070236800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2003,12,1]],"date-time":"2003-12-01T00:00:00Z","timestamp":1070236800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Journal of Electronic Testing"],"published-print":{"date-parts":[[2003,12]]},"DOI":"10.1023\/a:1027466620872","type":"journal-article","created":{"date-parts":[[2003,11,10]],"date-time":"2003-11-10T19:23:58Z","timestamp":1068492238000},"page":"611-623","source":"Crossref","is-referenced-by-count":2,"title":["Defect Diagnosis Using a Current Ratio Based Quiescent Signal Analysis Model for Commercial Power Grids"],"prefix":"10.1007","volume":"19","author":[{"given":"Chintan","family":"Patel","sequence":"first","affiliation":[]},{"given":"Ernesto","family":"Staroswiecki","sequence":"additional","affiliation":[]},{"given":"Smita","family":"Pawar","sequence":"additional","affiliation":[]},{"given":"Dhruva","family":"Acharyya","sequence":"additional","affiliation":[]},{"given":"Jim","family":"Plusquellic","sequence":"additional","affiliation":[]}],"member":"297","reference":[{"key":"5148041_CR1","unstructured":"A.E. Gattiker and W. Maly, \u201cCurrent Signatures,\u201d in VTS, 1996, pp. 112-117."},{"key":"5148041_CR2","doi-asserted-by":"crossref","unstructured":"C.L. Henderson and J.M. Soden, \u201cSignature Analysis for IC Diagnosis and Failure Analysis,\u201d in ITC, 1997, pp. 310-318.","DOI":"10.1109\/TEST.1997.639632"},{"key":"5148041_CR3","doi-asserted-by":"crossref","unstructured":"P. Maxwell, P. O'Neill, R. Aitkin, R. Dudley, N. Jaarsma, M. Quach, and D. Wiseman, \u201cCurrent Ratios: A Self-Scaling Technique for Production I\nDDQ Testing,\u201d in ITC, 1999, pp. 738\u2013746.","DOI":"10.1109\/TEST.1999.805803"},{"key":"5148041_CR4","unstructured":"MOSIS at http:\/\/www.mosis.edu\/Technical\/Testdata\/tsmc-025-prm.html."},{"key":"5148041_CR5","doi-asserted-by":"crossref","unstructured":"S. Nassif and J. Kozhaya, \u201cFast Power Grid Simulation,\u201d in DAC, 2000, pp. 156-161.","DOI":"10.1145\/337292.337359"},{"key":"5148041_CR6","doi-asserted-by":"crossref","unstructured":"C. Patel and J. Plusquellic, \u201cA Process and Technology-Tolerant I\nDDQ Method for IC Diagnosis,\u201d in VTS, 2001, pp. 145-150.","DOI":"10.1109\/VTS.2001.923431"},{"key":"5148041_CR7","doi-asserted-by":"crossref","unstructured":"C. Patel, E. Staroswiecki, D. Acharyya, S. Pawar, and J. Plusquellic, \u201cACurrent Ratio Model for Defect Diagnosis Using Quiescent Signal Analysis,\u201d Workshop on Defect Based Testing, VTS, 2002.","DOI":"10.31399\/asm.cp.istfa2002p0713"},{"key":"5148041_CR8","doi-asserted-by":"crossref","unstructured":"C. Patel, E. Staroswiecki, D. Acharyya, S. Pawar, and J. Plusquellic, \u201cDiagnosis using Quiescent Signal Analysis on a Commercial Power Grid,\u201d Accepted for publication in International Symposium for Test and Failure Analysis, 2002.","DOI":"10.31399\/asm.cp.istfa2002p0713"},{"issue":"1","key":"5148041_CR9","doi-asserted-by":"crossref","first-page":"50","DOI":"10.1109\/54.902822","volume":"18","author":"J. Plusquellic","year":"2001","unstructured":"J. Plusquellic, \u201cIC Diagnosis Using Multiple Supply Pad I\nDDQs,\u201d Design and Test, vol. 18, no. 1, pp. 50-61, 2001.","journal-title":"Design and Test"},{"key":"5148041_CR10","doi-asserted-by":"crossref","unstructured":"C. Thibeault, \u201cOn the Comparison of Delta I\nDDQ and I\nDDQ Test,\u201d in VTS, 1999, pp. 143-150.","DOI":"10.1109\/VTEST.1999.766658"},{"key":"5148041_CR11","doi-asserted-by":"crossref","unstructured":"C. Thibeault and L. Boisvert, \u201cDiagnosis Method Based on Delta I\nDDQ Probabilistic Signatures: Experimental Results,\u201d in ITC, 1998, pp. 1019-1026.","DOI":"10.1109\/TEST.1998.743299"},{"key":"5148041_CR12","doi-asserted-by":"crossref","unstructured":"T.W. Williams, R.H. Dennard, R. Kapur, M.R. Mercer, and W. Maly, \u201cIDDQ Test: Sensitivity Analysis of Scaling,\u201d in ITC, 1996, pp. 786-792.","DOI":"10.1109\/TEST.1996.557138"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1023\/A:1027466620872.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1023\/A:1027466620872\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1023\/A:1027466620872.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,6]],"date-time":"2025-06-06T10:08:00Z","timestamp":1749204480000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1023\/A:1027466620872"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2003,12]]},"references-count":12,"journal-issue":{"issue":"6","published-print":{"date-parts":[[2003,12]]}},"alternative-id":["5148041"],"URL":"https:\/\/doi.org\/10.1023\/a:1027466620872","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"type":"print","value":"0923-8174"},{"type":"electronic","value":"1573-0727"}],"subject":[],"published":{"date-parts":[[2003,12]]}}}